Technical data

Table Of Contents
964 Agilent InfiniiVision 3000 X-Series Oscilloscopes Programmer's Guide
Index
logic level activity, 774
long form, 862
low frequency sine with glitch demo signal, 243
low trigger level, 647
lower threshold, 351
lower threshold voltage for measurement, 791
lowercase characters in commands, 861
low-frequency reject filter, 659
low-level voltage, waveform generator, 757
low-pass filter used to limit bandwidth, 224,
264
LRN (Learn Device Setup), 135
lsbfirst, 715
M
magnitude of occurrence, 369
main sweep range, 637
main time base, 817
main time base mode, 631
making measurements, 330
MAN option for probe sense, 779, 783
manual cursor mode, 311
MARKer commands, 309
marker mode, 317
marker position, 318
marker readout, 797, 798
marker set for voltage measurement, 803, 804
marker sets start time, 794
marker time, 793
markers for delta voltage measurement, 802
markers track measurements, 361
markers, command overview, 310
markers, mode, 311
markers, time at start, 798
markers, time at stop, 797
markers, X delta, 316
markers, X1 position, 312
markers, X1Y1 source, 313
markers, X2 position, 314
markers, X2Y2 source, 315
markers, Y delta, 319
markers, Y1 position, 317
markers, Y2 position, 318
mask, 130, 144
mask command, bus, 209
mask statistics, reset, 397
mask test commands, 385
Mask Test Event Enable Register
(MTEenable), 165
mask test event event register, 167
Mask Test Event Event Register
(:MTERegister[:EVENt]), 167, 846
mask test run mode, 404
mask test termination conditions, 404
mask test, all channels, 390
mask test, enable/disable, 402
mask, delete, 401
mask, get as binary block data, 400
mask, load from binary block data, 400
mask, lock to signal, 403
mask, recall, 428
mask, save, 442, 443
masks, bind levels, 412
master summary status bit, 147
math function, stop displaying, 162
math operations, 271
MAV (Message Available), 129, 145, 147
maximum duration, 665, 675, 676
maximum position, 632
maximum range for zoomed window, 638
maximum scale for zoomed window, 639
maximum vertical value measurement, 374
maximum vertical value, time of, 382, 795
MEASure commands, 321
measure mask test failures, 405
measure overshoot, 348
measure period
, 351
measure phase between channels, 352
measure preshoot, 354
measure start voltage, 803
measure stop voltage, 804
measure value at a specified time, 379
measure value at top of waveform, 380
measurement error, 330
measurement record, 722
measurement setup, 330, 362
measurement source, 362
measurement statistics results, 356
measurement window, 381
measurements, AC RMS, 378
measurements, area, 333
measurements, average value, 372
measurements, base value, 373
measurements, built-in, 45
measurements, burst width, 334
measurements, clear, 335, 792
measurements, command overview, 330
measurements, counter, 336
measurements, DC RMS, 378
measurements, definition setup, 338
measurements, delay, 340
measurements, duty cycle, 342
measurements, fall time, 343
measurements, falling edge count, 345
measurements, falling pulse count, 346
measurements, frequency, 344
measurements, how autoscale affects, 157
measurements, lower threshold level, 791
measurements, maximum vertical value
, 374
measurements, maximum vertical value, time
of, 382, 795
measurements, minimum vertical value, 375
measurements, minimum vertical value, time
of, 383, 796
measurements, overshoot, 348
measurements, period, 351
measurements, phase, 352
measurements, preshoot, 354
measurements, pulse width, negative, 347
measurements, pulse width, positive, 355
measurements, ratio of AC RMS values, 377
measurements, rise time, 359
measurements, rising edge count, 350
measurements, rising pulse count, 353
measurements, show, 361
measurements, snapshot all, 332
measurements, source channel, 362
measurements, standard deviation, 360
measurements, start marker time, 797
measurements, stop marker time, 798
measurements, thresholds, 794
measurements, time between start and stop
markers, 793
measurements, time between trigger and
edge, 367
measurements, time between trigger and
vertical value, 369
measurements, time between trigger and
voltage level, 799
measurements, upper threshold value, 801
measurements, vertical amplitude, 371
measurements, vertical peak-to-peak, 376
measurements, voltage difference, 802
memory setup, 143, 625
message available bit, 147
message available bit clear, 129
message displayed, 147
message error, 821
message queue, 838
messages ready, 147
midpoint of thresholds, 351
minimum duration, 664, 675, 676, 679
minimum vertical value measurement, 375
minimum vertical value, time of, 383, 796
MISO data pattern width, 530
MISO data pattern, SPI trigger, 529
MISO data source, SPI trigger, 527
MISO data, SPI, 733
mixed-signal demo signals, 243
mixed-signal oscilloscopes, 6
mnemonics, duplicate, 865
mode, 311, 631
mode, serial decode, 457
model number, 134
models, oscilloscope, 3
modes for triggering, 648
Modify softkey, 36
MOSI data pattern width, 532
MOSI data pattern, SPI trigger, 531
MOSI data source, SPI trigger, 525, 528
most significant byte first, 715
move,
271
move cursors, 797, 798
msbfirst, 715
MSG (Message), 145, 147
MSO models, 6
MSS (Master Summary Status), 147
MTEenable (Mask Test Event Enable
Register), 165
MTERegister[:EVENt] (Mask Test Event Event
Register), 167, 846
MTESt commands, 385
multiple commands, 865
multiple queries, 53
multiply math function, 271, 278, 729