Datasheet

Clock Specification
The jitter specified is a random jitter meeting a Gaussian distribution. Input clocks violating the min/max values
may result in malfunction of the device.
Definitions for t
CK(abs)
:
t
CK(abs)
is defined as the absolute clock period, as measured from one rising edge to the next consecutive
rising edge. t
CK(abs)
is not subject to production test.
Definitions for t
CK(avg)
and nCK:
t
CK(avg)
is calculated as the average clock period across any consecutive 200 cycle window, where each clock
period is calculated from rising edge to rising edge.
tCK
󰇛
avg
󰇜
= tCK(abs)
N
=1
/ N
Where N=200
Definitions for t
CH(avg)
and t
CL(avg)
:
t
CH(avg)
is defined as the average high pulse width, as calculated across any consecutive 200 high pulses.
tCH
󰇛
avg
󰇜
= tCH
N
=1
N tCK
󰇛
avg
Where N=200
t
CL(avg)
is defined as the average low pulse width, as calculated across any consecutive 200 low pulses.
tCL
󰇛
avg
󰇜
= tCL
N
=1
/ N tCK
󰇛
avg
Where N=200
Definitions for t
ERR(nper)
:
t
ERR
is defined as the cumulative error across n consecutive cycles of n x t
CK(avg)
.
t
ERR
is not subject to production test.
AS4C256M16D4
Confidential
- 198 of 201 -
Rev.1.0 Aug.2019