Datasheet
Table Of Contents
- Features
- Applications
- Functional Block Diagram
- General Description
- Table of Contents
- Specifications
- Absolute Maximum Ratings
- Pin Configurations and Function Descriptions
- Typical Performance Characteristics
- Test Circuits
- Theory of Operation
- RDAC Register and EEPROM
- Input Shift Register
- SPI Serial Data Interface
- Advanced Control Modes
- EEPROM or RDAC Register Protection
- INDEP Pin
- RDAC Architecture
- Programming the Variable Resistor
- Programming the Potentiometer Divider
- Terminal Voltage Operating Range
- Power-Up Sequence
- Layout and Power Supply Biasing
- Outline Dimensions

Data Sheet AD5122/AD5142
Rev. 0 | Page 9 of 32
INTERFACE TIMING SPECIFICATIONS
V
LOGIC
= 1.8 V to 5.5 V; all specifications T
MIN
to T
MAX
, unless otherwise noted.
Table 4. SPI Interface
Parameter
1
Test Conditions/Comments Min Typ Max Unit Description
t
1
V
LOGIC
> 1.8 V 20 ns SCLK cycle time
V
LOGIC
= 1.8 V 30 ns
t
2
V
LOGIC
> 1.8 V 10 ns SCLK high time
V
LOGIC
= 1.8 V 15 ns
t
3
V
LOGIC
> 1.8 V 10 ns SCLK low time
V
LOGIC
= 1.8 V 15 ns
t
4
10 ns
SYNC
-to-SCLK falling edge setup time
t
5
5 ns Data setup time
t
6
5 ns Data hold time
t
7
10 ns
SYNC
rising edge to next SCLK fall ignored
t
8
2
20 ns Minimum
SYNC
high time
t
9
3
50 ns SCLK rising edge to SDO valid
t
10
500 ns
SYNC
rising edge to SDO pin disable
1
All input signals are specified with t
r
= t
f
= 1 ns/V (10% to 90% of V
DD
) and timed from a voltage level of (V
IL
+ V
IH
)/2.
2
Refer to t
EEPROM_PROGRAM
and
t
EEPROM_READBACK
for memory commands operations (see Table 5).
3
R
PULL_UP
= 2.2 kΩ to V
DD
with a capacitance load of 168 pF.
Table 5. Control Pins
Parameter Min Typ Max Unit Description
t
1
0.1
10
µs
RESET
low time
t
EEPROM_PROGRAM
1
15 50 ms Memory program time (not shown in Figure 5)
t
EEPROM_READBACK
7 30 µs Memory readback time (not shown in Figure 5)
t
POWER_UP
2
75
µs
Start-up time (not shown in Figure 5)
t
RESET
30 µs Reset EEPROM restore time (not shown in Figure 5)
1
EEPROM program time depends on the temperature and EEPROM write cycles. Higher timing is expected at lower temperatures and higher write cycles.
2
Maximum time after V
DD
− V
SS
is equal to 2.3 V.