Agilent Technologies E5500A/B Phase Noise Measurement System User’s Guide Part number: E5500-90004 Printed in USA June 2000 Supersedes September 1999 Revision A.01.
Notice The information contained in this document is subject to change without notice. Agilent Technologies makes no warranty of any kind with regard to this material, including, but not limited to, the implied warranties of merchantability and fitness for a particular purpose. Agilent Technologies shall not be liable for errors contained herein or for incidental or consequential damages in connection with the furnishing, performance, or use of this material.
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What You’ll Find in This Manual… • Chapter 1, “Getting Started with the Agilent Technologies E5500 Phase Noise Measurement System” • Chapter 2, “Welcome to the HP E5500 Phase Noise Measurement System Series of Solutions” • • • • • • • • • • • • • • • • • • • • Chapter 3, “Your First Measurement” Chapter 4, “Phase Noise Basics” Chapter 5, “Expanding Your Measurement Experience” Chapter 6, “Absolute Measurement Fundamentals” Chapter 7, “Absolute Measurement Examples” Chapter 8, “Residual Measurement Fund
Limited Warranty Software Agilent Technologies warrants that the software will perform substantially in accordance with the written materials for a period of one (1) year from the date of receipt. Agilent Technologies does not warrant that the operation of the software will be uninterrupted or error free.
Service and Support Any adjustment, maintenance, or repair of this product must be performed by qualified personnel. Contact your customer engineer through your local Agilent Technologies Service Center. You can find a list of Agilent Technologies Service Centers on the web at http://www.agilent.com/find/tmdir.
Notice . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ii Software License Terms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . iii What You’ll Find in This Manual… . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . v Limited Warranty . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . vi Software . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Using the Server Hardware Connections to Specify the Source . . . . . . . 5-8 Testing the Agilent/HP 8663A Internal/External 10 MHz . . . . . . . . . . 5-10 Defining the Measurement . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-11 Selecting a Reference Source . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-13 Selecting Loop Suppression Verification . . . . . . . . . . . . . . . . . . . . 5-14 Setup Considerations for the Agilent/HP 8663A 10 MHz Measurement . . . . . . . . . . .
Adding Isolation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-16 Increasing the PLL Bandwidth . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-16 Inserting a Device . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-18 An Attenuator . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-18 An Amplifier . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Beginning the Measurement . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-80 Checking the Beatnote . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-91 Making the Measurement . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-93 Microwave Source . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-97 Required Equipment . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-97 Defining the Measurement . . . . .
11. FM Discriminator Measurement Examples What You’ll Find in This Chapter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11-1 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11-2 FM Discriminator Measurement using Double-Sided Spur Calibration 11-3 Required Equipment . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11-3 Determining the Discriminator (Delay Line) Length . . . . . . . . . . . . . . . . . . . . . .
14. Baseband Noise Measurement Examples What You’ll Find in This Chapter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Baseband Noise using a Test Set Measurement Example . . . . . . . . . . . Defining the Measurement . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Beginning the Measurement . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Making the Measurement . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
17. Error Messages and System Troubleshooting What You’ll Find in This Chapter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17-1 18. Reference Graphs and Tables Graphs and Tables You’ll Find in This Chapter . . . . . . . . . . . . . . . . . . . 18-1 Graphs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18-1 Tables . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
E5502A Opt. 001 Connect Diagram E5502A Opt. 201 Connect Diagram E5503A Standard Connect Diagram E5503A Opt. 001 Connect Diagram E5503A Opt. 201 Connect Diagram E5504A Standard Connect Diagram E5504A Opt. 001 Connect Diagram E5504A Opt. 201 Connect Diagram E5501B Standard Connect Diagram E5501B Opt. 001 Connect Diagram E5501B Opt. 201 Connect Diagram E5502B Standard Connect Diagram E5502B Opt. 001 Connect Diagram E5502B Opt. 201 Connect Diagram E5503B Standard Connect Diagram E5503B Opt.
Other Multipin Connectors . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . A-9 MMS Module Removal and Reinstallation . . . . . . . . . . . . . . . . . . A-11 Touch-Up Paint . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
1 Getting Started with the Agilent Technologies E5500 Phase Noise Measurement System What You’ll Find in This Chapter… • • Introduction, page 1-2 Training Guidelines, page 1-3 Agilent Technologies E5500 Phase Noise Measurement System 1-1
Getting Started with the Agilent Technologies E5500 Phase Noise Measurement System Introduction The table on the right-hand page (Training Guidelines, page 1-3) will help you first learn about, then use the E5500 phase noise measurement system. The following three areas are covered in this manual: • • • Leaning about the E5500 phase noise measurement system Learning about phase noise basics and measurement fundamentals. Using the phase noise measurement system to make specific phase noise measurements.
Getting Started with the Agilent Technologies E5500 Phase Noise Measurement System Training Guidelines Table 1-1 Learning about the E5500 Phase Noise System Training Guidelines Learning about Phase Noise Basics and Measurement Fundamentals Using the E5500 to Make Specific Phase Noise Measurements Chapter 2, “Welcome to the E5500 Phase Noise Measurement System Series of Solutions” Chapter 3, “Your First Measurement” Chapter 4, “Phase Noise Basics” Chapter 5, “Expanding Your Measurement Experience” Chapt
2 Welcome to the Agilent Technologies E5500 Phase Noise Measurement System Series of Solutions What You’ll Find in This Chapter… • • Introducing the Graphical User Interface, page 2-2 System Requirements, page 2-4 Agilent Technologies E5500 Phase Noise Measurement System 2-1
Welcome to the Agilent Technologies E5500 Phase Noise Measurement System Series of Solutions Introducing the Graphical User Interface The graphical user interface gives the user instant access to all measurement functions making it easy to configure a system and define or initiate measurements. The most frequently used functions are displayed as icons on a toolbar, allowing quick and easy access to the measurement information.
Welcome to the Agilent Technologies E5500 Phase Noise Measurement System Series of Solutions Agilent Technologies E5500 Phase Noise Measurement System 2-3
Welcome to the Agilent Technologies E5500 Phase Noise Measurement System Series of Solutions System Requirements In case you want a quick review of the system requirements, we have listed them here.
3 Your First Measurement What You’ll Find in This Chapter… • • • E5500 Operation; A Guided Tour, page 3-3 Starting the Measurement Software, page 3-4 Making a Measurement, page 3-5 Agilent Technologies E5500 Phase Noise Measurement System 3-1
Your First Measurement Designed to Meet Your Needs Designed to Meet Your Needs The Agilent E5500 phase noise measurement system is a high performance measurement tool that enables you to fully evaluate the noise characteristics of your electronic instruments and components with unprecedented speed and ease. The phase noise measurement system provides you with the flexibility needed to meet today’s broad range of noise measurement requirements.
Your First Measurement E5500 Operation; A Guided Tour E5500 Operation; A Guided Tour This measurement demonstration will introduce you to the system’s operation by guiding you through an actual phase noise measurement. You will be measuring the phase noise of the Agilent/HP 70420A test set’s internal noise source. (The measurement made in this demonstration is the same measurement that is made to verify the system’s operation.
Your First Measurement Starting the Measurement Software Starting the Measurement Software 1. Place the E5500 phase noise measurement software disk in the disc holder and insert in the CD-ROM drive. 2. Click the Start button, point to Programs, point to Agilent Measurement Systems, point to E5500 Phase Noise, and then click Measurement Client. 3. The following phase noise measurement subsystem dialog box appears. Your dialog box may look slightly different.
Your First Measurement Making a Measurement Making a Measurement This first measurement is a confidence test that functionally checks the Agilent/HP 70420A test set’s filters and low-noise amplifiers using the test set’s internal noise source. The phase detectors are not tested. This confidence test also confirms that the test set, PC, and analyzers are communicating with each other. 1. From the File menu, choose Open. 2. If necessary, choose the drive or directory where the file you want is stored. 3.
Your First Measurement Making a Measurement 4. Click the Open button. The appropriate measurement definition parameters for this example have been pre-stored in this file. Table 3-1 on page 3-10 lists the parameter data that has been entered for the Agilent/HP 70420A confidence test example. 5. To view the parameter data in the software, a. From the Define menu, choose Measurement; then choose the Sources tab from the Define Measurement window. The parameter data is entered using the tabbed windows.
Your First Measurement Making a Measurement Beginning the Measurement 1. From the Measurement menu, choose New Measurement. 2. When the Do you want to Perform a New Calibration and Measurement dialog box appears, click Yes. 3. When the Connect Diagram dialog box appears, connect the 50 Ω termination, provided with your system, to the Agilent/HP 70420A test set’s noise input connector. Refer to “Connect Diagram Example” on page 3-8 for more information about the correct placement of the 50 Ω termination.
Your First Measurement Making a Measurement Connect Diagram Example Making the Measurement 1. Press the Continue key. Because you selected New Measurement to begin this measurement, the system starts by running the routines required to calibrate the current measurement setup. Figure 3-2 shows a typical baseband phase noise plot for an Agilent/HP 70420A phase noise test set.
Your First Measurement Making a Measurement Figure 3-2 Sweep-Segments Typical Phase Noise Curve for an Agilent/HP 70420A Confidence Test When the system begins measuring noise, it places the noise graph on its display. As you watch the graph, you will see the system plot its measurement results in frequency segments. The system measures the noise level across its frequency offset range by averaging the noise within smaller frequency segments.
Your First Measurement Making a Measurement Table 3-1 Parameter Data for the Agilent/HP 70420A Confidence Test Example Step Parameters 1 Type and Range Tab 2 Measurement Type • Baseband Noise (using a test set) • Start Frequency • 10 Hz • Stop Frequency • 100 E + 6 Hz1 • Minimum Number of Averages • 4 FFT Quality • Fast Swept Quality • Fast Cal Tab • Gain preceding noise input 3 5 • 0 dB Block Diagram Tab • Noise Source 4 Data • Test Set Noise Input Test Set Tab Input Attenuation
4 Phase Noise Basics What You’ll Find in This Chapter • What is Phase Noise?, page 4-2 Agilent Technologies E5500 Phase Noise Measurement System 4-1
Phase Noise Basics What is Phase Noise? What is Phase Noise? Frequency stability can be defined as the degree to which an oscillating source produces the same frequency throughout a specified period of time. Every RF and microwave source exhibits some amount of frequency instability. This stability can be broken down into two components: • • long-term stability short-term stability.
Phase Noise Basics What is Phase Noise? There are two types of fluctuating phase terms. The first, deterministic, are discrete signals appearing as distinct components in the spectral density plot. These signals, commonly called spurious, can be related to known phenomena in the signal source such as power line frequency, vibration frequencies, or mixer products. The second type of phase instability is random in nature, and is commonly called phase noise.
Phase Noise Basics What is Phase Noise? L(f) is an indirect measurement of noise energy easily related to the RF power spectrum observed on an RF analyzer.
Phase Noise Basics What is Phase Noise? Figure 4-4 L(f) Described Logarithmically as a Function of Offset Frequency Caution must be exercised when L ( f ) is calculated from the spectral density of the phase fluctuations S φ ( f ) because the calculation of L ( f ) is dependent on the small angle criterion.
Phase Noise Basics What is Phase Noise? Figure 4-5 Region of Validity of L(f) 4-6 Agilent Technologies E5500 Phase Noise Measurement System
5 Expanding Your Measurement Experience What You’ll Find in This Chapter CAUTION • Testing the Agilent/HP 8663A Internal/External 10 MHz, page 5-10 (Conf_8663A_10MHz.pnm) • Testing the Agilent/HP 8644B Internal/External 10 MHz, page 5-33 (Conf_8644B_10MHz.
Expanding Your Measurement Experience Starting the Measurement Software Starting the Measurement Software 1. Make sure your computer and monitor are turned on. 2. Place the Agilent E5500 phase noise measurement software disk in the disc holder and insert in the CD-ROM drive. 3. Click the Start button, point to Programs, point to Agilent Measurement Subsystems, point to E5500 Phase Noise, and then click Measurement Client.
Expanding Your Measurement Experience Using the Asset Manager to Add a Source Using the Asset Manager to Add a Source The following procedure will configure both the Agilent/HP 70420A phase noise test set and PC-digitizer so they can be used with the E5500A phase noise measurement software to make measurements. NOTE If you have ordered a preconfigured phase noise system from Agilent Technologies, skip this step and proceed to “Testing the Agilent/HP 8663A Internal/External 10 MHz” on page 5-10. 4.
Expanding Your Measurement Experience Using the Asset Manager to Add a Source Configuring a Source For this example we will use invoke the Asset Manager Wizard from within the Asset Manager. This is the most common way to add assets. 5. Click Asset, and then click Add. 6. From the Asset Type pull-down list, select Source, then click the Next button.
Expanding Your Measurement Experience Using the Asset Manager to Add a Source 7. Click on the source to be added (for example, the Agilent/HP 8663 sources), then click the Next button. 8. From the Interface pull-down list, select GPIB0. 9. In the Address box, type 19. 19 is the default address for the Agilent/HP 8663A sources, including the Agilent/HP 8662A, 8663A, and 8644B. 10. In the Library pull-down list, select the Hewlett-Packard VISA. 11. Click the Next button. 12.
Expanding Your Measurement Experience Using the Asset Manager to Add a Source 13. In the Serial Number box, type the serial number for your source. Click the Next button. 14. You may type a comment in this dialog box. The comment will associate itself with the asset you have just configured. Click the Finish button.
Expanding Your Measurement Experience Using the Asset Manager to Add a Source 15. You have just used the Asset Manager to configure a source. You will use the same process to add other software controlled assets to the phase noise measurement software. 16. click Server, and then click Exit to exit the Asset Manager. 17. Next proceed to “Using the Server Hardware Connections to Specify an Asset” on the next page.
Expanding Your Measurement Experience Using the Server Hardware Connections to Specify the Source Using the Server Hardware Connections to Specify the Source 1. From the System menu, choose Server Hardware Connections. 2. From the Test Set pull-down list, select Agilent/HP 8663. 3. A green check-mark will appear after the I/O check has been performed by the software. If a green check-mark does not appear, click the Check I/O button.
Expanding Your Measurement Experience Using the Server Hardware Connections to Specify the Source a. If a red circle with a slash appears, return to the Asset Manager (click the Asset Manager button) and verify that the Agilent/HP 8663A is configured correctly. b. Check your system hardware connections. c. Click the green check-mark button on the asset manager’s tool bar to verify connectivity. d. Return to “Server Hardware Connections” and click the Check I/O button for a re-check. 4.
Expanding Your Measurement Experience Testing the Agilent/HP 8663A Internal/External 10 MHz Testing the Agilent/HP 8663A Internal/External 10 MHz This measurement example will help you measure the absolute phase noise of an RF synthesizer. CAUTION To prevent damage to the Agilent/HP 70420A test set’s hardware components, the input signal must not be applied to the signal input connector until the input attenuator has been correctly set for the desired configuration, as show in Table 5-3 on page 5-17.
Expanding Your Measurement Experience Testing the Agilent/HP 8663A Internal/External 10 MHz Defining the Measurement 1. From the File menu, choose Open. 2. If necessary, choose the drive or directory where the file you want is stored. 3. In the File Name box, choose “Conf_8663A_10MHz.pnm”. 4. Click the Open button. The appropriate measurement definition parameters for this example have been pre-stored in this file.
Expanding Your Measurement Experience Testing the Agilent/HP 8663A Internal/External 10 MHz a. From the Define menu, choose Measurement; then choose the Sources tab from the Define Measurement window. b. Enter the carrier (center) frequency of your UUT (5 MHz to 1.6 GHz). Enter the same frequency for the detector input frequency. c. Enter the VCO (Nominal) Tuning Constant (see Table 5-2). d. Enter the Tune Range of VCO (see Table 5-2). e. Enter the Center Voltage of VCO (see Table 5-2). f.
Expanding Your Measurement Experience Testing the Agilent/HP 8663A Internal/External 10 MHz VCO Source Carrier Freq. Agilent/HP 8644B Other Signal Generator DCFM Calibrated for ±1V Other User VCO Source Selecting a Reference Source Tuning Constant (Hz/V) Center Voltage (V) Voltage Tuning Range (± V) Input Resistance (Ω) Tuning Calibration Method FM Deviation 0 10 600 Compute FM Deviation 0 10 Rin Compute Estimated within a factor of 2 –10 to +10 1E+6 Measure 1.
Expanding Your Measurement Experience Testing the Agilent/HP 8663A Internal/External 10 MHz Selecting Loop Suppression Verification 1. From the Define menu, choose Measurement; then choose the Cal tab from the Define Measurement window. 2. In the Cal dialog box, check Verify calculated phase locked loop supression and Always Show Suppression Graph. Select If limit is exceeded: Show Loop Suppression Graph. 3. When you have completed these operations, click the Close button.
