User`s guide

Chapter 3 151
Screen Reference
CONFIGURATION
3. Screen Reference
Setting Test Limits on Test Items
The LO Limit and HI Limit values for the test items in the table need to be set to
execute Pass/Fail tests with AUTOMATIC TEST and MANUAL TEST. All test
items can be specified with limits to make tests in the Test Setup: Test Sequence
screen (even if some test items are skipped).
The variable increment softkey is activated to enter each limit. Refer to "Variable
Increment Softkey" on page 60.
Test Item Description
Peak TX Power
Accepts a set of high and low test limits.
The nominal limits are specified in the radio standard in
conjunction with the power control level (PWR CNTL).
You are allowed to modify the nominal limits by entering
temporary limits ranging from −99.9 to +99.9 dB in 0.1 dB steps.
However, once power control level is changed after this
modification, the nominal limits are automatically applied also.
Burst Timing
Accepts a set of high and low test limits. The allowable range is
from −9.9 to +9.9 bits in 0.1 bit steps.
Power Ramp
The test limits are specified by the radio standard selected.
Phase Error
Accepts a set of high test limits for the rms and peak errors over
the active part of the timeslots between 0 and 147 bits. The
allowable range is from 0.0 to 99.9° in 0.1° steps.
Frequency Error
Accepts a set of high and low limits over the active part of the
timeslots. The allowable range is from −999 to +999 Hz in 1 Hz
steps.
BER
Accepts a high limit for the bit error rate. The allowable range is
from 0.00 to 99.99% in 0.01% steps.
FER
Accepts a high limit for the frame erasure rate. The allowable
range is from 0.00 to 99.99% in 0.01% steps. This is not effective
for the Test Set installed with Option 040.
BLER
Accepts a high limit for the block error rate. The allowable range is
from 0.00 to 99.99% in 0.01% steps. This is effective for the Test
Set installed with Option 040.