Specifications

4-70 TS-8900 Functional Test System Diagnostics User Guide
4 Diagnostic Testing Details
CEDGN_M9216A_DAQ.tpa (High Voltage Data Acquisition CEDGN Test
Flow)
The testsplan supports testing of four M9216A DAQ.
User is required to set the variables to reflect the system under
test.
1 = present, 0 = not present
bDAQ1 = 1st M9216A
bDAQ2 = 2nd M9216A
bDAQ3 = 3rd M9216A
bDAQ4 = 4th M9216A
Device that user sets as not present will not be tested. The test
starts by performing:
Not Acceptable Combination Checking
• Checks user settings for any not acceptable combination. Stops
test and provide error message if not acceptable selection is found.
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