Specifications

Chapter 4: Troubleshooting

Acquisition/Backplane Assembly Troubleshooting

This section describes which board assembly to replace if any of the scope self tests

fail. When the self- test error message file is generated it is sent to the following location:

C:\ProgramData\Agilent\Infiniium\selftest\selftestlog.txt

The error message usually indicates the channel with the error. Channels 1 and 2 are

on the lower acquisition board. Channels 3 and 4 are on the upper acquisition board.

Replace the acquisition assembly that has the error.

If the error message does not indicate a channel, refer to the following table to determine

which assembly to replace.

Test Group and Test Name Error Type Assembly to Replace

Timebase Test Group

Timebase Interpolator Test Backplane assembly

ADC Test Group

ADC Register Tests ADC1, ADC2, ADC3, ADC4 Lower acquisition assembly

ADC5, ADC6, ADC7, ADC8 Upper acquisition assembly

ADC Voltage Test Points ADC1, ADC2, ADC3, ADC4 Lower acquisition assembly

ADC5, ADC6, ADC7, ADC8 Upper acquisition assembly

Acquisition Memory Test Group

Hedwig MBIST

Hedwig Register Tests

Hedwig-DDR2 Addr & Data

Test

MEMCON_1, MEMCON_2, MEMCON_3,

MEMCON_4

Lower acquisition assembly

MEMCON_5, MEMCON_6, MEMCON_7,

MEMCON_8

Upper acquisition assembly

Hedwig DDR2 Stress Test Memory Controller 1-4 Lower acquisition assembly

Memory Controller 5-8 Upper acquisition assembly

Hedwig DDR2 Interface Hedwig1, Hedwig2, Hedwig3, Hedwig4 Lower acquisition assembly

Hedwig5, Hedwig6,Hedwig7, Hedwig8 Upper acquisition assembly

Misc. Scope Test Group

Temp Sensor Tests Hedwig0, Hedwig1, Hedwig2, Hedwig3, Oak0 Lower acquisition assembly

Hedwig4, Hedwig5, Hedwig6, Hedwig7, Oak2 Upper acquisition assembly

Pred1, Pred2, MainFPGA Backplane assembly

Acq Flash RAM Tests Test is currently not being run.