Expanding Your Measurement Experience Testing the Agilent/HP 8663A Internal/External 10 MHz Figure 5-1 Noise Floor for the Agilent/HP 8663 10 MHz Measurement Figure 5-2 Noise Floor Example Agilent Technologies E5500 Phase Noise Measurement System 5-15
Expanding Your Measurement Experience Testing the Agilent/HP 8663A Internal/External 10 MHz If the output amplitude of your UUT is not sufficient to provide an adequate measurement noise floor, it will be necessary to insert a low-noise amplifier between the UUT and the test set. Refer to “Inserting an Device” in Chapter 6, “Absolute Measurement Fundamentals” for details on determining the effect the amplifiers noise will have on the measured noise floor.
Expanding Your Measurement Experience Testing the Agilent/HP 8663A Internal/External 10 MHz CAUTION The Agilent/HP 70420A test set’s signal input is subject to the following limits and characteristics: Table 5-3 Agilent/HP 70420A Test Set Signal Input Limits and Characteristics Limits Frequency 50 kHz to 26.
Expanding Your Measurement Experience Testing the Agilent/HP 8663A Internal/External 10 MHz Figure 5-3 Connect Diagram for the Agilent/HP 8663A 10 MHz Measurement 4. Refer to the following system connect diagram examples for more information about system interconnections : NOTE ❍ “E5501A Standard Connect Diagram Example” on page 5-19 ❍ “E5501B Standard Connect Diagram Example” on page 5-20 ❍ “E5502A Opt. 001 Connect Diagram Example” on page 5-21 ❍ “E5502A Opt.
Expanding Your Measurement Experience Testing the Agilent/HP 8663A Internal/External 10 MHz E5501A Standard Connect Diagram Example Agilent Technologies E5500 Phase Noise Measurement System 5-19
Expanding Your Measurement Experience Testing the Agilent/HP 8663A Internal/External 10 MHz E5501B Standard Connect Diagram Example 5-20 Agilent Technologies E5500 Phase Noise Measurement System
Expanding Your Measurement Experience Testing the Agilent/HP 8663A Internal/External 10 MHz E5502A Opt.
Expanding Your Measurement Experience Testing the Agilent/HP 8663A Internal/External 10 MHz E5502B Opt.
Expanding Your Measurement Experience Testing the Agilent/HP 8663A Internal/External 10 MHz E5503A Option 001 Connect Diagram Example Agilent Technologies E5500 Phase Noise Measurement System 5-23
Expanding Your Measurement Experience Testing the Agilent/HP 8663A Internal/External 10 MHz E5503B Option 001 Connect Diagram Example 5-24 Agilent Technologies E5500 Phase Noise Measurement System
Expanding Your Measurement Experience Testing the Agilent/HP 8663A Internal/External 10 MHz E5504A Option 201 Connect Diagram Example Agilent Technologies E5500 Phase Noise Measurement System 5-25
Expanding Your Measurement Experience Testing the Agilent/HP 8663A Internal/External 10 MHz E5504B Option 201 Connect Diagram Example 5-26 Agilent Technologies E5500 Phase Noise Measurement System
Expanding Your Measurement Experience Testing the Agilent/HP 8663A Internal/External 10 MHz 5. The following messages will appear on the display as the system performs the calibration routines. (You will have time to read through these message descriptions while the system completes the routines.) Determining Presence of Beat Note... An initial check is made to verify that a beatnote is present within the system’s detection range. Verifying zero-beat...
Expanding Your Measurement Experience Testing the Agilent/HP 8663A Internal/External 10 MHz Suppression to continue making the noise measurement. The measurement can be stopped by pressing the Abort key. Sweep-Segments When the system begins measuring noise, it places the noise graph on its display. As you watch the graph, you will see the system plot its measurement results in frequency segments.
Expanding Your Measurement Experience Testing the Agilent/HP 8663A Internal/External 10 MHz Figure 5-4 Making the Measurement Oscilloscope Display of a Beatnote out of the Agilent/HP 70420A Monitor Port 1. Click the Continue button when you have completed the beatnote check and are ready to make the measurement. 2. When the PLL Suppression Curve dialog box appears, select View Measured Loop Suppression, View Smoothed Loop Suppression, and View Adjusted Loop Suppression.
Expanding Your Measurement Experience Testing the Agilent/HP 8663A Internal/External 10 MHz There are four different curves available for the this graph (for more information about loop suppression verification, refer to Chapter 16, “Advanced Software Features”): a. “Measured” loop suppression curve - this is the result of the loop suppression measurement performed by the E5500 system; b.
Expanding Your Measurement Experience Testing the Agilent/HP 8663A Internal/External 10 MHz Table 5-4 Parameter Data for the Agilent/HP 8663A 10 MHz Measurement Step Parameters 1 Type and Range Tab 2 Data Measurement Type • Absolute Phase Noise (using a phase locked loop) • Start Frequency • 10 Hz • Stop Frequency • 2 E + 6 Hz1 • Minimum Number of Averages • 4 FFT Quality • Fast Sources Tab Carrier Source • Frequency • 10 E + 6 Hz • Power • 7 dBm • Carrier Source Output is connected t
Expanding Your Measurement Experience Testing the Agilent/HP 8663A Internal/External 10 MHz Table 5-4 Parameter Data for the Agilent/HP 8663A 10 MHz Measurement Step Parameters Data 5 Test Set Tab Input Attenuation • 0 dB LNA Low Pass Filter • 20 MHz (Auto checked) • LNA Gain • Auto Gain (Minimum Auto Gain - 14 dB) • DC Block • Not checked • PLL Integrator Attenuation • 0 dBm 6 Dowconverter Tab • The downconverter parameters do not apply to this measurement example.
Expanding Your Measurement Experience Testing the Agilent/HP 8644B Internal/External 10 MHz Testing the Agilent/HP 8644B Internal/External 10 MHz This measurement example will help you measure the absolute phase noise of an RF synthesizer. CAUTION To prevent damage to the Agilent/HP 70420A test set’s hardware components, the input signal must not be applied to the signal input connector until the input attenuator has been correctly set for the desired configuration, as show in Table 5-7 on page 5-40.
Expanding Your Measurement Experience Testing the Agilent/HP 8644B Internal/External 10 MHz Defining the Measurement 1. From the File menu, choose Open. 2. If necessary, choose the drive or directory where the file you want is stored. 3. In the File Name box, choose “Conf_8644B_10MHz.pnm”. 4. Click the Open button. The appropriate measurement definition parameters for this example have been pre-stored in this file.
Expanding Your Measurement Experience Testing the Agilent/HP 8644B Internal/External 10 MHz a. From the Define menu, choose Measurement; then choose the Sources tab from the Define Measurement window. b. Enter the carrier (center) frequency of your UUT (5 MHz to 1.6 GHz). Enter the same frequency for the detector input frequency. c. Enter the VCO (Nominal) Tuning Constant (see Table 5-6). d. Enter the Tune Range of VCO (see Table 5-6). e. Enter the Center Voltage of VCO (see Table 5-6). f.
Expanding Your Measurement Experience Testing the Agilent/HP 8644B Internal/External 10 MHz VCO Source Carrier Freq. Agilent/HP 8644B Other Signal Generator DCFM Calibrated for ±1V Other User VCO Source Selecting a Reference Source Tuning Constant (Hz/V) Center Voltage (V) Voltage Tuning Range (± V) Input Resistance (Ω) Tuning Calibration Method FM Deviation 0 10 600 Compute FM Deviation 0 10 Rin Compute Estimated within a factor of 2 –10 to +10 1E+6 Measure 1.
Expanding Your Measurement Experience Testing the Agilent/HP 8644B Internal/External 10 MHz Selecting Loop Suppression Verification 1. From the Define menu, choose Measurement; then choose the Cal tab from the Define Measurement window. 2. In the Cal dialog box, check Verify calculated phase locked loop supression and Always Show Suppression Graph. Select If limit is exceeded: Show Loop Suppression Graph. 3. When you have completed these operations, click the Close button.
Expanding Your Measurement Experience Testing the Agilent/HP 8644B Internal/External 10 MHz Figure 5-6 Noise Floor for the Agilent/HP 8644B 10 MHz Measurement Figure 5-7 Noise Floor Example If the output amplitude of your UUT is not sufficient to provide an adequate measurement noise floor, it will be necessary to insert a low-noise amplifier between the UUT and the test set.
Expanding Your Measurement Experience Testing the Agilent/HP 8644B Internal/External 10 MHz Chapter 6, “Absolute Measurement Fundamentals” for details on determining the effect the amplifiers noise will have on the measured noise floor.
Expanding Your Measurement Experience Testing the Agilent/HP 8644B Internal/External 10 MHz CAUTION The Agilent/HP 70420A test set’s signal input is subject to the following limits and characteristics: Table 5-7 Agilent/HP 70420A Test Set Signal Input Limits and Characteristics Limits Frequency 50 kHz to 26.
Expanding Your Measurement Experience Testing the Agilent/HP 8644B Internal/External 10 MHz Figure 5-8 Connect Diagram for the Agilent/HP 8644B 10 MHz Measurement 4.
Expanding Your Measurement Experience Testing the Agilent/HP 8644B Internal/External 10 MHz E5501A Standard Connect Diagram Example 5-42 Agilent Technologies E5500 Phase Noise Measurement System
Expanding Your Measurement Experience Testing the Agilent/HP 8644B Internal/External 10 MHz E5501B Standard Connect Diagram Example Agilent Technologies E5500 Phase Noise Measurement System 5-43
Expanding Your Measurement Experience Testing the Agilent/HP 8644B Internal/External 10 MHz E5502A Option 001 Connect Diagram Example 5-44 Agilent Technologies E5500 Phase Noise Measurement System
Expanding Your Measurement Experience Testing the Agilent/HP 8644B Internal/External 10 MHz E5502B Option 001 Connect Diagram Example Agilent Technologies E5500 Phase Noise Measurement System 5-45
Expanding Your Measurement Experience Testing the Agilent/HP 8644B Internal/External 10 MHz E5503A Option 001 Connect Diagram Example 5-46 Agilent Technologies E5500 Phase Noise Measurement System
Expanding Your Measurement Experience Testing the Agilent/HP 8644B Internal/External 10 MHz E5503B Option 001 Connect Diagram Example Agilent Technologies E5500 Phase Noise Measurement System 5-47
Expanding Your Measurement Experience Testing the Agilent/HP 8644B Internal/External 10 MHz E5504A Option 201 Connect Diagram Example 5-48 Agilent Technologies E5500 Phase Noise Measurement System
Expanding Your Measurement Experience Testing the Agilent/HP 8644B Internal/External 10 MHz E5504B Option 201 Connect Diagram Example Agilent Technologies E5500 Phase Noise Measurement System 5-49
Expanding Your Measurement Experience Testing the Agilent/HP 8644B Internal/External 10 MHz 5. The following messages will appear on the display as the system performs the calibration routines. (You will have time to read through these message descriptions while the system completes the routines.) Determining Presence of Beat Note... An initial check is made to verify that a beatnote is present within the system’s detection range. Verifying zero-beat...
Expanding Your Measurement Experience Testing the Agilent/HP 8644B Internal/External 10 MHz Suppression to continue making the noise measurement. The measurement can be stopped by pressing the Abort key. Sweep-Segments When the system begins measuring noise, it places the noise graph on its display. As you watch the graph, you will see the system plot its measurement results in frequency segments.
Expanding Your Measurement Experience Testing the Agilent/HP 8644B Internal/External 10 MHz Figure 5-9 Making the Measurement Oscilloscope Display of a Beatnote out of the Agilent/HP 70420A Monitor Port 1. Click the Continue button when you have completed the beatnote check and are ready to make the measurement. 2. When the PLL Suppression Curve dialog box appears, select View Measured Loop Suppression, View Smoothed Loop Suppression, and View Adjusted Loop Suppression.
Expanding Your Measurement Experience Testing the Agilent/HP 8644B Internal/External 10 MHz There are four different curves available for the this graph (for more information about loop suppression verification, refer to Chapter 16, “Advanced Software Features”): a. “Measured” loop suppression curve - this is the result of the loop suppression measurement performed by the E5500 system; b.
Expanding Your Measurement Experience Testing the Agilent/HP 8644B Internal/External 10 MHz Table 5-8 Parameter Data for the Agilent/HP 8644B 10 MHz Measurement Step Parameters 1 Type and Range Tab 2 Data Measurement Type • Absolute Phase Noise (using a phase locked loop) • Start Frequency • 10 Hz • Stop Frequency • 2 E + 6 Hz1 • Minimum Number of Averages • 4 FFT Quality • Fast Sources Tab Carrier Source • Frequency • 10 E + 6 Hz • Power • 7 dBm • Carrier Source Output is connected t
Expanding Your Measurement Experience Testing the Agilent/HP 8644B Internal/External 10 MHz Table 5-8 Parameter Data for the Agilent/HP 8644B 10 MHz Measurement Step Parameters 5 Test Set Tab Data Input Attenuation • 0 dB LNA Low Pass Filter • 20 MHz (Auto checked) • LNA Gain • Auto Gain (Minimum Auto Gain - 14 dB) • DC Block • Not checked • PLL Integrator Attenuation • 0 dBm 6 Dowconverter Tab • The downconverter parameters do not apply to this measurement example.
Expanding Your Measurement Experience Viewing Markers Viewing Markers The marker function allows you to display the exact frequency and amplitude of any point on the results graph. To access the marker function: On the View menu, click Markers. Up to nine markers may be added. To remove the highlighted marker, click the Delete button.
Expanding Your Measurement Experience Omitting Spurs Omitting Spurs The Omit Spurs function plots the currently loaded results without displaying any spurs that may be present. 1. On the View menu, click Display Preferences. 2. In the Display Preferences dialog box, uncheck Spurs.
Expanding Your Measurement Experience Omitting Spurs 3. The Graph will be displayed without spurs. To re-display the spurs, check Spurs in the Display Preferences dialog box.
Expanding Your Measurement Experience Displaying the Parameter Summary Displaying the Parameter Summary The Parameter Summary function allows you to quickly review the measurement parameter entries that were used for this measurement. The parameter summary data is included when you print the graph. 1. On the View menu, click Parameter Summay. 2. The Parameter Summary Notepad dialog box appears. The data can be printed or changed using standard Notepad functionality.
Expanding Your Measurement Experience Exporting Measurement Results Exporting Measurement Results The Export Measurement Results function exports data in one of three types: • • • “Exporting Trace Data” on page 5-61 “Exporting Spur Data” on page 5-62 “Exporting X-Y Data” on page 5-63 1. On the File menu, point to Export Results, then click on either Trace Data, Spur Data, or X-Y Data.
Expanding Your Measurement Experience Exporting Measurement Results Exporting Trace Data 1. On the File menu, point to Export Results, then click on Trace Data.
Expanding Your Measurement Experience Exporting Measurement Results Exporting Spur Data 1. On the File menu, point to Export Results, then click on Spur Data.
Expanding Your Measurement Experience Exporting Measurement Results Exporting X-Y Data 1. On the File menu, point to Export Results, then click on X-Y Data.
6 Absolute Measurement Fundamentals What You’ll Find in This Chapter This chapter contains information about making absolute phase noise measurements of signal sources. This information is fundamental to using the Agilent E5500 phase noise measurement system. It is important that you understand the concepts contained in this chapter in order to use the system effectively.
Absolute Measurement Fundamentals The Phase Lock Loop Technique The Phase Lock Loop Technique The phase lock loop measurement technique requires two signal sources; the source-under-test and a reference source. This measurement type requires that one of the two sources is a voltage-controlled-oscillator (VCO). You will most likely use the phase lock loop technique since it is the measurement type most commonly used for measuring signal source devices.
Absolute Measurement Fundamentals The Phase Lock Loop Technique Understanding the Phase-Lock Loop Technique This measurement technique requires two signal sources set up in a phase locked loop (PLL) configuration. One of the sources is the unit-under-test (UUT). The second source serves as the reference against which the UUT is measured. (One of the two sources must be a VCO source capable of being frequency tuned by the System.
Absolute Measurement Fundamentals The Phase Lock Loop Technique Figure 6-2 Typical Relationship of Capture Range and Drift Tracking Range to Tuning Range of VCO As an Example: A Peak Tuning Range of 1000 Hz will provide the following ranges: Capture Range = 0.05 X 1000 Hz = 50 Hz Drift Tracking Range = 0.24 X 1000 Hz = 240 Hz Tuning Requirements The peak tuning range required for your measurement will depend on the frequency stability of the two sources you are using.
Absolute Measurement Fundamentals The Phase Lock Loop Technique Figure 6-3 Relationship of Capture and Drift Tracking Ranges to Beatnote Frequency If the beatnote does not remain within the drift tracking range during the measurement, the out of lock detector will be set and the System will stop the measurement. If this happens, you will need to increase the system’s drift tracking range by increasing the system’s peak tuning range (if possible) or by selecting a VCO source with a greater tuning range.
