Specifications

1
安捷倫科技高頻元件量測研討會
Feb.23, 2006
Page 1
PNA Based Solutions
- Pulsed RF S-Parameter Measurements
- Multiport Test Solutions
- Physical Layer Test Systems
Agilent Technologies Ltd.
Ming-Fan, Tsai
Project Manager
Feb, 23, 2006
安捷倫科技高頻元件量測研討會
Feb.23, 2006
Page 2
Pulsed-RF S-Parameter Applications Using The
Agilent PNA Series Network Analyzer