Specifications

Diagnostic Testing Details 4
TS-8900 Functional Test System Diagnostics User Guide 4-55
CEDGN_L4451A_LXIDAC.tpa (4 Channel LXI DAC CEDGN Test Flow)
The testsplan supports testing of two L4451A DAC.
User is required to set the variables to reflect the system under
test.
1 = present, 0 = not present
bLXIDAC1 = 1st L4451A
bLXIDAC2 = 2nd L4451A
Device that user sets as not present will not be tested. The test
starts by performing:
Not Acceptable Combination Checking
• Checks user settings for any not acceptable combination. Stops
test and provide error message if not acceptable selection is found.
L4451A LXI DAC1 Tests
• Display instruction to install CEDGN Board #1 on TC1 and CEDGN
Board #3 on appropriate TC. Install Cable E6170-61607 from J1 of
Board #1 to J1 of Board #3.
• Setup DMM to perform voltage measurement.
• Measure DAC1 output for:
CH1 with sense via Row9, Row10 and Row11, Row12
CH1 without sense via Row9 and Row11
CH2 with sense via Row13, Row14 and Row15, Row16
CH2 without sense via Row13 and Row15
CH3 with sense via Row17, Row18 and Row19, Row20
CH3 without sense via Row17 and Row19
CH4 with sense via Row21, Row22 and Row23, Row24
CH4 without sense via Row21 and Row23
• Setup LXI DAC1 output 3V on CH1 when External Trigger is
detected.
• Use SLU internal DAC1 to generate a simulated trigger to LXI
DAC1.
• Measure for 3V at LXI DAC1 CH1 output for trigger response.
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