Absolute Measurement Fundamentals What Sets the Measurement Noise Floor? What Sets the Measurement Noise Floor? The noise floor for your measurement will be set by two things: • • The System Noise Floor The noise floor of the phase detector and low-noise amplifier (LNA) The noise level of the reference source you are using The noise floor of the system is directly related to the amplitude of the input signal at the R input port of the system’s phase detector.
Absolute Measurement Fundamentals What Sets the Measurement Noise Floor? Figure 6-4 Relationship Between the R Input Level and System Noise Floor The Noise Level of the Reference Source Unless it is below the system’s noise floor, the noise level of the source you are using as the reference source will set the noise floor for the measurement. When you set up your measurement, you will want to use a reference source with a noise level that is at or below the level of the source you are going to measure.
Absolute Measurement Fundamentals Selecting a Reference Selecting a Reference Selecting an appropriate reference source is critical when you are making a phase noise measurement using the phase lock loop technique. The key to selecting a reference source is to compare the noise level of the reference with the expected noise level of the unit-under-test (UUT). In general, the lower the reference source’s noise level is below the expected noise level of the UUT the better.
Absolute Measurement Fundamentals Selecting a Reference Using a Signal Generator When using a signal generator as a reference source, it is important that the generator’s noise characteristics are adequate for measuring your device. Tuning Requirements Often the reference source you select will also serve as the VCO source for the PLL measurement. (The VCO source can be either the unit-under-test (UUT) or the reference source.
Absolute Measurement Fundamentals Selecting a Reference Figure 6-7 Agilent/HP 70420A Voltage Tuning Range Limits Relative to Center Voltage of the VCO Tuning Curve.
Absolute Measurement Fundamentals Estimating the Tuning Constant Estimating the Tuning Constant The VCO tuning constant is the tuning sensitivity of the VCO source in Hz/V. The required accuracy of the entered tuning constant value depends on the VCO tuning constant calibration method specified for the measurement. The calibration method is selected in the Calibr Process menu. The following chart lists the calibration method choices and the tuning constant accuracy required for each.
Absolute Measurement Fundamentals Tracking Frequency Drift Tracking Frequency Drift The system’s frequency drift tracking capability for the phase lock loop measurement is directly related to the tuning range of the VCO source being used. The system’s drift tracking range is approximately 24% of the peak tuning range (PTR) of the VCO.
Absolute Measurement Fundamentals Tracking Frequency Drift • By Selecting a measurement example in this chapter that specifies a drift rate compatible with the beatnote drift rate you have observed. By Increasing the peak tuning range for the measurement. (Further information about increasing the PTR is provided in Changing the PTR.
Absolute Measurement Fundamentals Changing the PTR Changing the PTR The peak tuning range (PTR) for the phase lock loop measurement is set by the tune range entered for the VCO and the VCO’s tuning constant. (If the calibration technique is set to measure the VCO tuning constant, the measured value will be used to determine the system’s PTR.) PTR= VCO Tuning Constant X Voltage Tuning Range From the PTR, the phase noise software derives the capture and drift tracking Ranges for the measurement.
Absolute Measurement Fundamentals Changing the PTR As long as these qualifications are met, and the software does not indicate any difficulty in establishing its calibration criteria, an increase in PTR will not degrade the system’s measurement accuracy. The following methods may be considered for increasing or decreasing the PTR. Voltage-Controlled-Oscillators 1. Select a different VCO source that has the tuning capabilities needed for the measurement. 2. Increase the tune range of the VCO source.
Absolute Measurement Fundamentals Minimizing Injection Locking Minimizing Injection Locking Injection locking occurs when a signal feeds back into an oscillator through its output path. This can cause the oscillator to become locked to the injected signal rather than to the reference signal for the phase locked loop. Injection locking is possible whenever the buffering at the output of an oscillator is not sufficient to prevent a signal from entering.
Absolute Measurement Fundamentals Minimizing Injection Locking 2. Multiply the injection locking bandwidth by 2 to determine the minimum PLL bandwidth required to prevent the injection locking from causing the system to lose lock. (To prevent accuracy degradation, it may be necessary to increase the PLL bandwidth to 4 X the injection locking bandwidth. The computer will inform you during the measurement if the possibility of accuracy degradation exists.) 3.
Absolute Measurement Fundamentals Inserting a Device Inserting a Device An Attenuator You may find that some of your measurement setups require an in-line device such as an attenuator in one of the signal source paths. (For example, you may find it necessary to insert an attenuator at the output of a unit-under-test (UUT) to prevent it from being injection locked to the reference source.
Absolute Measurement Fundamentals Inserting a Device L(f) out = -174 dB + Amplifier Noise Figure - Power into Amplifier - 3dB For Example, Figure 6-10 Measurement Noise Floor as a Result of an added Attenuator Agilent Technologies E5500 Phase Noise Measurement System 6-19
Absolute Measurement Fundamentals Evaluating Noise Above the Small Angle Line Evaluating Noise Above the Small Angle Line If the average noise level on the input signals exceeds approximately 0.1 radians RMS integrated outside of the Phase Lock Loop (PLL) bandwidth, it can prevent the system from attaining phase lock. The following procedure allows you to evaluate the beatnote created between the two sources being measured.
Absolute Measurement Fundamentals Evaluating Noise Above the Small Angle Line Figure 6-11 Graph of Phase Lock Loop Bandwidth Provided by the Peak Tuning Range 1. Once the beatnote is displayed, press the press [[RANGE ]] , press [[AUTO RANGE OFF ]] , and press [[SINGLE AUTO RANGE ]] on the RF analyzer. 2. Set the span width on the RF analyzer to approximately 4 x PLL bandwidth. Adjust the beatnote to position it near the center of the display.
Absolute Measurement Fundamentals Evaluating Noise Above the Small Angle Line 6. Using the --> key on the RF analyzer, offset the marker by the PLL bandwidth. Read the offset frequency and noise level indicated at the bottom of the display. (If the noise level falls below the bottom of the display, the marker reading will still be correct. To increase the vertical scale, press [[ VERT SCALE ]] press [[, DEFINE DB/DIV, and enter 20 dB.) 7.
Absolute Measurement Fundamentals Evaluating Noise Above the Small Angle Line Figure 6-13 Graph Showing Peak Tuning Range Requirements for Noise that Exceeds the Small Angle Limit Measurement Options If the observed level exceeded the small angle line at any point beyond the PLL bandwidth set for the measurement, you will need to consider one of the following measurement options. 1. Evaluate your source using the noise data provided by the RF analyzer in the procedure you just performed. 2.
7 Absolute Measurement Examples What You’ll Find in This Chapter • CAUTION Measurement Examples ❍ Stable RF Oscillator, page 7-2 (StableRF.pnm) ❍ Free-Running RF Oscillator, page 7-24 (FreeRF.pnm) ❍ RF Synthesizer using DCFM, page 7-48 (RFSynth_DCFM.pnm) ❍ RF Synthesizer using EFC, page 7-72 (RFSynth_EFC.pnm) ❍ Microwave Source, page 7-97 (MicroSRC.
Absolute Measurement Examples Stable RF Oscillator Stable RF Oscillator This measurement example will help you measure the phase noise of a stable RF oscillator with frequency drift of <20 ppm over a period of thirty minutes. CAUTION To prevent damage to the Agilent/HP 70420A test set’s hardware components, the input signal must not be applied to the signal input connector until the input attenuator has been correctly set for the desired configuration, as show in Table 7-3 on page 7-9.
Absolute Measurement Examples Stable RF Oscillator Defining the Measurement 1. From the File menu, choose Open. 2. If necessary, choose the drive or directory where the file you want is stored. 3. In the File Name box, choose “StableRF.pnm”. 4. Click the Open button. The appropriate measurement definition parameters for this example have been pre-stored in this file. Table 7-4 on page 7-22 lists the parameter data that has been entered for the Stable RF Source measurement example.
Absolute Measurement Examples Stable RF Oscillator a. From the Define menu, choose Measurement; then choose the Sources tab from the Define Measurement window. b. Enter the carrier (center) frequency of your UUT (5 MHz to 1.6 GHz). Enter the same frequency for the detector input frequency. c. Enter the VCO (Nominal) Tuning Constant (see Table 7-2). d. Enter the Tune Range of VCO (see Table 7-2). e. Enter the Center Voltage of VCO (see Table 7-2). f.
Absolute Measurement Examples Stable RF Oscillator VCO Source Carrier Freq. Agilent/HP 8644B Other Signal Generator DCFM Calibrated for ±1V Other User VCO Source Selecting a Reference Source Tuning Constant (Hz/V) Center Voltage (V) Voltage Tuning Range (± V) Input Resistance (Ω) Tuning Calibration Method FM Deviation 0 10 600 Compute FM Deviation 0 10 Rin Compute Estimated within a factor of 2 –10 to +10 1E+6 Measure 1.
Absolute Measurement Examples Stable RF Oscillator Selecting Loop Suppression Verification 1. From the Define menu, choose Measurement; then choose the Cal tab from the Define Measurement window. 2. In the Cal dialog box, check Verify calculated phase locked loop suppression and Always Show Suppression Graph. Select If limit is exceeded: Show Loop Suppression Graph. 3. When you have completed these operations, click the Close button.
Absolute Measurement Examples Stable RF Oscillator Figure 7-1 Noise Floor for the Stable RF Oscillator Measurement Figure 7-2 Noise Floor Example If the output amplitude of your UUT is not sufficient to provide an adequate measurement noise floor, it will be necessary to insert a low-noise amplifier between the UUT and the test set.
Absolute Measurement Examples Stable RF Oscillator Chapter 6, “Absolute Measurement Fundamentals” for details on determining the effect the amplifiers noise will have on the measured noise floor. VCO Reference Source This setup calls for a second signal source that is a similar type to that of the UUT. The second source is used as the reference source.
Absolute Measurement Examples Stable RF Oscillator Table 7-3 Agilent/HP 70420A Test Set Signal Input Limits and Characteristics Limits Frequency 50 kHz to 1.6 GHz (Std) 50 kHz to 26.5 GHz (Option 001) 50 kHz to 26.
Absolute Measurement Examples Stable RF Oscillator Figure 7-3 Connect Diagram for the Stable RF Oscillator Measurement 4.
Absolute Measurement Examples Stable RF Oscillator E5501A Standard Connect Diagram Example Agilent Technologies E5500 Phase Noise Measurement System 7-11
Absolute Measurement Examples Stable RF Oscillator E5501B Standard Connect Diagram Example 7-12 Agilent Technologies E5500 Phase Noise Measurement System
Absolute Measurement Examples Stable RF Oscillator E5502A Option 001 Connect Diagram Example Agilent Technologies E5500 Phase Noise Measurement System 7-13
Absolute Measurement Examples Stable RF Oscillator E5502B Option 001 Connect Diagram Example 7-14 Agilent Technologies E5500 Phase Noise Measurement System
Absolute Measurement Examples Stable RF Oscillator E5503A Option 001 Connect Diagram Example Agilent Technologies E5500 Phase Noise Measurement System 7-15
Absolute Measurement Examples Stable RF Oscillator E5503B Option 001 Connect Diagram Example 7-16 Agilent Technologies E5500 Phase Noise Measurement System
Absolute Measurement Examples Stable RF Oscillator E5504A Option 201 Connect Diagram Example Agilent Technologies E5500 Phase Noise Measurement System 7-17
Absolute Measurement Examples Stable RF Oscillator E5504B Option 201 Connect Diagram Example 7-18 Agilent Technologies E5500 Phase Noise Measurement System
Absolute Measurement Examples Stable RF Oscillator Checking the Beatnote While the connect diagram is still displayed, recommend that you use an oscilloscope (connected to the Monitor port on the Agilent/HP 70420A) or a counter to check the beatnote being created between the reference source and your device-under-test.
Absolute Measurement Examples Stable RF Oscillator Figure 7-4 Making the Measurement Oscilloscope Display of a Beatnote out of the Agilent/HP 70420A Monitor Port 1. Click the Continue button when you have completed the beatnote check and are ready to make the measurement. 2. When the PLL Suppression Curve dialog box appears, select View Measured Loop Suppression, View Smoothed Loop Suppression, and View Adjusted Loop Suppression.
Absolute Measurement Examples Stable RF Oscillator There are four different curves available for the this graph (for more information about loop suppression verification, refer to Chapter 16, “Advanced Software Features”): a. “Measured” loop suppression curve - this is the result of the loop suppression measurement performed by the E5500 system; b.
Absolute Measurement Examples Stable RF Oscillator Table 7-4 Parameter Data for the Stable RF Oscillator Measurement Step Parameters 1 Type and Range Tab 2 3 4 Data • Measurement Type • Absolute Phase Noise (using a phase locked loop) • Start Frequency • 1 Hz • Stop Frequency • 100 E + 6 Hz • Averages • 4 • Quality • Normal • FFT Analyzer Measurement Mode • Use Multiple Time Segments Sources Tab • Carrier Source Frequency • 100 E + 6 Hz • Carrier Source Power • 8 dBm • Carrier Sou
Absolute Measurement Examples Stable RF Oscillator Table 7-4 Parameter Data for the Stable RF Oscillator Measurement Step Parameters 5 Test Set Tab Data • Input Attenuation • Auto checked • LNA Low Pass Filter • Auto checked • LNA Gain • Auto Gain • Detector Maximum Input Levels Microwave Phase Detector • 0 dBm RF Phase Detector • 0 dBm AM Detector • 0 dBm • Ignore out-of-lock conditions • Not checked • Pulsed Carrier • Not checked • DC Block • Not checked • Analyzer View • Baseba
Absolute Measurement Examples Free-Running RF Oscillator Free-Running RF Oscillator This measurement example will help you measure the phase noise of a free-running RF oscillator with frequency drift >20 ppm over a period of thirty minutes. CAUTION To prevent damage to the Agilent/HP 70420A test set’s hardware components, the input signal must not be applied to the signal input connector until the input attenuator has been correctly set for the desired configuration, as show in Table 7-7 on page 7-31.
Absolute Measurement Examples Free-Running RF Oscillator Defining the Measurement 1. From the File menu, choose Open. 2. If necessary, choose the drive or directory where the file you want is stored. 3. In the File Name box, choose “FreeRF.pnm”. 4. Click the Open button. The appropriate measurement definition parameters for this example have been pre-stored in this file. Table 7-8 on page 7-46 lists the parameter data that has been entered for the Free-Running RF Source measurement example.
Absolute Measurement Examples Free-Running RF Oscillator a. From the Define menu, choose Measurement; then choose the Sources tab from the Define Measurement window. b. Enter the carrier (center) frequency of your UUT(5 MHz to 1.6 GHz). Enter the same frequency for the detector input frequency. c. Enter the VCO (Nominal) Tuning Constant (see Table 7-6). d. Enter the Tune Range of VCO (see Table 7-6). e. Enter the Center Voltage of VCO (see Table 7-6). f.
Absolute Measurement Examples Free-Running RF Oscillator VCO Source Carrier Freq. Agilent/HP 8644B Other Signal Generator DCFM Calibrated for ±1V Other User VCO Source Selecting a Reference Source Tuning Constant (Hz/V) Center Voltage (V) Voltage Tuning Range (± V) Input Resistance (Ω) Tuning Calibration Method FM Deviation 0 10 600 Compute FM Deviation 0 10 Rin Compute Estimated within a factor of 2 –10 to +10 1E+6 Measure 1.
Absolute Measurement Examples Free-Running RF Oscillator Selecting Loop Suppression Verification 1. From the Define menu, choose Measurement; then choose the Cal tab from the Define Measurement window. 2. In the Cal dialog box, check Verify calculated phase locked loop suppression and Always Show Suppression Graph. Select If limit is exceeded: Show Loop Suppression Graph. 3. When you have completed these operations, click the Close button.
Absolute Measurement Examples Free-Running RF Oscillator Figure 7-6 Noise Floor for the Free-Running RF Oscillator Measurement Figure 7-7 Noise Floor Calculation Example Agilent Technologies E5500 Phase Noise Measurement System 7-29
Absolute Measurement Examples Free-Running RF Oscillator If the output amplitude of your UUT is not sufficient to provide an adequate measurement noise floor, it will be necessary to insert a low-noise amplifier between the UUT and the test set. Refer to “Inserting an Device” in Chapter 6, “Absolute Measurement Fundamentals” for details on determining the effect the amplifiers noise will have on the measured noise floor.
Absolute Measurement Examples Free-Running RF Oscillator Beginning the Measurement 1. From the Measurement menu, choose New Measurement. 2. When the Perform a New Calibration and Measurement dialog box appears, click OK. 3. When the Connect Diagram dialog box appears, click on the hardware down arrow and select your hardware configuration from the pull-down list. Confirm your connections as shown in the connect diagram. At this time connect your UUT and reference sources to the test set.
