Datasheet

Notes:
1. IDD specifications are tested after the device is properly initialized.
2. Input slew rate is 1V/ns.
3. Definitions for IDD:
LOW is defined as V
IN ≤ 0.1 * VDDQ;
HIGH is defined as V
IN ≥ 0.9 * VDDQ;
STABLE is defined as inputs stable at a HIGH or LOW level;
SWITCHING is defined as:
- Address and command: inputs changing between HIGH and LOW once per two clock cycles;
- Data bus inputs: DQ changing between HIGH and LOW once per clock cycle; DM and DQS are STABLE.
4.
IDD8 is a typical v
alue at 30℃.
IDD6 Conditions :
I
DD6 Units
TCSR Range
45
℃ 85℃
uA
Full Array 350 500
1/2 Array 280 450
1/4 Array 250 400
Notes:
1. Measured with outputs open.
2. Internal TCSR can be supported.
AS4C32M16MD1A-5BCN
Confidential
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Rev.1.2 July 2016