Specifications

4-36 TS-8900 Functional Test System Diagnostics User Guide
4 Diagnostic Testing Details
CEDGN_E6178B_LoadCard.tpa (8 Channel High Power Load Card CEDGN
Test F low)
The testsplan supports testing of eight E6178B High Power Load
Cards. User is required to set the variables to reflect the system
under test.
1 = present, 0 = not present
bLC8CH_1 = 1st E6178B
bLC8CH_2 = 2nd E6178B
bLC8CH_3 = 3rd E6178B
bLC8CH_4 = 4th E6178B
bLC8CH_5 = 5th E6178B
bLC8CH_6 = 6th E6178B
bLC8CH_7 = 7th E6178B
bLC8CH_8 = 8th E6178B
Device that user sets as not present will not be tested. The test
starts by performing:
Not Acceptable Combination Checking
• Checks user settings for any not acceptable combination. Stops
test and provide error message if not acceptable selection is found.
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