Absolute Measurement Examples Free-Running RF Oscillator Table 7-7 Agilent/HP 70420A Test Set Signal Input Limits and Characteristics • Internal AM Detector 0 to +20 dBm • Downconverters: Agilent/HP 70422A 0 to +30 dBm Agilent/HP 70427A +5 to +15 dBm CAUTION: To prevent damage to the Agilent/HP 70420A test set’s hardware components, the input signal must not be applied to the test set’s signal input connector until the input attenuator (Option 001) has been correctly set by the phase noise software,
Absolute Measurement Examples Free-Running RF Oscillator NOTE ❍ “E5502A Option 001 Connect Diagram Example” on page 7-36 ❍ “E5503B Option 001 Connect Diagram Example” on page 7-39 ❍ “E5504A Option 201 Connect Diagram Example” on page 7-40 ❍ “E5504B Option 201 Connect Diagram Example” on page 7-41 For additional examples, refer to Chapter 19, “Connect Diagrams” Agilent Technologies E5500 Phase Noise Measurement System 7-33
Absolute Measurement Examples Free-Running RF Oscillator E5501A Standard Connect Diagram Example 7-34 Agilent Technologies E5500 Phase Noise Measurement System
Absolute Measurement Examples Free-Running RF Oscillator E5501B Standard Connect Diagram Example Agilent Technologies E5500 Phase Noise Measurement System 7-35
Absolute Measurement Examples Free-Running RF Oscillator E5502A Option 001 Connect Diagram Example 7-36 Agilent Technologies E5500 Phase Noise Measurement System
Absolute Measurement Examples Free-Running RF Oscillator E5502B Option 001 Connect Diagram Example Agilent Technologies E5500 Phase Noise Measurement System 7-37
Absolute Measurement Examples Free-Running RF Oscillator E5503A Option 001 Connect Diagram Example 7-38 Agilent Technologies E5500 Phase Noise Measurement System
Absolute Measurement Examples Free-Running RF Oscillator E5503B Option 001 Connect Diagram Example Agilent Technologies E5500 Phase Noise Measurement System 7-39
Absolute Measurement Examples Free-Running RF Oscillator E5504A Option 201 Connect Diagram Example 7-40 Agilent Technologies E5500 Phase Noise Measurement System
Absolute Measurement Examples Free-Running RF Oscillator E5504B Option 201 Connect Diagram Example Agilent Technologies E5500 Phase Noise Measurement System 7-41
Absolute Measurement Examples Free-Running RF Oscillator Checking the Beatnote While the connect diagram is still displayed, recommend that you use an oscilloscope (connected to the Monitor port on the Agilent/HP 70420A) or a counter to check the beatnote being created between the reference source and your device-under-test.
Absolute Measurement Examples Free-Running RF Oscillator Figure 7-9 Oscilloscope Display of a Beatnote out of the Agilent/HP 70420A Monitor Port 1. Estimate the system’s capture range (using the VCO source parameters entered for this measurement). The estimated VCO tuning constant must be accurate within a factor of 2. A procedure for Estimating the Tuning Constant is located in this chapter.
Absolute Measurement Examples Free-Running RF Oscillator Making the Measurement 1. Click the Continue button when you have completed the beatnote check and are ready to make the measurement. 2. When the PLL Suppression Curve dialog box appears, select View Measured Loop Suppression, View Smoothed Loop Suppression, and View Adjusted Loop Suppression.
Absolute Measurement Examples Free-Running RF Oscillator Figure 7-10 on page 7-45 shows a typical phase noise curve for a free-running RF Oscillator. Figure 7-10 Typical Phase Noise Curve for a Free-Running RF Oscillator.
Absolute Measurement Examples Free-Running RF Oscillator Table 7-8 Parameter Data for the Free-Running RF Oscillator Measurement Step Parameters 1 Type and Range Tab 2 Data Measurement Type • Absolute Phase Noise (using a phase locked loop) • Start Frequency • 10 Hz • Stop Frequency • 4 E + 6 Hz • Minimum Number of Averages • 4 FFT Quality • Fast Sources Tab Carrier Source • Frequency • 10.
Absolute Measurement Examples Free-Running RF Oscillator Table 7-8 Parameter Data for the Free-Running RF Oscillator Measurement Step Parameters 5 Test Set Tab 6 Data Input Attenuation • 0 dB LNA Low Pass Filter • 20 MHz (Auto checked) • LNA Gain • Auto Gain (Minimum Auto Gain - 14 dB) • DC Block • Not checked • PLL Integrator Attenuation • 0 dBm Downconverter Tab Input Frequency • 10.044 E + 9 L.O. Frequency • Auto I.F. Frequency • 444 E +6 Millimeter Frequency • 0 L.O.
Absolute Measurement Examples RF Synthesizer using DCFM RF Synthesizer using DCFM This measurement example will help you measure the absolute phase noise of an RF synthesizer using DCFM. CAUTION To prevent damage to the Agilent/HP 70420A test set’s hardware components, the input signal must not be applied to the signal input connector until the input attenuator has been correctly set for the desired configuration, as show in Table 7-11 on page 7-55.
Absolute Measurement Examples RF Synthesizer using DCFM Defining the Measurement 1. From the File menu, choose Open. 2. If necessary, choose the drive or directory where the file you want is stored. 3. In the File Name box, choose “RFSynth_DCFM.pnm”. 4. Click the Open button. The appropriate measurement definition parameters for this example have been pre-stored in this file. Table 7-12 on page 7-70 lists the parameter data that has been entered for the RF Synthesizer using DCFM measurement example.
Absolute Measurement Examples RF Synthesizer using DCFM a. From the Define menu, choose Measurement; then choose the Sources tab from the Define Measurement window. b. Enter the carrier (center) frequency of your UUT (5 MHz to 1.6 GHz). Enter the same frequency for the detector input frequency. c. Enter the VCO (Nominal) Tuning Constant (see Table 7-10). d. Enter the Tune Range of VCO (see Table 7-10). e. Enter the Center Voltage of VCO (see Table 7-10). f.
Absolute Measurement Examples RF Synthesizer using DCFM VCO Source Carrier Freq. Agilent/HP 8644B Other Signal Generator DCFM Calibrated for ±1V Other User VCO Source Selecting a Reference Source Tuning Constant (Hz/V) Center Voltage (V) Voltage Tuning Range (± V) Input Resistance (Ω) Tuning Calibration Method FM Deviation 0 10 600 Compute FM Deviation 0 10 Rin Compute Estimated within a factor of 2 –10 to +10 1E+6 Measure 1.
Absolute Measurement Examples RF Synthesizer using DCFM Selecting Loop Suppression Verification 1. From the Define menu, choose Measurement; then choose the Cal tab from the Define Measurement window. 2. In the Cal dialog box, check Verify calculated phase locked loop suppression and Always Show Suppression Graph. Select If limit is exceeded: Show Loop Suppression Graph. 3. When you have completed these operations, click the Close button.
Absolute Measurement Examples RF Synthesizer using DCFM Figure 7-11 Noise Floor for the RF Synthesizer (DCFM) Measurement Figure 7-12 Noise Floor Calculation Example Agilent Technologies E5500 Phase Noise Measurement System 7-53
Absolute Measurement Examples RF Synthesizer using DCFM If the output amplitude of your UUT is not sufficient to provide an adequate measurement noise floor, it will be necessary to insert a low noise amplifier between the UUT and the Agilent/HP 70420A input. (Refer to “Inserting an Device” in Chapter 6, “Absolute Measurement Fundamentals” for details on determining the effect that the amplifier’s noise will have on the measured noise floor.
Absolute Measurement Examples RF Synthesizer using DCFM Beginning the Measurement 1. From the Measurement menu, choose New Measurement. 2. When the Perform a New Calibration and Measurement dialog box appears, click OK. 3. When the Connect Diagram dialog box appears, click on the hardware down arrow and select your hardware configuration from the pull-down list. Confirm your connections as shown in the connect diagram. At this time connect your UUT and reference sources to the test set.
Absolute Measurement Examples RF Synthesizer using DCFM Table 7-11 Agilent/HP 70420A Test Set Signal Input Limits and Characteristics • Internal AM Detector 0 to +20 dBm • Downconverters: Agilent/HP 70422A 0 to +30 dBm Agilent/HP 70427A +5 to +15 dBm CAUTION: To prevent damage to the Agilent/HP 70420A test set’s hardware components, the input signal must not be applied to the test set’s signal input connector until the input attenuator (Option 001) has been correctly set by the phase noise software,
Absolute Measurement Examples RF Synthesizer using DCFM NOTE ❍ “E5502A Option 001 Connect Diagram Example” on page 7-36 ❍ “E5503B Option 001 Connect Diagram Example” on page 7-39 ❍ “E5504A Option 201 Connect Diagram Example” on page 7-64 ❍ “E5504B Option 201 Connect Diagram Example” on page 7-65 For additional examples, refer to Chapter 19, “Connect Diagrams” Agilent Technologies E5500 Phase Noise Measurement System 7-57
Absolute Measurement Examples RF Synthesizer using DCFM E5501A Standard Connect Diagram Example 7-58 Agilent Technologies E5500 Phase Noise Measurement System
Absolute Measurement Examples RF Synthesizer using DCFM E5501B Standard Connect Diagram Example Agilent Technologies E5500 Phase Noise Measurement System 7-59
Absolute Measurement Examples RF Synthesizer using DCFM E5502A Option 001 Connect Diagram Example 7-60 Agilent Technologies E5500 Phase Noise Measurement System
Absolute Measurement Examples RF Synthesizer using DCFM E5502B Option 001 Connect Diagram Example Agilent Technologies E5500 Phase Noise Measurement System 7-61
Absolute Measurement Examples RF Synthesizer using DCFM E5503A Option 001 Connect Diagram Example 7-62 Agilent Technologies E5500 Phase Noise Measurement System
Absolute Measurement Examples RF Synthesizer using DCFM E5503B Option 001 Connect Diagram Example Agilent Technologies E5500 Phase Noise Measurement System 7-63
Absolute Measurement Examples RF Synthesizer using DCFM E5504A Option 201 Connect Diagram Example 7-64 Agilent Technologies E5500 Phase Noise Measurement System
Absolute Measurement Examples RF Synthesizer using DCFM E5504B Option 201 Connect Diagram Example Agilent Technologies E5500 Phase Noise Measurement System 7-65
Absolute Measurement Examples RF Synthesizer using DCFM Checking the Beatnote While the connect diagram is still displayed, recommend that you use an oscilloscope (connected to the Monitor port on the Agilent/HP 70420A) or a counter to check the beatnote being created between the reference source and your device-under-test.
Absolute Measurement Examples RF Synthesizer using DCFM Figure 7-14 Oscilloscope Display of a Beatnote out of the Agilent/HP 70420A Monitor Port Agilent Technologies E5500 Phase Noise Measurement System 7-67
Absolute Measurement Examples RF Synthesizer using DCFM Making the Measurement 1. Click the Continue button when you have completed the beatnote check and are ready to make the measurement. 2. When the PLL Suppression Curve dialog box appears, select View Measured Loop Suppression, View Smoothed Loop Suppression, and View Adjusted Loop Suppression.
Absolute Measurement Examples RF Synthesizer using DCFM Figure 7-15 on page 7-69 shows a typical phase noise curve for a RF synthesizer using DCFM. Figure 7-15 Typical Phase Noise Curve for an RF Synthesizer using DCFM.
Absolute Measurement Examples RF Synthesizer using DCFM Table 7-12 Parameter Data for the RF Synthesizer (DCFM) Measurement Step Parameters 1 Type and Range Tab 2 Data Measurement Type • Absolute Phase Noise (using a phase locked loop) • Start Frequency • 10 Hz • Stop Frequency • 4 E + 6 Hz • Minimum Number of Averages • 4 FFT Quality • Fast Sources Tab Carrier Source • Frequency • 600 E + 6 Hz • Power • 20 dBm • Carrier Source Output is connected to: • Test Set Detector Input • Fre
Absolute Measurement Examples RF Synthesizer using DCFM Table 7-12 Parameter Data for the RF Synthesizer (DCFM) Measurement Step Parameters 5 Test Set Tab Data Input Attenuation • 0 dB LNA Low Pass Filter • 20 MHz (Auto checked) • LNA Gain • Auto Gain (Minimum Auto Gain - 14 dB) • DC Block • Not checked • PLL Integrator Attenuation • 0 dBm 6 Downconverter Tab • The downconverter parameters do not apply to this measurement example.
Absolute Measurement Examples RF Synthesizer using EFC RF Synthesizer using EFC This measurement example will help you measure the absolute phase noise of an RF synthesizer using EFC. CAUTION To prevent damage to the Agilent/HP 70420A test set’s hardware components, the input signal must not be applied to the signal input connector until the input attenuator has been correctly set for the desired configuration, as show in Table 7-15 on page 7-80.
Absolute Measurement Examples RF Synthesizer using EFC Defining the Measurement 1. From the File menu, choose Open. 2. If necessary, choose the drive or directory where the file you want is stored. 3. In the File Name box, choose “RFSynth_EFC.pnm”. 4. Click the Open button. The appropriate measurement definition parameters for this example have been pre-stored in this file. Table 7-16 on page 7-95 lists the parameter data that has been entered for the RF Synthesizer using EFC measurement example.
Absolute Measurement Examples RF Synthesizer using EFC a. From the Define menu, choose Measurement; then choose the Sources tab from the Define Measurement window. b. Enter the carrier (center) frequency of your UUT (5 MHz to 1.6 GHz). Enter the same frequency for the detector input frequency. c. Enter the VCO Tuning Constant (see Table 7-14 on page 7-75). d.
Absolute Measurement Examples RF Synthesizer using EFC Table 7-14 Tuning Characteristics for Various Sources Carrier Freq.
Absolute Measurement Examples RF Synthesizer using EFC 3. When you have completed these operations, click the Close button. Selecting Loop Suppression Verification 1. From the Define menu, choose Measurement; then choose the Cal tab from the Define Measurement window. 2. In the Cal dialog box, check Verify calculated phase locked loop suppression and Always Show Suppression Graph. Select If limit is exceeded: Show Loop Suppression Graph. 3.
Absolute Measurement Examples RF Synthesizer using EFC Selecting a Reference Source 1. From the Define menu, choose Measurement; then choose the Block Diagram tab from the Define Measurement window. 2. From the Reference Source pull-down list, select your reference source. 3. When you have completed these operations, click the Close button.
Absolute Measurement Examples RF Synthesizer using EFC Figure 7-16 Noise Floor for the RF Synthesizer (EFC) Measurement If the output amplitude of your UUT is not sufficient to provide an adequate measurement noise floor, it will be necessary to insert a low noise amplifier between the UUT and the Agilent/HP 70420A input. (Refer to “Inserting an Device” in Chapter 6, “Absolute Measurement Fundamentals” for details on determining the effect that the amplifier’s noise will have on the measured noise floor.
Absolute Measurement Examples RF Synthesizer using EFC Agilent/HP 8663A VCO Reference This setup uses the Agilent/HP 8663A as the VCO reference source. In order for the noise measurement results to accurately represent the noise of the UUT, the noise level of the reference source should be below the expected noise level of the UUT.
Absolute Measurement Examples RF Synthesizer using EFC Beginning the Measurement 1. From the Measurement menu, choose New Measurement. 2. When the Perform a New Calibration and Measurement dialog box appears, click OK. 3. When the Connect Diagram dialog box appears, click on the hardware down arrow and select your hardware configuration from the pull-down list. Confirm your connections as shown in the connect diagram. At this time connect your UUT and reference sources to the test set.
Absolute Measurement Examples RF Synthesizer using EFC Table 7-15 Agilent/HP 70420A Test Set Signal Input Limits and Characteristics • Internal AM Detector 0 to +20 dBm • Downconverters: Agilent/HP 70422A 0 to +30 dBm Agilent/HP 70427A +5 to +15 dBm CAUTION: To prevent damage to the Agilent/HP 70420A test set’s hardware components, the input signal must not be applied to the test set’s signal input connector until the input attenuator (Option 001) has been correctly set by the phase noise software,
Absolute Measurement Examples RF Synthesizer using EFC NOTE ❍ “E5502A Option 001 Connect Diagram Example” on page 7-36 ❍ “E5503B Option 001 Connect Diagram Example” on page 7-88 ❍ “E5504A Option 201 Connect Diagram Example” on page 7-89 ❍ “E5504B Option 201 Connect Diagram Example” on page 7-90 For additional examples, refer to Chapter 19, “Connect Diagrams” 7-82 Agilent Technologies E5500 Phase Noise Measurement System
Absolute Measurement Examples RF Synthesizer using EFC E5501A Standard Connect Diagram Example Agilent Technologies E5500 Phase Noise Measurement System 7-83
Absolute Measurement Examples RF Synthesizer using EFC E5501B Standard Connect Diagram Example 7-84 Agilent Technologies E5500 Phase Noise Measurement System
Absolute Measurement Examples RF Synthesizer using EFC E5502A Option 001 Connect Diagram Example Agilent Technologies E5500 Phase Noise Measurement System 7-85
Absolute Measurement Examples RF Synthesizer using EFC E5502B Option 001 Connect Diagram Example 7-86 Agilent Technologies E5500 Phase Noise Measurement System
Absolute Measurement Examples RF Synthesizer using EFC E5503A Option 001 Connect Diagram Example Agilent Technologies E5500 Phase Noise Measurement System 7-87
Absolute Measurement Examples RF Synthesizer using EFC E5503B Option 001 Connect Diagram Example 7-88 Agilent Technologies E5500 Phase Noise Measurement System
Absolute Measurement Examples RF Synthesizer using EFC E5504A Option 201 Connect Diagram Example Agilent Technologies E5500 Phase Noise Measurement System 7-89
Absolute Measurement Examples RF Synthesizer using EFC E5504B Option 201 Connect Diagram Example 7-90 Agilent Technologies E5500 Phase Noise Measurement System
Absolute Measurement Examples RF Synthesizer using EFC Checking the Beatnote While the connect diagram is still displayed, recommend that you use an oscilloscope (connected to the Monitor port on the Agilent/HP 70420A) or a counter to check the beatnote being created between the reference source and your device-under-test.
