Specifications

4-22 TS-8900 Functional Test System Diagnostics User Guide
4 Diagnostic Testing Details
CEDGN_E878XA_PinMatrix.tpa (Pin Matrix CEDGN Test Flow)
The testsplan supports testing of one E8782A and four E8783A
Pin Matrix Card. User is required to set the variables to reflect
the system under test.
1 = present, 0 = not present
bMtrx1 = 1st Pin Matrix E8782A
bMtrx2 = 2ndPin Matrix E8783A
bMtrx3 = 3rd Pin Matrix E8783A
bMtrx4 = 4th Pin Matrix E8783A
bMtrx5 = 5th Pin Matrix E8783A
Device that user sets as not present will not be tested. The test
starts by performing:
Not Acceptable Combination Checking
• Checks user settings for any not acceptable combination. Stops
test and provide error message if not acceptable selection is found.
Matrix1 E8782A on TC1 Tests
• Display instruction to Install CEDGN Board #5 on TC1. S1 and S2
on CEDGN Board #5 are all toggled to ON (CLOSE).
• Setup DMM for 4W resistance measurement.
• Perform Matrix1 loopback resistance measurements between
Row1-Row2, Row3-Row4, until Row31-Row32.
Matrix2 Row1-Row32
• Display instruction to Install CEDGN Board #5 on appropriate TC.
S1 and S2 on CEDGN Board #5 are all toggled to ON (CLOSE).
Matrix2 E8783A Row1-Row32 Tests
• Setup DMM for 4W resistance measurement.
• Perform Matrix2 loopback resistance measurements between
Row1-Row2, Row3-Row4, until Row31-Row32.
Matrix2 Row33-Row64
• Display instruction to Install CEDGN Board #5 on appropriate TC.
S1 and S2 on CEDGN Board #5 are all toggled to ON (CLOSE).
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