Datasheet

Single-ended AC and DC Output Levels of Connectivity Test Mode
Following output parameters will be applied for DDR4 SDRAM Output Signal during Connectivity Test Mode.
Table 102. Single-ended AC & DC output levels of Connectivity Test Mode
Symbol
Parameter
DDR4-2400/2666
Unit
Note
V
OH(DC)
DC output high measurement level (for IV curve linearity)
1.1 x V
DDQ
V
V
OM(DC)
DC output mid measurement level (for IV curve linearity)
0.8 x V
DDQ
V
V
OL(DC)
DC output low measurement level (for IV curve linearity)
0.5 x V
DDQ
V
V
OB(DC)
DC output below measurement level (for IV curve linearity)
0.2 x V
DDQ
V
V
OH(AC)
AC output high measurement level (for output SR)
V
TT
+ (0.1 x V
DDQ
)
V
1
V
OL(AC)
AC output below measurement level (for output SR)
V
TT
- (0.1 x V
DDQ
)
V
1
Note 1. The effective test load is 50Ω terminated by V
TT
= 0.5 x V
DDQ
.
Table 103. Single-ended output slew rate of Connectivity Test Mode
Symbol
Parameter
DDR4-2400/2666
Unit
Note
Min.
Max.
TF_output_CT
Output signal Falling time
-
10
ns/V
TR_output_CT
Output signal Rising time
-
10
ns/V
AS4C256M16D4
Confidential
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Rev.1.0 Aug.2019