Specifications

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安捷倫科技高頻元件量測研討會
Feb.23, 2006
On-Wafer Amplifier Test and Modeling
•Most applications are at microwave frequencies
•Devices lack adequate heatsinking for CW testing, so pulsed-RF used as a
test technique to extract S-parameters
•Arbitrary, stable temperature (isothermal
state) set by adjusting duty cycle
•Duty cycles are typically < 1%
•Often requires synchronization of
pulsed bias and pulsed RF stimulus
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安捷倫科技高頻元件量測研討會
Feb.23, 2006
Wireless Communications Systems
• TDMA-based systems often use burst mode transmission
• Saves battery power
• Minimizes probability of intercept
• Power amplifiers often tested with pulsed bias
• Most of wireless communications applications ≤ 6 GHz