Technical data

Commands by Subsystem 5
Agilent InfiniiVision 5000 Series Oscilloscopes Programmer's Guide 337
:MTESt Commands
The MTESt subsystem commands and queries control the mask test
features. See "Introduction to :MTESt Commands" on page 339.
Table 63 :MTESt Commands Summary
Command Query Options and Query Returns
:MTESt:AMASk:CREate
(see page 342)
n/a n/a
:MTESt:AMASk:SOURce
<source> (see
page 343)
:MTESt:AMASk:SOURce?
(see page 343)
<source> ::= CHANnel<n>
<n> ::= {1 | 2 | 3 | 4} for 4ch
models
<n> ::= {1 | 2} for 2ch models
:MTESt:AMASk:UNITs
<units> (see
page 344)
:MTESt:AMASk:UNITs?
(see page 344)
<units> ::= {CURRent | DIVisions}
:MTESt:AMASk:XDELta
<value> (see
page 345)
:MTESt:AMASk:XDELta?
(see page 345)
<value> ::= X delta value in NR3
format
:MTESt:AMASk:YDELta
<value> (see
page 346)
:MTESt:AMASk:YDELta?
(see page 346)
<value> ::= Y delta value in NR3
format
n/a :MTESt:COUNt:FWAVefor
ms? [CHANnel<n>] (see
page 347)
<failed> ::= number of failed
waveforms in NR1 format
:MTESt:COUNt:RESet
(see page 348)
n/a n/a
n/a :MTESt:COUNt:TIME?
(see page 349)
<time> ::= elapsed seconds in NR3
format
n/a :MTESt:COUNt:WAVeform
s? (see page 350)
<count> ::= number of waveforms
in NR1 format
:MTESt:DATA <mask>
(see page 351)
:MTESt:DATA? (see
page 351)
<mask> ::= data in IEEE 488.2 #
format.
:MTESt:DELete (see
page 352)
n/a n/a
:MTESt:ENABle {{0 |
OFF} | {1 | ON}} (see
page 353)
:MTESt:ENABle? (see
page 353)
{0 | 1}
:MTESt:LOCK {{0 |
OFF} | {1 | ON}} (see
page 354)
:MTESt:LOCK? (see
page 354)
{0 | 1}