Specifications

33
Infiniium 90000 X-Series Oscilloscopes
Performance characteristics
Maximum measurement update
rate
> 50,000 measurement/sec (one measurement turned on)
> 250,000 measurement/sec/measurement (ten measurements turned on)
Measurement modes Standard, Measure all edges mode
Waveform measurements
Voltage
Time
Clock
Data
Mixed
Frequency domain
Level qualification
Peak to peak, minimum, maximum, average, RMS, amplitude, base, top, overshoot, preshoot, upper,
middle, lower, overshoot, V preshoot, crossing, Pulse base, pulse amplitude, burst interval
Rise time, fall time, positive width, negative width, burst width, Tmin, Tmax, burst period, Tvolt,
+ pulse count, - pulse count, burst and burst interval
Period, frequency, duty cycle to duty cycle
Setup time, hold time
Area, slew rate
FFT frequency, FFT magnitude, FFT delta frequency, FFT delta magnitude, peak detect mode, ampli-
tude modulation
Any channels that are not involved in a measurement can be used to level-qualify all timing mea-
surements
Eye-diagram measurements Eye height, eye width, eye jitter, crossing percentage, Q factor, and duty-cycle distortion
Jitter analysis measurements
Clock
Data
Requires Option 002 (or E2681A), 004 (or N5400A), or 070 (or N8823A). Standard on DSA Series
Time interval error, N-period, period to period, positive width to positive width, neg width to neg
width, and duty cycle to duty cycle
Time interval error, unit interval, N Unit Interval, unit interval to unit interval, Data rate, CDR,
de-emphasis
Jitter separation** Spectral Method (narrow and wide), tailfit
Measurements** Random Jitter (RJ), Deterministic Jitter (DJ), Aperiodic Bounded Uncorrelated Jitter (ABUJ), peri-
odic jitter, data dependent jitter (DDJ), duty cycle distortion (DCD), Intersymbol Interference (ISI)
Fixed measurements** Ability to fix random jitter (Rj) for cross-talk measurements
Statistics Displays the current, mean, minimum, maximum, range (max-min), standard deviation, number of
measurements value for the displayed automatic measurements
Histograms
Source
Orientation
Measurements
Waveform or measurement
Vertical (for timing and jitter measurements) or horizontal (noise and amplitude change) modes,
regions are defined using waveform markers
Mean, standard deviation, mean ± 1, 2, and 3 sigma, median, mode, peak-to-peak, min, max, total
hits, peak (area of most hits), X scale hits, and X offset hits
Mask testing Allows pass/fail testing to user-defined or Agilent-supplied waveform templates. Automask lets you
create a mask template from a captured waveform and define a tolerance range in time/voltage or
screen divisions. Test modes (run until) include test forever, test to specified time or event limit,
and stop on failure. Executes “multipurpose” user setting on failure. “Unfold real time eye” feature
will allow individual bit errors to be observed by unfolding a real time eye when clock recovery is
on. Communications mask test kit option provides a set of ITU-T G.703, ANSI T1.102, and IEEE 802.3
industry-standard masks for compliance testing.
* Requires the purchase of User Defined Function (option 010) ** Requires purchase of DSA or EZJIT+ or EZJIT Complete software