Specifications

4-2 TS-8900 Functional Test System Diagnostics User Guide
4 Diagnostic Testing Details
DGN Testplan Description and Flow
The standard DGN diagnostic program consists of tests
designed for specific system subassemblies. Generally, DGN
tests are organized as follows:
• System reset.
• Test of other instruments, such as tests of the E6198A
Switch/Load Unit , 3352xA Arbitrary Waveform Generator , 53220A
Counter, power supply, and etc.
• Several tests dedicated to Pin Matrix Modules - open/close relay
tests.
• Tests of PXI modules, such as M9186A DAQ, M9185A 8/16-CH
DAC, M9187A IO and etc.
Test 000: Check Memory
Test 000: Global reset
• This test group gets IPC information, initializes and resets all
instruments in the system configuration editor (SCE).
Test 001: M918xA PXI Digital Multimeter
Test 001: ABUS 1, 2, 3, 4
• This test group verifies DMM_Hi and DMM_Lo connection and
ABUS float for ABUS 1, 2, 3 and 4.
Test 002: E6198B Agilent Switch/Load unit
• This test group measures SLU DAC#1 & DAC#2 output.
NOTE
Load cards are not tested by DGN.
NOTE
L4451A LXI DAC and PXI module(s) functionality is not tested by DGN.
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