Absolute Measurement Examples RF Synthesizer using EFC Figure 7-18 Oscilloscope Display of a Beatnote out of the Agilent/HP 70420A Monitor Port 7-92 Agilent Technologies E5500 Phase Noise Measurement System
Absolute Measurement Examples RF Synthesizer using EFC Making the Measurement 1. Click the Continue button when you have completed the beatnote check and are ready to make the measurement. 2. When the PLL Suppression Curve dialog box appears, select View Measured Loop Suppression, View Smoothed Loop Suppression, and View Adjusted Loop Suppression.
Absolute Measurement Examples RF Synthesizer using EFC Figure 7-5 on page 7-21 shows a typical phase noise curve for a RF synthesizer using EFC. Figure 7-19 Typical Phase Noise Curve for an RF Synthesizer using EFC.
Absolute Measurement Examples RF Synthesizer using EFC Table 7-16 Parameter Data for the RF Synthesizer (EFC) Measurement Step Parameters 1 Type and Range Tab 2 Data Measurement Type • Absolute Phase Noise (using a phase locked loop) • Start Frequency • 10 Hz • Stop Frequency • 4 E + 6 Hz • Minimum Number of Averages • 4 FFT Quality • Fast Sources Tab Carrier Source • Frequency • 500 E + 6 Hz • Power • 10 dBm • Carrier Source Output is connected to: • Test Set Detector Input • 500
Absolute Measurement Examples RF Synthesizer using EFC Table 7-16 Parameter Data for the RF Synthesizer (EFC) Measurement Step Parameters Data 5 Test Set Tab Input Attenuation • 0 dB LNA Low Pass Filter • 20 MHz (Auto checked) • LNA Gain • Auto Gain (Minimum Auto Gain - 14 dB) • DC Block • Not checked • PLL Integrator Attenuation • 0 dBm 6 Downconverter Tab • The downconverter parameters do not apply to this measurement example.
Absolute Measurement Examples Microwave Source Microwave Source This measurement example will help you measure the absolute phase noise of a microwave source (2.5 to 18 GHz) with frequency drift of ≤10E – 9 X Carrier Frequency over a period of thirty minutes.
Absolute Measurement Examples Microwave Source Defining the Measurement 1. From the File menu, choose Open. 2. If necessary, choose the drive or directory where the file you want is stored. 3. In the File Name box, choose “MicroSRC.pnm”. 4. Click the Open button. The appropriate measurement definition parameters for this example have been pre-stored in this file. Table 7-20 on page 7-114 lists the parameter data that has been entered for the Microwave Source measurement example.
Absolute Measurement Examples Microwave Source a. From the Define menu, choose Measurement; then choose the Sources tab from the Define Measurement window. b. Enter the carrier (center) frequency of your UUT (5 MHz to 1.6 GHz). Enter the same frequency for the detector input frequency. c. Enter the VCO Tuning Constant (see Table 7-18 on page 7-100). Use the following equation to calculate the appropriate VCO Tuning Constant to enter for the measurement.
Absolute Measurement Examples Microwave Source Table 7-18 Tuning Characteristics for Various Sources Carrier Freq.
Absolute Measurement Examples Microwave Source 3. When you have completed these operations, click the Close button. Selecting Loop Suppression Verification 1. From the Define menu, choose Measurement; then choose the Cal tab from the Define Measurement window. 2. In the Cal dialog box, check Verify calculated phase locked loop suppression and Always Show Suppression Graph. Select If limit is exceeded: Show Loop Suppression Graph. 3. When you have completed these operations, click the Close button.
Absolute Measurement Examples Microwave Source Figure 7-20 Noise Characteristics for the Microwave Measurement If the output amplitude of your UUT is not sufficient to provide an adequate measurement noise floor, it will be necessary to insert a low noise amplifier between the UUT and the Agilent/HP 70422A input. (Refer to “Inserting an Device” in Chapter 6, “Absolute Measurement Fundamentals” for details on determining the effect that the amplifier’s noise will have on the measured noise floor.
Absolute Measurement Examples Microwave Source Beginning the Measurement 1. From the Measurement menu, choose New Measurement. 2. When the Perform a New Calibration and Measurement dialog box appears, click OK. 3. When the Connect Diagram dialog box appears, click on the hardware down arrow and select your hardware configuration from the pull-down list. Confirm your connections as shown in the connect diagram. At this time connect your UUT and reference sources to the test set.
Absolute Measurement Examples Microwave Source Table 7-19 Agilent/HP 70420A Test Set Signal Input Limits and Characteristics • Internal AM Detector 0 to +20 dBm • Downconverters: Agilent/HP 70422A 0 to +30 dBm Agilent/HP 70427A +5 to +15 dBm CAUTION: To prevent damage to the Agilent/HP 70420A test set’s hardware components, the input signal must not be applied to the test set’s signal input connector until the input attenuator (Option 001) has been correctly set by the phase noise software, which wi
Absolute Measurement Examples Microwave Source ❍ NOTE “E5504B Option 201 Connect Diagram Example” on page 7-109 For additional examples, refer to Chapter 19, “Connect Diagrams” Agilent Technologies E5500 Phase Noise Measurement System 7-105
Absolute Measurement Examples Microwave Source E5503A Option 001 Connect Diagram Example 7-106 Agilent Technologies E5500 Phase Noise Measurement System
Absolute Measurement Examples Microwave Source E5503B Option 001 Connect Diagram Example Agilent Technologies E5500 Phase Noise Measurement System 7-107
Absolute Measurement Examples Microwave Source E5504A Option 201 Connect Diagram Example 7-108 Agilent Technologies E5500 Phase Noise Measurement System
Absolute Measurement Examples Microwave Source E5504B Option 201 Connect Diagram Example Agilent Technologies E5500 Phase Noise Measurement System 7-109
Absolute Measurement Examples Microwave Source Checking the Beatnote While the connect diagram is still displayed, recommend that you use an oscilloscope (connected to the Monitor port on the Agilent/HP 70420A) or a counter to check the beatnote being created between the reference source and your device-under-test.
Absolute Measurement Examples Microwave Source Figure 7-22 Oscilloscope Display of a Beatnote out of the Agilent/HP 70420A Monitor Port 1. Estimate the system’s capture range (using the VCO source parameters entered for this measurement). The estimated VCO tuning constant must be accurate within a factor of 2. A procedure for Estimating the Tuning Constant is located in this chapter.
Absolute Measurement Examples Microwave Source Making the Measurement 1. Click the Continue button when you have completed the beatnote check and are ready to make the measurement. 2. When the PLL Suppression Curve dialog box appears, select View Measured Loop Suppression, View Smoothed Loop Suppression, and View Adjusted Loop Suppression.
Absolute Measurement Examples Microwave Source Figure 7-5 on page 7-21 shows a typical phase noise curve for a microwave source. Figure 7-23 Typical Phase Noise Curve for an Microwave Source.
Absolute Measurement Examples Microwave Source Table 7-20 Parameter Data for the Microwave Source Measurement Step Parameters 1 Type and Range Tab 2 Data Measurement Type • Absolute Phase Noise (using a phase locked loop) • Start Frequency • 10 Hz • Stop Frequency • 4 E + 6 Hz • Minimum Number of Averages • 4 FFT Quality • Fast Sources Tab Carrier Source • Frequency • 12 E + 9 Hz • Power • 10 dBm • Carrier Source Output is connected to: • Test Set Detector Input • 600 E +6 Hz • Fr
Absolute Measurement Examples Microwave Source Table 7-20 Parameter Data for the Microwave Source Measurement Step Parameters 5 Test Set Tab 6 Data Input Attenuation • 0 dB LNA Low Pass Filter • 20 MHz (Auto checked) • LNA Gain • Auto Gain (Minimum Auto Gain - 14 dB) • DC Block • Not checked • PLL Integrator Attenuation • 0 dBm Downconverter Tab Input Frequency • 12 E + 9 L.O. Frequency • Auto I.F. Frequency • (Calculated by software) Millimeter Frequency • 0 L.O.
8 Residual Measurement Fundamentals What You’ll Find in This Chapter • • What is Residual Noise?, page 8-2 • • Calibrating the Measurement, page 8-6 • Basic Assumptions Regarding Residual Phase Noise Measurements, page 8-4 The Calibration Options, page 8-9 ❍ Measured +/- DC Peak Voltage, page 8-13 ❍ Measured Beatnote, page 8-16 ❍ Synthesized Residual Measurement using Beatnote Cal, page 8-19 ❍ Double-Sided Spur, page 8-21 ❍ Single-Sided Spur, page 8-24 Measurement Difficulties, page 8-28
Residual Measurement Fundamentals What is Residual Noise? What is Residual Noise? Residual or two-port noise is the noise added to a signal when the signal is processed by a two-port device. Such devices include: amplifiers, dividers, filters, mixers, multipliers, phase-locked loop synthesizers or any other two-port electronic networks. Residual noise is composed of both AM and FM components.
Residual Measurement Fundamentals What is Residual Noise? Figure 8-2 Multiplicative Noise Components Agilent Technologies E5500 Phase Noise Measurement System 8-3
Residual Measurement Fundamentals Basic Assumptions Regarding Residual Phase Noise Measurements Basic Assumptions Regarding Residual Phase Noise Measurements The following are some basic assumptions regarding Residual Phase Noise measurements. If these assumptions are not valid they will affect the measured results. • • • The source noise in each of the two phase detector paths is correlated at the phase detector for the frequency offset range of interest.
Residual Measurement Fundamentals Basic Assumptions Regarding Residual Phase Noise Measurements If the UUT’s are identical, a possible (but not recommended) assumption is that the noise of each UUT is half the measured result, or 3 dB less. All that really can be concluded is that the noise level of one of the UUT’s is at least 3 dB lower than the measured result at any particular offset frequency.
Residual Measurement Fundamentals Calibrating the Measurement Calibrating the Measurement In the Agilent E5500 Phase Noise Measurement System, residual phase noise measurements are made by selecting Residual Phase Noise (without using a phase locked loop). There are five calibration methods available for use when making residual phase noise measurements.
Residual Measurement Fundamentals Calibrating the Measurement The attenuation of the source noise is a function of the carrier offset frequency, and the delay time (τ ) and is equal to: b. The source should also have a good broadband phase noise floor because at sufficiently large carrier offsets it will tend to decorrelate 1 when measuring components with large delays. At f = --- , source τ noise is rejected completely. the first null in noise can be used to 1 determine the delay difference.
Residual Measurement Fundamentals Calibrating the Measurement 4. When making an extremely sensitive measurement it is essential to use semi-rigid cable between the components. The bending of a flexible cable from vibrations and temperature variations in the room can cause enough phase noise in flexible connecting cables to destroy the accuracy of a sensitive measurement. The connectors also must be tight; a torque wrench is the best tool. 5.
Residual Measurement Fundamentals The Calibration Options The Calibration Options There are five calibration methods that to choose from for calibrating a two-port measurement. The procedure for each method is provided on the following pages. The advantages and disadvantages of each method are also provided to help you select the best method for your application.
Residual Measurement Fundamentals The Calibration Options Procedure 1. Connect circuit as per Figure 8-6, and tighten all connections. Figure 8-6 Measuring Power at Phase Detector Signal Input Port 2. Measure the power level that will be applied to the signal input of the Agilent/HP 70420A’s Phase Detector. The following chart shows the acceptable amplitude ranges for the Agilent/HP 70420A Phase Detectors. Table 8-1 Acceptable Amplitude Ranges for the Phase Detectors Phase Detector 1.2 to 26.
Residual Measurement Fundamentals The Calibration Options Figure 8-7 Phase Detector Sensitivity 4. Remove the power meter and reconnect the cable from the splitter to the Signal Input port. 5. If you are not certain that the power level at the Reference Input port is within the range shown in the preceding graph, measure the level using the setup shown in Figure 8-8 on page 8-12. 6. Remove the power meter and reconnect the cable from the splitter to the Signal Input port. 7.
Residual Measurement Fundamentals The Calibration Options NOTE For the system to accept the adjustment to quadrature, the meter must be within ±2 mV to ±4 mV. 8. Once you have attained quadrature, you are ready to proceed with the measurement.
Residual Measurement Fundamentals The Calibration Options Measured +/- DC Peak Voltage Advantages: • • • • • Easy method for calibrating the measurement system. This calibration technique can be performed using the baseband analyzer. Fastest method of calibration. If, for example, the same power levels are always at the phase detector, as in the case of leveled, or limited outputs, the phase detector sensitivity will always be essentially equivalent (within one or two dB).
Residual Measurement Fundamentals The Calibration Options Table 8-2 Acceptable Amplitude Ranges for the Phase Detectors Phase Detector 1.2 to 26.5 GHz1 50 kHz to 1.6 GHz Ref Input (L Port) + 15 dBm + to 23 dBm Signal Input (R Port) 0 dBm to + 23 dBm Ref Input (L Port) + 7 dBm + to 10 dBm Signal Input (R Port) 0 dBm to + 5 dBm 1. Agilent/HP 70420A Phase Noise Test Set Options 001 and 201 Figure 8-9 Connection to Optional Oscilloscope for Determining Voltage Peaks 3.
Residual Measurement Fundamentals The Calibration Options 5. The system software will then calculate the phase detector constant automatically using the following algorithm: 6. The system software will then prompt you to set the phase noise software’s meter to quadrature. 7. The system will now measure the noise data.
Residual Measurement Fundamentals The Calibration Options Measured Beatnote This calibration option requires that one of the input frequency sources be tunable such that a beatnote can be acquired from the two sources. For the system to calibrate, the beatnote frequency must be within the following ranges.
Residual Measurement Fundamentals The Calibration Options Procedure 1. Connect circuit as per Figure 8-10 on page 8-17, and tighten all connections. Figure 8-10 Measuring Power from Splitter 2. Measure the power level that will be applied to the Signal Input port of the Agilent/HP 70420A’s Phase Detector. The following chart shows the acceptable amplitude ranges for the Agilent/HP 70420A Phase Detectors. Table 8-4 Acceptable Amplitude Ranges for the Phase Detectors Phase Detector 1.2 to 26.
Residual Measurement Fundamentals The Calibration Options 8. Adjust the phase difference at the phase detector to 90 degrees (quadrature) either by adjusting the test frequency or by adjusting an optional variable phase shifter or line stretcher. Quadrature is achieved when the meter on the front panel of the phase noise interface is set to zero. NOTE For the system to accept the adjustment to quadrature, the meter must be within ±2 mV to ±4 mV. 9. Reset quadrature and measure phase noise data.
Residual Measurement Fundamentals The Calibration Options Synthesized Residual Measurement using Beatnote Cal This calibration option requires two synthesizers of which one must be tunable such that a beatnote can be acquired. For the system to calibrate, the beatnote frequency must be within the following ranges.
Residual Measurement Fundamentals The Calibration Options 3. After the phase noise system reads the beatnote, set the software to the same carrier frequency. 4. Adjust the phase difference at the phase detector to 90 degrees (quadrature) either by adjusting the synthesizer or by adjusting an optional variable phase shifter or line stretcher. Quadrature is achieved when the meter on the front panel of the phase noise interface is set to zero.
Residual Measurement Fundamentals The Calibration Options Double-Sided Spur This calibration option has the following requirements: • • • One of the input frequency sources must be capable of being phase modulated. The resultant sideband spurs from the phase modulation must have amplitudes that are –100 dB and –20 dB relative to the carrier amplitude. The offset frequency or modulation frequency must be between 10 Hz and maximum (See the “Measured Beatnote” technique on page 8-16).
