Datasheet

AS4C16M32MD1
Confidential 50 Rev. 1.0/July 2014
Notes:
1. IDD specifications are tested after the device is properly initialized.
2. Input slew rate is 1V/ns.
3. Definitions for IDD:
LOW is defined as VIN ≤ 0.1 * VDDQ;
HIGH is defined as VIN ≥ 0.9 * VDDQ;
STABLE is defined as inputs stable at a HIGH or LOW
level; SWITCHING is defined as:
- Address and command: inputs changing between HIGH and LOW once per two clock cycles;
- Data bus inputs: DQ changing between HIGH and LOW once per clock cycle; DM and DQS are STABLE.
4. IDD8 is a typical value at 25℃.
IDD6 Conditions :
IDD6
Units
TCSR Range
45°C
85 ° C
Full Array
350
500
uA
1/2 Array
280
450
1/4 Array
250
400
Notes:
1. Measured with outputs open.
2. Internal TCSR can be supported.