Specifications

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安捷倫科技高頻元件量測研討會
Feb.23, 2006
Agenda
• Why Measure in Pulsed Mode and the DUTs We Test
– Wafer Test
– Power Amplifiers
– Antenna RCS
– T/R Modules
• Review of Pulsed Measurements
• Wideband synchronous
• Narrowband asynchronous
• Evolution of Pulsed VNAs from Agilent
• 8510, 85108, 85120, CTS Platform to PNA
• Test Sets Available
Page 4
安捷倫科技高頻元件量測研討會
Feb.23, 2006
Why Test Under Pulsed Conditions?
• Device may behave differently between CW and pulsed
stimuli
• Bias changes during pulse might affect RF performance
• Overshoot, ringing, droop may result from pulsed stimulus
• Measuring behavior within pulse is often critical to characterizing
system operation (radars for example)
• CW test signals would destroy DUT
• High-power amplifiers not designed for continuous operation
• On-wafer devices often lack adequate heat sinking
• Pulsed test-power levels can be same as actual operation