Datasheet
Table 22. AC overshoot/undershoot specification for clock, data, strobe, and mask pins
(DQ, DQS, DQS#, DM, CK, CK#)
Parameter
-25
Unit
Maximum peak amplitude allowed for overshoot area 0.5
Maximum peak amplitude allowed for undershoot area 0.5
V
Maximum overshoot area above V
DD
0.23
V-ns
Maximum undershoot area below V
SS
0.23
V-ns
Table 23. Output AC test conditions
Symbol
Parameter
Value
Unit
Note
V
OTR
Output timing measurement reference level
0.5xV
DDQ
V
1
NOTE1: The V
DDQ
of the device under test is referenced.
Table 24. Output DC current drive
Symbol
Parameter
SSTL_18
Unit
Note
I
OH
(dc)
Output minimum source DC current
-13.4
mA
1, 3, 4
I
OL
(dc)
Output minimum sink DC current
13.4
mA
2, 3, 4
NOTE1: V
DDQ
= 1.7 V; V
OUT
= 1420 mV. (V
OUT
- V
DDQ
) /I
OH
must be less than 21 Ω for values of V
OUT
between V
DDQ
and V
DDQ
- 280 mV.
NOTE2: V
DDQ
= 1.7 V; V
OUT
= 280 mV. V
OUT
/I
OL
must be less than 21 Ω for values of V
OUT
between 0 V and 280 mV.
NOTE3: The dc value of V
REF
applied to the receiving device is set to V
TT
NOTE4: The values of I
OH
(dc) and I
OL
(dc) are based on the conditions given in Notes 1 and 2. They are used to
test device drive current capability to ensure V
IH
min plus a noise margin and VIL max minus a noise
margin are delivered to an SSTL_18 receiver. The actual current values are derived by shifting the desired
driver operating point (see JEDEC standard: Section 3.3 of JESD8-15A) along a 21 Ω load line to define a
convenient driver current for measurement.
Table 25. Capacitance
(V
DD
= 1.8V, f = 1MHz, T
OPER
= 25°C)
Symbol Parameter
DDR2-800
Unit
Min. Max.
C
IN
Input Capacitance : Command and Address
2.0 3.25
pF
C
CK
Input Capacitance (CK, CK#)
2.0 3.5
pF
C
I/O
DM, DQ, DQS Input/Output Capacitance
2.5 3.5
pF
DC
IN
Delta Input Capacitance: Command and Address
- 0.5
pF
DC
CK
Delta Input Capacitance: CK, CK#
- 0.5
pF
DC
IO
Delta Input/Output Capacitance: DM, DQ, DQS
- 0.5
pF
NOTE: These parameters are periodically sampled and are not 100% tested.
AS4C128M16D2A-25BCN
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