Residual Measurement Fundamentals The Calibration Options Procedure 1. Connect circuit as per Figure 8-13 on page 8-22, and tighten all connections. Figure 8-13 Calibration Setup 2. Measure the power level that will be applied to the Signal Input port of the Agilent/HP 70420A’s Phase Detector. The following chart shows the acceptable amplitude ranges for the Agilent/HP 70420A Phase Detectors. Table 8-6 Acceptable Amplitude Ranges for the Phase Detectors Phase Detector 1.2 to 26.5 GHz1 50 kHz to 1.
Residual Measurement Fundamentals The Calibration Options Figure 8-14 Measuring Carrier-to-sideband Ratio of the Modulated Port 4. Measure the carrier-to-sideband ratio of the non-modulated side of the phase detector. It must be at least 20 dB less than the modulation level of the modulated port. This level is necessary to prevent cancellation of the modulation in the phase detector.
Residual Measurement Fundamentals The Calibration Options 10. Check quadrature and measure the phase detector constant by pressing Y to proceed. 11. Remove audio source. 12. Reset quadrature and measure phase noise data. Single-Sided Spur This calibration option has the following requirements: • • • A third source to generate a single sided spur. An external power combiner (or directional coupler) to add the calibration spur to the frequency carrier under test.
Residual Measurement Fundamentals The Calibration Options Procedure 1. Connect circuit as per Figure 8-15 on page 8-25, and tighten all connections. Note that the input signal into the directional coupler is being supplied to the coupler’s output port. Figure 8-15 Calibration Setup 2. Measure the power level that will be applied to the Signal Input port of the Agilent/HP 70420A’s Phase Detector. The following chart shows the acceptable amplitude ranges for the Agilent/HP 70420A Phase Detectors.
Residual Measurement Fundamentals The Calibration Options 3. Measure the carrier-to-single-sided-spur ratio out of the coupler at the phase detector’s modulated port and the offset frequency with the RF spectrum analyzer. The RF calibration source should be adjusted such that the sidebands are between –30 and –60 dB below the carrier and the frequency offset of the spur between 10 Hz and 50 MHz. Figure 8-16 Carrier-to-spur Ratio of Modulated Signal 4.
Residual Measurement Fundamentals The Calibration Options Figure 8-17 Carrier-to-spur Ratio of Non-modulated Signal 5. Connect the phase detector. 6. Adjust the phase difference at the phase detector to 90 degrees (quadrature) either by adjusting the test frequency or by adjusting an optional variable phase shifter or line stretcher. Quadrature is achieved when the meter on the front panel of the Agilent/HP 70420A is set to center scale.
Residual Measurement Fundamentals Measurement Difficulties Measurement Difficulties Chapter 6, Evaluating Results, contains troubleshooting information to be used after the measurement has been made, and a plot has been obtained. NOTE When making phase noise measurements it is important to keep your equipment connected until the measurements have been made, all problems corrected, and the results have been evaluated to make sure that the measurement is valid.
9 Residual Measurement Examples What You’ll Find in This Chapter • CAUTION Amplifier Measurement Example, page 9-2 (res_noise_1ghz_demoamp.pnm) To prevent damage to the Agilent/HP 70420A test set’s hardware components, the input signal must not be applied to the signal input connector until the input attenuator has been correctly set for the desired configuration, as show in Table 9-2 on page 9-8. Apply the input signal when the Connection Diagram appears.
Residual Measurement Examples Amplifier Measurement Example Amplifier Measurement Example This example contains information about measuring the residual noise of two port devices This example demostrates a residual phase noise measurement for an RF Amplifier. Refer to Chapter 8, “Residual Measurement Fundamentals” for more information about residual phase noise measurements.
Residual Measurement Examples Amplifier Measurement Example The setup for a residual phase noise measurement uses a phase shifter to set quadrature at the phase detector. Defining the Measurement 1. From the File menu, choose Open. 2. If necessary, choose the drive or directory where the file you want is stored. 3. In the File Name box, choose “res_noise_1ghz_demoamp.pnm”.
Residual Measurement Examples Amplifier Measurement Example 4. Click the Open button. The appropriate measurement definition parameters for this example have been pre-stored in this file. Table 9-4 on page 9-14 lists the parameter data that has been entered for this residual phase noise measurement example.) 5. From the Define menu, choose Measurement; then choose the Type and Range tab from the Define Measurement window. a.
Residual Measurement Examples Amplifier Measurement Example 6. Choose the Sources tab from the Define Measurement window. a. Enter the carrier (center) frequency of your UUT. Enter the same frequency for the detector input frequency. 7. Choose the Cal tab from the Define Measurement window. b. Select Derive detector constant from measured +/- DC peak voltage as the calibration method.
Residual Measurement Examples Amplifier Measurement Example 8. Choose the Block Diagram tab from the Define Measurement window. a. From the Phase Shifter pull-down, select Manual. b. From the Phase Detector pull-down, select Automatic Detector Selection. 9. Choose the Graph tab from the Define Measurement window. a. Enter a graph description of your choice (E5500 Residual Phase Noise Measurement @ 1 GHz, for example). 10. When you have completed these operations, click the Close button.
Residual Measurement Examples Amplifier Measurement Example Setup Considerations Connecting Cables The best results will be obtained if semi-rigid coaxial cables are used to connect the components used in the measurement; however, BNC cables have been specified because they are more widely available. Using BNC cables may degrade the close-in phase noise results and, while adequate for this example, should not be used for an actual measurement on an unknown device unless absolutely necessary.
Residual Measurement Examples Amplifier Measurement Example 2. From the Measurement menu, choose New Measurement. 3. When the Perform a New Calibration and Measurement dialog box appears, click OK. 4. When the Connect Diagram dialog box appears, click on the hardware down arrow and select your hardware configuration from the pull-down list. Confirm your connections as shown in the connect diagram. At this time connect your UUT and reference sources to the test set.
Residual Measurement Examples Amplifier Measurement Example Table 9-2 Agilent/HP 70420A Test Set Signal Input Limits and Characteristics • Microwave Phase Detectors 0 to +5 dBm (Signal Input) +7 to +10 dBm (Reference Input) CAUTION: To prevent damage to the Agilent/HP 70420A Test Set’s hardware components, the input signal must not be applied to the test set’s signal input connector until the input attenuator (Option 001) has been correctly set by the phase noise software, which will occur at the connec
Residual Measurement Examples Amplifier Measurement Example Residual Connect Diagram Example Making the Measurement Calibrate the Measurement using Measured +/- DC Peak Voltage Refer to Chapter 8, “Residual Measurement Fundamentals” for more information about residual phase noise measurements calibration types. Procedure 1. Connect circuit as per Figure 9-2 on page 9-11, and tighten all connections. 2.
Residual Measurement Examples Amplifier Measurement Example Table 9-3 Acceptable Amplitude Ranges for the Phase Detectors Phase Detector 1.2 to 26.5 GHz1 50 kHz to 1.6 GHz Ref Input (L Port) + 15 dBm + to 23 dBm Signal Input (R Port) 0 dBm to + 23 dBm Ref Input (L Port) + 7 dBm + to 10 dBm Signal Input (R Port) 0 dBm to + 5 dBm 1.
Residual Measurement Examples Amplifier Measurement Example NOTE Connecting an oscilloscope to the monitor port is recommended because the signal can then be viewed to give visual confidence in the signal being measured. 1. press the Continue key when ready to calibrate the measurement. 2. Adjust the phase difference at the phase detector as prompted by the phase noise software. 3. The system will measure the positive and negative peak voltage of the phase detector using an internal voltmeter.
Residual Measurement Examples Amplifier Measurement Example 4. The system software will then prompt you to set the phase noise software’s meter to quadrature by adjusting the phase shifter until the meter indicates 0 volts, then press Continue. 5. The system will now measure the noise data. The system can now run the measurement.
Residual Measurement Examples Amplifier Measurement Example Figure 9-3 Typical Phase Noise Curve for a Residual Measurement.
Residual Measurement Examples Amplifier Measurement Example Table 9-4 Parameter Data for the Amplifier Measurement Example Step Parameters 4 Block Diagram Tab 5 Data • Carrier Source • Manual • Phase Shifter • Manual • DUT in Path • checked • Phase Detector • Automatic Detector Selection • Adjust the Quadrature by adjusting the • phase shifter Test Set Tab Input Attenuation • 0 dB LNA Low Pass Filter • 20 MHz (Auto checked) • LNA Gain • Auto Gain (Minimum Auto Gain - 14 dB) • DC Blo
10 FM Discriminator Fundamentals What You’ll Find in This Chapter • The Frequency Discriminator Method, page 10-2 ❍ Basic Theory, page 10-2 ❍ The Discriminator Transfer Response, page 10-3 ▲ ▲ System Sensitivity, page 10-3 Optimum Sensitivity, page 10-5 Agilent Technologies E5500 Phase Noise Measurement System 10-1
FM Discriminator Fundamentals The Frequency Discriminator Method The Frequency Discriminator Method Unlike the phase detector method, the frequency discriminator method does not require a second reference source phase locked to the source under test (Figure 10-1). Figure 10-1 Basic delay line/mixer frequency discriminator method. This makes the frequency discriminator method extremely useful for measuring sources that are difficult to phase lock, including sources that are microphonic or drift quickly.
FM Discriminator Fundamentals The Frequency Discriminator Method The double-balanced mixer, acting as a phase detector, transforms the instantaneous phase fluctuations into voltage fluctuations ( ∆φ → ∆V ). With the two input signals 90° out of phase (phase quadrature), the voltage out is proportional to the input phase fluctuations. The voltage fluctuations can then be measured by the baseband analyzer and converted to phase noise units.
FM Discriminator Fundamentals The Frequency Discriminator Method Figure 10-2 Nulls in sensitivity of delay line discriminator. To avoid having to compensate for sin (x)/x response, measurements are typically made at offset frequencies ( f m ) much less 1 ⁄ 2τd . It is possible to measure at offset frequencies out to and beyond the null by scaling the measured results using the transfer equation. However, the sensitivity of the system get very poor results near the nulls.
FM Discriminator Fundamentals The Frequency Discriminator Method Optimum Sensitivity If measurements are made such that the offset frequency of interest ( f m ) is <1/2 πτ d the sin(x)/x term can be ignored and the transfer response can be reduced to ∆V ( f m ) = K d ∆f ( f m ) = K φ πτ d ∆f ( f m ) where K d is the discriminator constant.
FM Discriminator Fundamentals The Frequency Discriminator Method The following example illustrates how to choose a delay line that provided the optimum sensitivity given certain system parameters. Table 10-1 Choosing a Delay Line Parameters Source signal level +7dBm Mixer compression point +3 dBm Delay line attenuation at source carrier frequency 30 dB per 100 ns of Delay Highest offset frequency of interest 5 MHz 1.
11 FM Discriminator Measurement Examples What You’ll Find in This Chapter CAUTION • FM Discriminator Measurement using Double-Sided Spur Calibration, page 11-3 • Discriminator Measurement using FM Rate and Deviation Calibration, page 11-18.
FM Discriminator Measurement Examples Introduction Introduction These two measurement examples demostrates the FM Discriminator measurement technique for measuring the phase noise of a signal source using two different calibration methods. These measurement techniques work well for measuring free-running oscillators that drift over a range that exceeds the tuning range limits of the phase-locked-loop measurement technique.
FM Discriminator Measurement Examples FM Discriminator Measurement using Double-Sided Spur Calibration FM Discriminator Measurement using Double-Sided Spur Calibration CAUTION To prevent damage to the Agilent/HP 70420A test set’s hardware components, the input signal must not be applied to the signal input connector until the input attenuator (Agilent/HP 70420A Option 001) has been correctly set for the desired configuration, as show in Table 11-2 on page 11-11.
FM Discriminator Measurement Examples FM Discriminator Measurement using Double-Sided Spur Calibration Determining the Discriminator (Delay Line) Length Perform the following steps to determine the minimum delay line length (τ) Possible to provide an adequate noise to measure the source. 1. Determine the delay necessary to provide a discriminator noise floor that is below the expected noise level of the DUT. Figure 11-1 shows the noise floor of the discriminator for given delay times (τ). 2.
FM Discriminator Measurement Examples FM Discriminator Measurement using Double-Sided Spur Calibration Defining the Measurement 1. From the File menu, choose Open. 2. If necessary, choose the drive or directory where the file you want is stored. 3. In the File Name box, choose “vco_dss.pnm”. 4. Click the Open button. The appropriate measurement definition parameters for this example have been pre-stored in this file.
FM Discriminator Measurement Examples FM Discriminator Measurement using Double-Sided Spur Calibration 5. From the Define menu, choose Measurement; then choose the Type and Range tab from the Define Measurement window. a. From the Measurement Type pull-down, select Absolute Phase Noise (using an FM discriminator).
FM Discriminator Measurement Examples FM Discriminator Measurement using Double-Sided Spur Calibration 6. Choose the Sources tab from the Define Measurement window. a. Enter the carrier (center) frequency of your UUT (5 MHz to 1.6 GHz). Enter the same frequency for the detector input frequency. 7. Choose the Cal tab from the Define Measurement window. b. Select Derive constant from double-sided spur as the calibration method.
FM Discriminator Measurement Examples FM Discriminator Measurement using Double-Sided Spur Calibration c. Set the Know Spur Parameters Offset Frequency and Amplitude for the spur you plan to use for calibration purposes.This calibration method requires that you enter the offset and amplitude for a known spur. 8. Choose the Block Diagram tab from the Define Measurement window. a. From the Reference Source pull-down, select Manual. b. From the Phase Detector pull-down, select Automatic Detector Selection.
FM Discriminator Measurement Examples FM Discriminator Measurement using Double-Sided Spur Calibration 9. Choose the Graph tab from the Define Measurement window. a. Enter a graph description of your choice. 10. When you have completed these operations, click the Close button.
FM Discriminator Measurement Examples FM Discriminator Measurement using Double-Sided Spur Calibration Beginning the Measurement 1. From the View menu, choose Meter to select the quadrature meter. 2. From the Measurement menu, choose New Measurement. 3. When the Perform a New Calibration and Measurement dialog box appears, click OK.
FM Discriminator Measurement Examples FM Discriminator Measurement using Double-Sided Spur Calibration 4. When the Connect Diagram dialog box appears, confirm your connections as shown in the connect diagram. The Agilent/HP 70420A test set’s signal input is subject to the following limits and characteristics: Table 11-2 Agilent/HP 70420A Test Set Signal Input Limits and Characteristics Limits Frequency 50 kHz to 1.6 GHz (Std) 50 kHz to 26.5 GHz (Option 001) 50 kHz to 26.
FM Discriminator Measurement Examples FM Discriminator Measurement using Double-Sided Spur Calibration Figure 11-2 Setup diagram for the FM Discrimination Measurement Example. 5.
FM Discriminator Measurement Examples FM Discriminator Measurement using Double-Sided Spur Calibration Making the Measurement 1. press the Continue key when you are ready to make the measurement. Calibrating the Measurement The calibration procedure determines the discriminator constant to use in the transfer response by measuring the system response to a known FM signal. NOTE Note that the system must be operating in quadrature during calibration. 2.
FM Discriminator Measurement Examples FM Discriminator Measurement using Double-Sided Spur Calibration 3. Next, apply modulation to the carrier signal, then press Continue. Remove the modulation from the carrier and connect your DUT. 4. The system can now run the measurement. at the appropriate point, re-establish quadrature and continue the measurement.
FM Discriminator Measurement Examples FM Discriminator Measurement using Double-Sided Spur Calibration The segment data will be displayed on the computer screen as the data is taken until all segments have been taken over the entire range you specified in the Measurement definition’s Type and Range. When the Measurement is Complete When the measurement is complete, refer to Chapter 15, “Evaluating Your Measurement Results” for help in evaluating your measurement results.
FM Discriminator Measurement Examples FM Discriminator Measurement using Double-Sided Spur Calibration Table 11-3 Parameter Data for the Double-Sided Spur Calibration Example Step Parameters 1 Type and Range Tab 2 Data Measurement Type • Absolute Phase Noise (using an FM Discriminator) • Start Frequency • 10 Hz • Stop Frequency • 100 E + 6 Hz • Minimum Number of Averages • 4 FFT Quality • Normal Swept Quality • Fast Sources Tab Carrier Source • Frequency • 1.
FM Discriminator Measurement Examples FM Discriminator Measurement using Double-Sided Spur Calibration Step Parameters Data 5 Test Set Tab • The test set parameters do not apply to this measurement example. 6 Dowconverter Tab • The downconverter parameters do not apply to this measurement example. 7 Graph Tab • Title • FM Discrim - 50 ns dly - 1.
FM Discriminator Measurement Examples Discriminator Measurement using FM Rate and Deviation Calibration Discriminator Measurement using FM Rate and Deviation Calibration CAUTION To prevent damage to the Agilent/HP 70420A test set’s hardware components, the input signal must not be applied to the signal input connector until the input attenuator (Agilent/HP 70420A Option 001) has been correctly set for the desired configuration, as show in Table 11-2 on page 11-11.
