Technical data

Agilent Technologies

N5416A USB 2.0 Compliance Test Option

Notes on Electrical Testing

Device Hi-Speed Tests

Device Hi-Speed Signal Quality Test 35

Device Packet Parameters 41

Device CHIRP Timing 48

Device Suspend/Resume/Reset Timing 51

Device Test J/K, SE0_NAK 59

Device Receiver Sensitivity 65

In addition to the hi- speed electrical tests described in this chapter, the

device under test must also pass the following compliance tests applicable

to hi- speed capable devices:

• Upstream full speed signal quality.

• Upstream low speed signal quality.

• Inrush current.

• Back- voltage.

Before Running These Tests

If you haven’t already performed the initial equipment set up, see “Setting

Up the Equipment" on page 25.

NOTE

To give the automated test software more flexibility in making corner case measurements

(and improve test performance), the oscilloscope’s memory upgrade option is

recommended (Option 001 when ordered with the oscilloscope, or after purchase: E2680A

for the 5485xA Series oscilloscopes, or N5404A for the 80000 and 90000A Series

oscilloscopes).

Also, to reduce the bandwidth of the oscilloscope to just what is required by the USB-IF

(2 GHz for USB 2.0)—this can greatly reduce system measurement noise, allowing the

maximum measurement margin—the enhanced bandwidth software option is

recommended for the Agilent 54855A oscilloscope (Option 008), and the noise reduction

software option is recommended for the 80000 and 90000A Series oscilloscopes (Option

005 when ordered with the oscilloscope or N5403A after purchase).