Specifications
7
安捷倫科技高頻元件量測研討會
2/23/2006
Page 13
VNA
Probe station
Sample
Long trace
Short trace
short trace
DUT: (Microstrip/Strip TL)
same cross-section with different length
Analysis Case I :
ÆMeasurement and ADS setup
安捷倫科技高頻元件量測研討會
2/23/2006
Page 14
m4
freq=
Er_preg=3.828
2.358GH
z
0.1 6
0.3 2
0.4 8
0.6 4
0.8 0
0.9 6
1.1 2
1.2 8
1.4 4
1.6 0
1.7 6
1.9 2
2.0 8
2.2 4
2.4 0
2.5 6
2.7 2
2.8 8
3.0 4
3.2 0
3.3 6
3.5 2
3.6 8
3.8 4
4.0 0
4.1 6
4.3 2
4.4 8
4.6 4
4.8 0
4.9 6
5.1 2
5.2 8
5.4 4
5.6 0
5.7 6
5.9 2
6.0 8
6.2 4
6.4 0
6.5 6
6.7 2
6.8 8
7.0 4
7.2 0
7.3 6
7.5 2
7.6 8
7.8 4
0.0 0
8.0 0
-0.5
0.0
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
-1.0
4.5
freq, GHz
Er_preg
m4
m5
freq=
loss_tan1=0.011
4.985GHz
123 456 7 890 10
0.1
0.2
0.3
0.4
0.0
0.5
freq, GHz
loss_tan1
m5
2 4 6 8 10 12 14 16 18 20 22 240 26
-100
0
100
-200
200
freq, GHz
phase(S(2,1))
phase(S(6,5))
Effective dielectric constant
Loss tangent
Good Correlation between simulation and measurement
Once we have the accurate the dielectric constant of mixture material of
substrate, we can achieve good electrical substrate design.
Sim/mea comparison
Analysis Case I :
Æextraction result
Mea
Sim