Specifications

35
Maximum measurement update
rate
> 50,000 measurement/sec (one measurement turned on)
> 250,000 measurement/sec/measurement (ten measurements turned on)
Measurement modes Standard, Measure all edges mode
Waveform measurements
voltage
Time
Clock
Data
Mixed
Frequency domain
Level qualification
Peak to peak, minimum, maximum, average, RMS, amplitude, base, top, overshoot, preshoot, upper,
middle, lower, overshoot, Vtime, Vpreshoot, crossing, Pulse base, pulse amplitude, pulse top
Rise time, fall time, positive width, negative width, burst width, burst period, burst interval, Tmin,
Tmax, Tvolt, + pulse count, - pulse count
Period, frequency, duty cycle to duty cycle, phase, N-period
Setup time, hold time
Area, slew rate,
FFT frequency, FFT magnitude, FFT delta frequency, FFT delta magnitude, peak detect mode
Any channels that are not involved in a measurement can be used to level-qualify all timing
measurements
Eye-diagram measurements Eye height, eye width, eye jitter, crossing percentage, Q factor, and duty-cycle distortion
Jitter analysis measurements
Clock
Data
Requires Option 002 (or E2681A), 004 (N5400A), or 070 (N8823A). Standard on DSA Series.
Time interval error, N-period, period to period, positive width to positive width, neg width to neg
width, and duty cycle to duty cycle
Time interval error, unit interval, N Unit Interval, unit interval to unit interval, Data rate, CDR,
de-emphasis
Statistics Displays the current, mean, minimum, maximum, range (max-min), standard deviation, number of
measurements value for the displayed automatic measurements
Histograms
Source
Orientation
Measurements
(available as a function)
Waveform or measurement
Vertical (for timing and jitter measurements) or horizontal (noise and amplitude change) modes,
regions are defined using waveform markers
Mean, standard deviation, mean ± 1, 2, and 3 sigma, median, mode, peak-to-peak, min, max, total
hits, peak (area of most hits), X scale hits, and X offset hits
Mask testing Allows pass/fail testing to user-defined or Agilent-supplied waveform templates. Automask lets
you create a mask template from a captured waveform and define a tolerance range in time/
voltage or screen divisions. Test modes (run until) include test forever, test to specified time or
event limit, and stop on failure. Executes “multipurpose” user setting on failure.
“Unfold real time eye” feature will allow individual bit errors to be observed by unfolding a real time
eye when clock recovery is on.
Communications mask test kit option provides a set of ITU-T G.703, ANSI T1.102, and IEEE 802.3
industry-standard masks for compliance testing.
Waveform math
Number of functions
Hardware accelerated math
operations
Sixteen
Differential and Common Mode
Absolute value, add, amplitude demodulation (radar envelope), average, Butterworth*, common
mode, delay, differentiate, divide, FFT magnitude, FFT, phase, FIR*, high pass filter, histogram,
horizontal gating, integrate, invert, LFE*, low pass filter (4th-order Bessel Thompson filter), magnify,
max, measurement trend, min, multiply, RT Eye*, smoothing, SqrtSumOfSquare*, square, square
root, subtract, versus, and optional user defined function (Option 010)
FFT
Frequency range
Frequency resolution
Window modes
DC to 80 GHz (at 160 GSa/s) or 40 GHz (at 80 GSa/s) or 20 GHz (at 40 GSa/s)
Sample rate/memory depth = resolution
Hanning, flattop, rectangular, Blackman-Harris, Hamming
Specifications