FM Discriminator Measurement Examples Discriminator Measurement using FM Rate and Deviation Calibration Determining the Discriminator (Delay Line) Length Perform the following steps to determine the minimum delay line length (τ) Possible to provide an adequate noise to measure the source. 1. Determine the delay necessary to provide a discriminator noise floor that is below the expected noise level of the DUT. Figure 11-1 shows the noise floor of the discriminator for given delay times (τ). 2.
FM Discriminator Measurement Examples Discriminator Measurement using FM Rate and Deviation Calibration Defining the Measurement 1. From the File menu, choose Open. 2. If necessary, choose the drive or directory where the file you want is stored. 3. In the File Name box, choose “vco_r&d.pnm”. 4. Click the Open button. The appropriate measurement definition parameters for this example have been pre-stored in this file.
FM Discriminator Measurement Examples Discriminator Measurement using FM Rate and Deviation Calibration 5. From the Define menu, choose Measurement; then choose the Type and Range tab from the Define Measurement window. a. From the Measurement Type pull-down, select Absolute Phase Noise (using an FM discriminator).
FM Discriminator Measurement Examples Discriminator Measurement using FM Rate and Deviation Calibration 6. Choose the Sources tab from the Define Measurement window. a. Enter the carrier (center) frequency of your UUT (5 MHz to 1.6 GHz). Enter the same frequency for the detector input frequency. 7. Choose the Cal tab from the Define Measurement window. b. Select Derive constant from FM rate and deviation as the calibration method.
FM Discriminator Measurement Examples Discriminator Measurement using FM Rate and Deviation Calibration c. Set the FM Rate to 20 kHz and FM Deviation to 10 kHz. 8. Choose the Block Diagram tab from the Define Measurement window. a. From the Reference Source pull-down, select Manual. b. From the Phase Detector pull-down, select Automatic Detector Selection.
FM Discriminator Measurement Examples Discriminator Measurement using FM Rate and Deviation Calibration 9. Choose the Graph tab from the Define Measurement window. a. Enter a graph description of your choice. 10. When you have completed these operations, click the Close button.
FM Discriminator Measurement Examples Discriminator Measurement using FM Rate and Deviation Calibration Beginning the Measurement 1. From the View menu, choose Meter to select the quadrature meter. 2. From the Measurement menu, choose New Measurement. 3. When the Perform a New Calibration and Measurement dialog box appears, click OK. 4. When the Connect Diagram dialog box appears, confirm your connections as shown in the connect kiagram.
FM Discriminator Measurement Examples Discriminator Measurement using FM Rate and Deviation Calibration Table 11-5 Agilent/HP 70420A Test Set Signal Input Limits and Characteristics Limits Frequency 50 kHz to 1.6 GHz (Std) 50 kHz to 26.5 GHz (Option 001) 50 kHz to 26.
FM Discriminator Measurement Examples Discriminator Measurement using FM Rate and Deviation Calibration Figure 11-5 Setup diagram for the FM Discrimination Measurement Example. 5.
FM Discriminator Measurement Examples Discriminator Measurement using FM Rate and Deviation Calibration Making the Measurement 1. press the Continue key when you are ready to make the measurement. Calibrating the Measurement The calibration procedure determines the discriminator constant to use in the transfer response by measuring the system response to a known FM signal. NOTE Note that the system must be operating in quadrature during calibration. 2.
FM Discriminator Measurement Examples Discriminator Measurement using FM Rate and Deviation Calibration 3. Next, apply modulation to the carrier signal, then press Continue. Remove the modulation from the carrier and connect your DUT. 4. The system can now run the measurement. at the appropriate point, re-establish quadrature and continue the measurement.
FM Discriminator Measurement Examples Discriminator Measurement using FM Rate and Deviation Calibration The segment data will be displayed on the computer screen as the data is taken until all segments have been taken over the entire range you specified in the Measurement definition’s Type and Range. When the Measurement is Complete When the measurement is complete, refer to Chapter 15, “Evaluating Your Measurement Results” for help in evaluating your measurement results.
FM Discriminator Measurement Examples Discriminator Measurement using FM Rate and Deviation Calibration Table 11-6 Parameter Data for the Rate and Deviation Calibration Example Step Parameters 1 Type and Range Tab 2 Data Measurement Type • Absolute Phase Noise (using an FM Discriminator) • Start Frequency • 10 Hz • Stop Frequency • 100 E + 6 Hz • Minimum Number of Averages • 4 FFT Quality • Normal Swept Quality • Fast Sources Tab Carrier Source • Frequency • 1.
FM Discriminator Measurement Examples Discriminator Measurement using FM Rate and Deviation Calibration Step Parameters Data 5 Test Set Tab • The test set parameters do not apply to this measurement example. 6 Dowconverter Tab • The downconverter parameters do not apply to this measurement example. 7 Graph Tab • Title • FM Discrim - 50 ns dly - 1.
12 AM Noise Measurement Fundamentals What You’ll Find in This Chapter • • AM-Noise Measurement Theory of Operation, page 12-2 Amplitude Noise Measurement, page 12-3 ❍ • AM Detector, page 12-4 Measurement Methods ❍ Method 1: User Entry of Phase Detector Constant, page 12-8 ❍ Method 2: Double-Sided Spur, page 12-12 ❍ Method 3: Single-Sided-Spur, page 12-17 Agilent Technologies E5500 Phase Noise Measurement System 12-1
AM Noise Measurement Fundamentals AM-Noise Measurement Theory of Operation AM-Noise Measurement Theory of Operation Basic Noise Measurement The Agilent E5500A phase noise measurement software uses the following process to measure carrier noise by: • • • • Calibrating the noise detector sensitivity. Measuring the recovered baseband noise out of the detector. Calculating the noise around the signal by correcting the measured data by the detector sensitivity.
AM Noise Measurement Fundamentals Amplitude Noise Measurement Amplitude Noise Measurement The level of amplitude modulation sidebands is also constant with increasing modulation frequency. The AM detector gain can thus be measured at a single offset frequency and the same constant will apply at all offset frequencies.
AM Noise Measurement Fundamentals Amplitude Noise Measurement Figure 12-3 AM Noise System Block Diagram using an Agilent/HP 70429A Opt K21 Figure 12-4 AM Noise System Block Diagram using an Agilent/HP 70427A Downconverter Figure 12-5 AM Detector Schematic AM Detector AM Detector Specifications Detector type low barrier Schottky diode Carrier frequency range 10 MHz to 26.
AM Noise Measurement Fundamentals Amplitude Noise Measurement Minimum input power 0 dBm Output bandwidth 1 Hz to 40 MHz AM Detector Considerations • • • • The AM detector consists of an Agilent/HP 33330C Low-Barrier Schottky Diode Detector and an AM detector filter (Agilent/HP 70429A K21). The detector, for example, is an Agilent/HP 33330C Low-Barrier Schottky-Diode Detector. The Schottky detectors will handle more power than the point contact detectors, and are equally as sensitive and quiet.
AM Noise Measurement Fundamentals Calibration and Measurement General Guidelines Calibration and Measurement General Guidelines NOTE Read This The following general guidelines should be considered when setting up and making an AM-noise measurement. • NOTE The AM detector must be well shielded from external noise especially 60 Hz noise. The components between the diode detector and the test system should be packaged in a metal box to prevent RFI interference.
AM Noise Measurement Fundamentals Calibration and Measurement General Guidelines • The amplifier’s sensitivity to power supply noise and the supply noise itself must both be minimized.
AM Noise Measurement Fundamentals Method 1: User Entry of Phase Detector Constant Method 1: User Entry of Phase Detector Constant Method 1, example 1 Advantages • • • Easy method of calibrating the measurement system • Fastest method of calibration. If the same power levels are always at the AM detector, as in the case of leveled outputs, the AM detector sensitivity will always be essentially the same. • Super-quick method of estimating the equivalent phase detector constant.
AM Noise Measurement Fundamentals Method 1: User Entry of Phase Detector Constant Figure 12-7 AM Noise Calibration Setup 3. Locate the drive level on the AM sensitivity graph (figure 3-5), and enter the data. 4. Measure the noise data and interpret the results. The measured data will be plotted as single-sideband AM noise in dBc/Hz. NOTE The quadrature meter should be at zero volts due to the blocking capacitor at the AM detector’s output.
AM Noise Measurement Fundamentals Method 1: User Entry of Phase Detector Constant Method 1, Example 2 Advantages • • • • Easy method of calibrating the measurement system. • Measures the AM detector gain in the actual measurement configuration. Super-quick method of estimating the equivalent phase detector constant. Will measure DUT without modulation capability. Requires little additional equipment: only a voltmeter or an oscilloscope. Fastest method of calibration.
AM Noise Measurement Fundamentals Method 1: User Entry of Phase Detector Constant Figure 12-10 Modulation Sideband Calibration Setup 4. Measure noise data and interpret the results. NOTE The quadrature meter should be at zero volts due to the blocking capacitor at the AM detector’s output.
AM Noise Measurement Fundamentals Method 2: Double-Sided Spur Method 2: Double-Sided Spur Method 2, Example 1 Advantages • • Requires only one RF source (DUT) Calibration is done under actual measurement conditions so all non-linearities and harmonics of the AM detector are calibrated out. The double-sided spur method and the single-sided-spur method are the two most accurate methods for this reason. Disadvantages • Required that the DUT have adjustable AM which may also be turned off.
AM Noise Measurement Fundamentals Method 2: Double-Sided Spur NOTE The carrier-to-sideband ratio C ----sb for AM is: percentAM C---= 20 log ------------------------------ = 6dB 100 sb Figure 12-12 Measuring the Carrier-to-Sideband Ratio 4. Reconnect the AM detector and enter the carrier-to-sideband ratio and modulation frequency. Figure 12-13 Measuring the Calibration Constant 5. Measure the AM detector calibration constant. 6. Turn off AM. 7. Measure noise data and interpret the results.
AM Noise Measurement Fundamentals Method 2: Double-Sided Spur Method 2, Example 2 Advantages • • Will measure source without modulation capability Calibration is done under actual measurement conditions so all non-linearities and harmonics of the AM detector are calibrated out. The double-sided spur method and the single-sided-spur method are the two most accurate methods for this reason.
AM Noise Measurement Fundamentals Method 2: Double-Sided Spur 3. Using a source with AM, set its output power equal to the power measured in step 2. The source should be adjusted such that the sidebands are between –30 and –60 dB below the carrier with a modulation rate between 10 Hz and 20 MHz.
AM Noise Measurement Fundamentals Method 2: Double-Sided Spur NOTE The quadrature meter should be at zero volts due to the blocking capacitor at the AM detector’s output.
AM Noise Measurement Fundamentals Method 3: Single-Sided-Spur Method 3: Single-Sided-Spur Advantages • • Will measure source without modulation capability. Calibration is done under actual measurement conditions so all non-linearities and harmonics of the AM detector are calibrated out. The double-sided spur method and the single-sided-spur method are the two most accurate methods for this reason. Disadvantages • Requires 2 RF sources, which must be between 10 Hz and 40 MHz apart in frequency.
AM Noise Measurement Fundamentals Method 3: Single-Sided-Spur 3. Measure the carrier-to-single-sided-spur ratio and the spur offset at the input to the AM detector with an RF spectrum analyzer. The spur should be adjusted such that it is between –30 and –60 dBc, with a carrier offset of 10 Hz to 20 MHz. Figure 12-19 Measuring Relative Spur Level 4. Reconnect the AM detector and measure the detector sensitivity. Figure 12-20 Measuring Detector Sensitivity 5. Turn off the spur source output. 6.
13 AM Noise Measurement Examples What You’ll Find in This Chapter • CAUTION “AM Noise using an Agilent/HP 70420A Option 001” on page 13-2 (AM_noise_1ghz_8644b.pnm) To prevent damage to the Agilent/HP 70420A test set’s hardware components, the input signal must not be applied to the signal input connector until the input attenuator has been correctly set for the desired configuration, as show in Table 13-2 on page 13-7. Apply the input signal when the Connection Diagram appears.
AM Noise Measurement Examples AM Noise using an Agilent/HP 70420A Option 001 AM Noise using an Agilent/HP 70420A Option 001 This example demonstrates the AM noise measurement of an Agilent/HP 8662A Signal Generator using the AM detector in the Agilent/HP 70420A Option 001 Phase Noise test set. For more information about various calibration techniques, refer to Chapter 12, “AM Noise Measurement Fundamentals”. This measurement uses the double sided spur calibration method.
AM Noise Measurement Examples AM Noise using an Agilent/HP 70420A Option 001 Defining the Measurement 1. From the File menu, choose Open. 2. If necessary, choose the drive or directory where the file you want is stored. 3. In the File Name box, choose “AM_noise_1ghz_8644b.pnm”. 4. Choose the OK button. The appropriate measurement definition parameters for this example have been pre-stored in this file. (Table 13-3 on page 13-10 lists the parameter data that has been entered for this measurement example.
AM Noise Measurement Examples AM Noise using an Agilent/HP 70420A Option 001 NOTE The amplitude of a source under system control, for an AM noise measurement, will automatically be set to +10 dBm. If any other amplitude is desired, the source should be placed under manual control. All other measurements set the source to +16 dBm automatically. The appropriate measurement definition parameters for this example have been pre-stored in this file.
AM Noise Measurement Examples AM Noise using an Agilent/HP 70420A Option 001 6. Choose the Sources tab from the Define Measurement window. a. Enter the carrier (center) frequency of your UUT. Enter the same frequency for the detector input frequency. 7. Choose the Cal tab from the Define Measurement window. a. Select Use automatic internal self-calibration as the calibration method. For more information about various calibration techniques, refer to Chapter 12, “AM Noise Measurement Fundamentals”.
AM Noise Measurement Examples AM Noise using an Agilent/HP 70420A Option 001 8. Choose the Block Diagram tab from the Define Measurement window. a. From the Phase Detector pull-down, select AM Detector. 9. Choose the Graph tab from the Define Measurement window. a. Enter a graph description of your choice. 10. When you have completed these operations, click the Close button.
AM Noise Measurement Examples AM Noise using an Agilent/HP 70420A Option 001 Beginning the Measurement 1. From the Measurement menu, choose New Measurement. 2. When the Perform a New Calibration and Measurement dialog box appears, click OK. 3. When the Connect Diagram dialog box appears, click on the hardware down arrow and select your hardware configuration from the pull-down list. Confirm your connections as shown in the connect diagram.
AM Noise Measurement Examples AM Noise using an Agilent/HP 70420A Option 001 Table 13-2 Agilent/HP 70420A Test Set Signal Input Limits and Characteristics • Internal AM Detector 0 to +20 dBm • Downconverters: Agilent/HP 70422A +5 to +15 dBm Agilent/HP 70427A 0 to +30 dBm CAUTION: To prevent damage to the Agilent/HP 70420A test set’s hardware components, the input signal must not be applied to the test set’s signal input connector until the input attenuator (Option 001) has been correctly set by the
AM Noise Measurement Examples AM Noise using an Agilent/HP 70420A Option 001 Connect Diagram Example Making the Measurement 1. press the Continue key when you are ready to make the measurement. For more information about various calibration techniques, refer to Chapter 12, “AM Noise Measurement Fundamentals”. The system is now ready to make the measurement. The measurement results will be updated on the computer screen after each frequency segment has been measured.
AM Noise Measurement Examples AM Noise using an Agilent/HP 70420A Option 001 Figure 13-2 Table 13-3 Typical AM Noise Curve.
AM Noise Measurement Examples AM Noise using an Agilent/HP 70420A Option 001 Table 13-3 Parameter Data for the AM Noise using an Agilent/HP 70420A Option 001 Step Parameters 4 Block Diagram Tab 5 Data • Source • Manual • AM Detector • TestSet AM Detector • Down Converter • None Test Set Tab • Input Attenuation • Auto checked • LNA Low Pass Filter • Auto checked • LNA Gain • Auto Gain • Detector Maximum Input Levels • 0 dBm Microwave Phase Detector • 0 dBm RF Phase Detector • 0 dBm
14 Baseband Noise Measurement Examples What You’ll Find in This Chapter • • Baseband Noise using a Test Set Measurement Example, page 14-2 Baseband Noise without using a Test Set Measurement Example, page 14-6 Agilent Technologies E5500 Phase Noise Measurement System 14-1
Baseband Noise Measurement Examples Baseband Noise using a Test Set Measurement Example Baseband Noise using a Test Set Measurement Example This measurement example will help you measure the noise voltage of a source. NOTE To ensure accurate measurements, you should allow the UUT and measurement equipment to warm up at least one hour before making the noise measurement. Defining the Measurement 1. From the File menu, choose Open. 2.
