Specifications

38
□ Z5623AH87 Pulsed S-parameter test set, 1 to 50 GHz
Includes two pin switches for bi-directional (forward and
reverse) pulsed-RF stimulus. It does not include internal amplifiers,
but has front panel access loops for switching in external
amplifiers to boost port power in both directions.
Applications
Material measurements
□ 85070E High-Temperature Dielectric Probe Kit
The 85070E enables measurements of the dielectric properties
of materials quickly and conveniently. Measurements made
with this probe are nondestructive and require no sample
preparation. The dielectric probe is well suited for measurements
of liquid, semisolid and flat solid materials. Measurement
results can be viewed in a variety of formats (ε’
r
, ε”
r
, tan δ
or Cole-Cole). The supplied software can be run in the PNA
analyzer or on a PC.
□ 85071E Materials Measurement Software
The 85071E materials measurement software calculates the
permittivity and permeability of material samples placed in a
coaxial airline or a rectangular waveguide. The measurement
technique works well for solid materials that can be machined
to fit precisely inside a transmission line. Measurement
results can be viewed in a variety of formats (ε’
r
, ε
r
, µ’
r
, µ”
r
, tan δ,
or Cole-Cole µ). The software can be run in the PNA analyzer
or on a PC.
Pulsed measurements
1
The pulsed RF measurement capability (Option H08) and IF access
(Option H11), are recommended for pulsed measurements with
the PNA Series.
Pulse/pattern generators
Recommended to provide pulse signals and timing to the pulsed
S-parameter text set and MW PNA
□ 81104A Pulse/pattern generator, 80 MHz, single-/dual-channel
with one or two Agilent 81105A output modules.
□ 81110A Pulse/pattern generator, 165 MHz, single-/dual-channel
with one or two Agilent 81111A output modules.
Note: Each pulse/pattern generator must be ordered with its
associated output modules depending on the measurement
configuration.
□ Z5623AH84 Pulsed S-parameter test set, 2 to 40 GHz
Includes two pin switches for bi-directional (forward and
reverse) pulsed-RF stimulus, and two directional couplers for
the reference channels. It does not include internal amplifiers,
but has front panel access loops for switching in external
amplifiers to boost port power in both directions.
□ Z5623AH86 Pulsed S-parameter test set, 2 to 40 GHz
Includes one pin switch to modulate the analyzer’s
internal source in the forward direction, and one directional
coupler for the reference channel. It does not include internal
amplifiers, but has front panel access loops for switching in
an external amplifier to boost port power.
1. For more details regarding pulsed measurement configurations with the
PNA Series, refer to Agilent’s Web site (www.agilent.com/find/pna)
to download a copy of the Microwave PNA Series Network Analyzer
Configuration Guide for Pulsed Measurements, literature number 5989-7913EN.