User`s guide

9-10 Agilent EasyEXPERT User’s Guide Vol. 2, Edition 1
If You Have a Problem
When You Perform Measurement
Large Current Causes High Temperature (Thermal
Drift)
If a large current is forced to a DUT, the temperature of the DUT may increase,
which may cause characteristics to drift.
To solve this problem:
• Use the pulse output mode of the SMU.
For large currents, the SMU should be set to pulse output mode. This decreases
the average power output to prevent temperature rise of DUT.
Measurement Damages the Device under Test
When performing breakdown measurements, DUTs may be damaged.
When voltage is forced from an SMU, the current is limited by the compliance
setting, which prevents the DUT from being damaged by a large current. But when
the current rapidly increases, the current limiter in the SMU cannot follow the rapid
current increase, so a large amount of current may flow through the DUT for a
moment, which may damage the DUT.
To solve this problem:
• Insert a protecting resistor as close as possible to DUT. You can also use a series
resistor built into the SMU.
Leaving Connections Damages Devices after
Measurement
After the measurements, open the measurement terminals or disconnect the device
under test from the measurement terminals. If you leave the connection with the
device, the device may be damaged by unexpected operations.
Do not leave the connection over 30 minutes after the measurement if the auto
calibration is set to ON. Then, the B1500 performs the self-calibration automatically
every 30 minutes after the measurement. The calibration requires to open the
measurement terminals.
NOTE Open the measurement terminals and never connect anything when the calibration is
performed.