Specifications

Diagnostic Testing Details 4
TS-8900 Functional Test System Diagnostics User Guide 4-67
CEDGN_M9187A_DIO.tpa (DIO CEDGN Test Flow)
The testsplan supports testing of two M9187A DIO modules.
User is required to set the variables to reflect the system under
test.
1 = present, 0 = not present
bDIO1 = 1st M9187A DIO
bDIO2 = 2nd M9187A DIO
Device that user sets as not present will not be tested. The test
starts by performing:
Not Acceptable Combination Checking
• Checks user settings for any not acceptable combination. Stops
test and provide error message if not acceptable selection is found.
M9187A DIO1 on TC2 (Channel 1-16) Tests
• Setup SLU internal DAC1 to output 5V for use on DIO1 Vext.
• Display instruction to install CEDGN Board #1 on TC1 and CEDGN
Board #3 on TC2. Install Cable E6170-61607 on J1 of Board #1 to
J1 of Board #3.
• Test connectivity of Vext and FPGND(P1), FPGND(P2), FPGND(P3),
FPGND(P4), FPGND(V1), FPGND(V2), FPGND(V3) using DIO1
output Channel 1 to generate a high and low state output and
using DIO1 input Channel 1 to detect the high and low state.
• Test DIO1 output Channel 1-16 by output high and low state for all
channels. Test DIO1 input Channel 1-16 by detecting the high and
low state generated by the output channels.
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