Datasheet

AD5162
Rev. C | Page 12 of 20
TEST CIRCUITS
Figure 27 through Figure 32 illustrate the test circuits that define the test conditions used in the product specification tables (see Table 1
and Table 2).
04108-0-027
V
MS
A
W
B
DUT
V+
V+ = V
DD
1LSB = V+/2
N
Figure 27. Test Circuit for Potentiometer Divider Nonlinearity Error
(INL, DNL)
04108-0-028
NO CONNECT
I
W
V
MS
A
W
B
DUT
Figure 28. Test Circuit for Resistor Position Nonlinearity Error
(Rheostat Operation: R-INL, R-DNL)
04108-0-029
V
MS2
V
MS1
V
W
A
W
B
DUT
I
W
= V
DD
/R
NOMINAL
R
W
= [V
MS1
– V
MS2
]/I
W
Figure 29. Test Circuit for Wiper Resistance
04108-0-030
∆V
MS
%
DUT
( )
A
W
B
V+
∆V
DD
%
∆V
MS
∆V
DD
∆V
DD
V
A
V
MS
V+ = V
DD
± 10%
PSRR (dB) = 20 LOG
PSS (%/%) =
Figure 30. Test Circuit for Power Supply Sensitivity
(PSS, PSSR)
04108-0-031
+15V
–15V
W
A
2.5V
B
V
OUT
OFFSET
GND
DUT
AD8610
V
IN
Figure 31. Test Circuit for Gain vs. Frequency
W
B
V
CM
I
CM
A
NC
GND
NC
V
DD
DUT
NC = NO CONNECT
04108-0-033
Figure 32. Test Circuit for Common-Mode Leakage Current