Technical data

SYSTem:INSTrument:External:VISA:RESources[:ALIases]?
SYSTem:INSTrument:External:VISA:RESources[:ALIases]? “Product Name of the
Box”
This query returns the VISA-Resource alias names allowed for the specified box.
If more VISA–Resource alias names are allowed, a comma separated list will be
returned.
MEASure Subsystem
MEASure Subsystem - Reference
The MEASure Subsystem represents the instrument's advanced analysis features
that can be controlled over SCPI.
N O T E
Note that for these commands, the asterisks denote the "handle" of a measurement.
To obtain the handle, the measurement object must first be created.
The MEASure Subsystem is first of all meant for programming the Fast Eye Mask
measurement, the Jitter Tolerance Characterization measurement, and the Eye
Diagram measurement.
For an example on how to program the Fast Eye Mask measurement with SCPI,
see “Running the Fast Eye Mask - Procedures” on page 36.
For an example on how to program the Jitter Tolerance Characterization
measurement with SCPI, see “Running JTol Characterization - Procedures” on
page 40.
For an example on how to program the Eye Diagram measurement with SCPI,
see“Running the Eye Diagram - Procedures” on page 39.
N O T E
Note that SCPI and IVI COM support for Output Timing, Output Level, Spectral Jitter
and Eye Opening Measurement are not available. These measurements are
accessed through an Active-X control, which is described in the Measurement
Programming Guide.
5 SCPI Command Reference
338 Agilent J-BERT N4903B High-Performance Serial BERT
IVI-COM Equivalent
Syntax
Description