Baseband Noise Measurement Examples Baseband Noise using a Test Set Measurement Example 4. Choose the OK button. The appropriate measurement definition parameters for this example have been pre-stored in this file. (Table on page 14-4) lists the parameter data that has been entered for this measurement example.) a Test Set Measurement Beginning the Measurement 1. From the Measurement menu, choose New Measurement. 2. When the Perform a New Calibration and Measurement dialog box appears, click OK. 3.
Baseband Noise Measurement Examples Baseband Noise using a Test Set Measurement Example Making the Measurement 1. press the Continue key. Figure 14-2 on page 14-4 shows a typical phase noise curve for a baseband noise measurement using a test set. Figure 14-2 Typical Phase Noise Curve for a Baseband using a Test Set Measurement.
Baseband Noise Measurement Examples Baseband Noise using a Test Set Measurement Example Ste p Parameters Data 3 Block Diagram Tab • Noise Source 4 5 • Test Set Noise Input Test Set Tab Input Attenuation • 0 dB LNA Low Pass Filter • 20 MHz (Auto checked) • LNA Gain • Auto Gain (Minimum Auto Gain - 14 dB) • DC Block • Not checked • PLL Integrator Attenuation • 0 dBm Graph Tab • Title • Baseband using the Agilent/HP 70420A Test Set • Graph Type • Baseband Noise (dBV) • X Scale Minimum •
Baseband Noise Measurement Examples Baseband Noise without using a Test Set Measurement Example Baseband Noise without using a Test Set Measurement Example This measurement example will help you measure the noise voltage of a source. NOTE To ensure accurate measurements, you should allow the UUT and measurement equipment to warm up at least one hour before making the noise measurement. Defining the Measurement 1. From the File menu, choose Open. 2.
Baseband Noise Measurement Examples Baseband Noise without using a Test Set Measurement Example 4. Choose the OK button. The appropriate measurement definition parameters for this example have been pre-stored in this file. (Table on page 14-4) lists the parameter data that has been entered for this measurement example.) a Test Set Measurement Beginning the Measurement 1. From the Measurement menu, choose New Measurement. 2. When the Perform a New Calibration and Measurement dialog box appears, click OK.
Baseband Noise Measurement Examples Baseband Noise without using a Test Set Measurement Example Figure 14-4 on page 14-8 shows a typical phase noise curve for a baseband noise measurement without using a test set. Figure 14-4 Typical Phase Noise Curve for a Baseband without using a Test Set Measurement.
Baseband Noise Measurement Examples Baseband Noise without using a Test Set Measurement Example Ste p Parameters 2 Cal Tab Data • Gain preceding noise input 3 Block Diagram Tab • Noise Source 5 • 0 dB • Test Set Noise Input Graph Tab • Title • Baseband Noise without using a Test Set • Graph Type • Baseband (dBV) • X Scale Minimum • 10 Hz • X Scale Maximum • 100 E + 6 Hz • Y Scale Minimum • 0 dBc/Hz • Y Scale Maximum • - 200 dBV/Hz • Normalize trace data to a: • 1 Hz bandwidth • Scal
15 Evaluating Your Measurement Results What You’ll Find in This Chapter This chapter contains information to help you evaluate and output the results of your noise measurements. To use the information in this chapter, you should have completed your noise measurement, and the computer should be displaying a graph of its measurement results. Storing the measurement results in the Result File is recommended for each measurement.
Evaluating Your Measurement Results Evaluating the Results Evaluating the Results This section contains information that will help you evaluate the results of your measurement. The purpose of the evaluation is to verify that the noise graph accurately represents the noise characteristics of your unit-under-test (UUT). At this point, you should have a graph showing the results of your measurement. The following steps provide an overview of the evaluation process.
Evaluating Your Measurement Results Evaluating the Results Comparing Against Expected Data If none of the problems shown appear on your graph, there still may be problems or uncertainties that are not obvious at first glance. These uncertainties can be evaluated by comparing your measurement results against the following data: • • • The noise characteristics expected for your unit-under-test. The noise floor and accuracy specifications of the phase noise test system.
Evaluating Your Measurement Results Evaluating the Results For example, applying the 7 dB difference in noise levels, shown in “Example Comparison of Measurement Results and Reference Source Noise.” on page 15-4 at 10 kHz, to the graph, reveals that the measured results should be decreased by about 1 dB at 10 kHz to reflect the actual noise of the UUT. Figure 15-2 Example Comparison of Measurement Results and Reference Source Noise.
Evaluating Your Measurement Results Evaluating the Results Figure 15-3 Graph Showing How Much to Decrease Measured Noise to Compensate for Added Reference Source Noise.
Evaluating Your Measurement Results Gathering More Data Gathering More Data Repeating the Measurement Making phase noise measurements is often an iterative process. The information derived from the first measurement will sometimes indicate that changes to the measurement setup are necessary for measuring a particular device.
Evaluating Your Measurement Results Outputting the Results Outputting the Results This section describes the software’s capabilities for generating a printed hardcopy of your test results. You must have a printer must be connected to the computer to generate hard copies. Using a Printer To print the phase noise graph, along with parameter summary data: On the File menu, click Print.
Evaluating Your Measurement Results Graph of Results Graph of Results The Graph of Results functions are accessed from the main graph menu, and are used to display and evaluate the measurement results. This screen is automatically displayed as a measurement is being made. You can also load a result file using the File System functions, and then display the results.
Evaluating Your Measurement Results Graph of Results Marker The marker function allows you to display the exact frequency and amplitude of any point on the results graph. To access the marker function: On the View menu, click Markers. Up to nine markers may be added. To remove the highlighted marker, click the Delete button.
Evaluating Your Measurement Results Graph of Results Omit Spurs Omit Spurs plots the currently loaded results without displaying any spurs that may be present. 1. On the View menu, click Display Preferences. 2. In the Display Preferences dialog box, uncheck Spurs.
Evaluating Your Measurement Results Graph of Results 3. The Graph will be displayed without spurs. To re-display the spurs, check Spurs in the Display Preferences dialog box.
Evaluating Your Measurement Results Graph of Results Parameter Summary The Parameter Summary function allows you to quickly review the measurement parameter entries that were used for this measurement. The parameter summary data is included when you print the graph. 1. On the View menu, click Parameter Summary. 2. The Parameter Summary Notepad dialog box appears. The data can be printed or changed using standard Notepad functionality.
Evaluating Your Measurement Results Problem Solving Problem Solving Table 15-1 Problem Solving If you need to know: Refer to: • What to do about breaks in the noise graph Discontinuity in the Graph • How to verify a noise level that is higher than expected High Noise Level • How to verify unexpected spurs on the graph Spurs on the Graph • How to interpret noise above the small angle line Small Angle Line Agilent Technologies E5500 Phase Noise Measurement System 15-13
Evaluating Your Measurement Results Problem Solving Discontinuity in the Graph Because noise distribution is continuous, a break in the graph is evidence of a measurement problem. Discontinuity in the graph will normally appear at the sweep-segment connections. Table 15-2 identifies the circumstances that can cause discontinuity in the graph.
Evaluating Your Measurement Results Problem Solving Higher Noise Level The noise level measured by the test system reflects the sum of all of the noise sources affecting the system. This includes noise sources within the system as well as external noise sources. If the general noise level measured for your device is much higher than you expected, begin evaluating each of the potential noise sources. The following table will help you identify and evaluate many of the potential causes of a high noise floor.
Evaluating Your Measurement Results Problem Solving Spurs on the Graph Except for marked spurs, all data on the graph is normalized to a 1 Hz bandwidth. This bandwidth correction factor makes the measurement appear more sensitive than it really is. Marked spurs are plotted without bandwidth correction however, to present their true level as measured.
Evaluating Your Measurement Results Problem Solving Table 15-4 Spur Sources Description Recommended Action Internal Potential spur sources within the measurement system include the phase noise system, the unit-under-test, and the reference source. Typical system spurs are –120 dBc, and they occur at the power line and system vibration frequencies in the range of from 25 Hz to 1 kHz, and above 10 MHz.
Evaluating Your Measurement Results Problem Solving Small Angle Line Figure 15-4 L(f) Is Only Valid for Noise Levels Below the Small Angle Line Caution must be exercised where L(f) is calculated from the spectral density of the phase modulation Sφ(f)/2 because of the small angle criterion. Below the line, the plot of L(f) is correct; above the line, L(f) is increasingly invalid and Sf(f) must be used to accurately represent the phase noise of the signal.
16 Advanced Software Features What You’ll Find in This Chapter… • • NOTE Phase Lock Loop Suppression, page 16-3 Blanking Frequency and Amplitude Information on the Phase Noise Graph, page 16-13 Additional “Advanced Features” information will be included in future versions of this manual. For information about our no-cost update program, refer to Software and Documentation Updates, page 21-2.
Advanced Software Features Introduction Introduction Advanced Functions allows you to manipulate the test system or to customize a measurement using the extended capabilities provided by the Agilent E5500 phase noise measurement software. These functions are recommended to be used only by those who understand how the measurement and the test system are affected.
Advanced Software Features Phase Lock Loop Suppression Phase Lock Loop Suppression Selecting “PLL Suppression Graph” on the View menu causes the software to display the PLL Suppression Curve plot, as shown in the Figure 16-1, when it is verified during measurement calibration. The plot appears whether or not an accuracy degradation occurs. Figure 16-1 PLL Suppression Parameters PLL Suppression Verification Graph The following measurement parameters are displayed along with the PLL Suppression Curve.
Advanced Software Features Phase Lock Loop Suppression MAX ERROR: This is the measured error that still exists between the the measured Loop Suppression and the Adjusted Theoretical Loop Suppression. The four points on the Loop Suppression graph marked with arrows (ranging from the peak down to approximately ––8 dB) are the points over which the Maximum Error is determined. An error of greater than 1 dB results in an accuracy degradation.
Advanced Software Features Phase Lock Loop Suppression DET. CONSTANT: This is the phase Detector Constant (sensitivity of the phase detector) used for the measurement. The accuracy of the Phase Detector Constant is verified if the PLL suppression is verified. The accuracy of the phase Detector Constant determines the accuracy of the noise measurement. The phase Detector Constant value, along with the LNA In/Out parameter, determines the Agilent/HP 3048A System noise floor exclusive of the reference source.
Advanced Software Features Ignore Out Of Lock Mode Ignore Out Of Lock Mode The Ignore Out Of Lock test mode enables all of the troubleshoot mode functions, plus it causes the software to not check for an out-of-lock condition before or during a measurement. This allows you to measure sources with high close-in noise that normally would cause an out-of-lock condition and stop the measurement. When Ignore Out Of Lock is selected, the user is responsible for monitoring phase lock.
Advanced Software Features PLL Suppression Verification Process PLL Suppression Verification Process When “Verify calculated phase locked loop suppression” is selected, it is recommended that “Always Show Suppression Graph” also be selected. Verifying phase locked loop suppression is a function which is very useful in detecting errors in the phase detector constant or tune constant, the tune constant linearity, limited VCO tune port bandwidth conditions, and injection locking conditions.
Advanced Software Features PLL Suppression Verification Process PLL Suppression Information Figure 16-3 The PLL Suppression View graph has been updated to allow measured, calculated (adjusted), and theoretical information to be examined more closely. When the “Always Show Suppression Graph” is selected, the following graph (Figure 16-3 on page 16-8) is provided. Default PLL Suppression Verification Graph There are four different curves available for the this graph: 1.
Advanced Software Features PLL Suppression Verification Process Figure 16-4 Measured Loop Suppression Curve Figure 16-5 Smoothed Loop Suppression Curve Agilent Technologies E5500 Phase Noise Measurement System 16-9
Advanced Software Features PLL Suppression Verification Process Figure 16-6 Theoretical Loop Suppression Curve Figure 16-7 Smoothed vs Theoretical Loop Suppression Curve 16-10 Agilent Technologies E5500 Phase Noise Measurement System
Advanced Software Features PLL Suppression Verification Process Figure 16-8 Smoothed vs Adjusted Theoretical Loop Suppression Curve Figure 16-9 Adjusted Theoretical vs Theoretical Loop Suppression Curve Agilent Technologies E5500 Phase Noise Measurement System 16-11
Advanced Software Features PLL Suppression Verification Process PLL Gain Change PLL gain change is the amount in dB by which the theoretical gain of the PLL must be adjusted to best match the smoothed measured loop suppression. The parameters of the theoretical loop suppression that are modified are Peak Tune Range (basically open loop gain) and Assumed Pole (for example a pole on the VCO tune port that may cause peaking).
Advanced Software Features Blanking Frequency and Amplitude Information on the Phase Noise Blanking Frequency and Amplitude Information on the Phase Noise Graph CAUTION Implementing either of the ‘‘secured’’ levels described in this section is not reversible. Once the frequency or frequency/amplitude data has been blanked, it can not be recovered.
Advanced Software Features Blanking Frequency and Amplitude Information on the Phase Noise Unsecured: all data is viewable When ‘‘Unsecured all data is viewable’’ is selected, all frequency and ampltude information is displayed on the phase noise graph. Secured: Frequencies cannot be viewed When ‘‘Secured: Frequecies cannot be viewed’’ is selected, all frequency information is blanked on the phase noise graph.
Advanced Software Features Blanking Frequency and Amplitude Information on the Phase Noise Agilent Technologies E5500 Phase Noise Measurement System 16-15
Advanced Software Features Blanking Frequency and Amplitude Information on the Phase Noise Secured: Frequencies and Amplitudes cannot be viewed When ‘‘Secured: Frequecies cannot be viewed’’ is selected, all frequency and amplitude information is blanked on the phase noise graph.
17 Error Messages and System Troubleshooting What You’ll Find in This Chapter NOTE Error messages and troubleshooting information is not included in this version of the manual. They will be included in a future version. For information about our no-cost update program, refer to Software and Documentation Updates, page 21-2.
18 Reference Graphs and Tables Graphs and Tables You’ll Find in This Chapter Graphs Tables • Approximate System Phase Noise Floor vs.
Reference Graphs and Tables Approximate System Phase Noise Floor vs. R Port Signal Level Approximate System Phase Noise Floor vs. R Port Signal Level The sensitivity of the phase noise measurement system can be improved by increasing the signal power at the R input port (Signal Input) of the phase detector in the test set. The graph shown above illustrates the approximate noise floor of the Agilent/HP 70420A test set for a range of R input port signal levels from -15 dBm to +15 dBm.
Reference Graphs and Tables Phase Noise Floor and Region of Validity Phase Noise Floor and Region of Validity Caution must be exercised when L(f) is calculated from the spectral density of the phase fluctuations, Sφ(f) because of the small angle criterion. The -10 dB/decade line is drawn on the plot for an instantaneous phase deviation of 0.2 radians integrated over any one decade of offset frequency. At approximately 0.
Reference Graphs and Tables Phase Noise Level of Various Agilent/HP Sources Phase Noise Level of Various Agilent/HP Sources The graph shown above indicates the level of phase noise that has been measured for several potential reference sources at specific frequencies. Depending on the sensitivity that is required at the offset to be measured, a single reference source may suffice or several different references may be needed to achieve the necessary sensitivity at different offsets.
Reference Graphs and Tables Increase in Measured Noise as Ref Source Approaches UUT Noise Increase in Measured Noise as Ref Source Approaches UUT Noise The graph shown above demonstrates that as the noise level of the reference source approaches the noise level of the UUT, the level measured by the software (which is the sum of all sources affecting the test system) is increased above the actual noise level of the UUT.
Reference Graphs and Tables Approximate Sensitivity of Delay Line Discriminator Approximate Sensitivity of Delay Line Discriminator The dependence of a frequency discriminator's sensitivity on the offset frequency is obvious in the graph shown above.
Reference Graphs and Tables AM Calibration AM Calibration The AM detector sensitivity graph shown above is used to determine the equivalent phase Detector Constant from the measured AM Detector input level or from the diode detector's dc voltage. The equivalent phase Detector Constant (phase slope) is read from the left side of the graph while the approximate detector input power is read from the right side of the graph.
Reference Graphs and Tables Voltage Controlled Source Tuning Requirements Voltage Controlled Source Tuning Requirements Peak Tuning Range (PTR) ≈ Tune Range of VCO x VCO Tune Constant. Min. PTR =.1 Hz Max. PTR = Up to (200 MHz depending on analyzer and phase detector LPF). Drift Tracking Range = Allowable Drift During Measurement.
Reference Graphs and Tables Tune Range of VCO vs. Center Voltage Tune Range of VCO vs. Center Voltage The graph shown above outlines the minimum to maximum Tune Range of VCO which the software provides for a given center voltage. The Tune range of VCO decreases as the absolute value of the center voltage increases due to hardware limitations of the test system.
Reference Graphs and Tables Peak Tuning Range Required Due to Noise Level Peak Tuning Range Required Due to Noise Level The graph shown above provides a comparison between the typical phase noise level of a variety of sources and the minimum tuning range that is necessary for the test system to create a phase lock loop of sufficient bandwidth to make the measurement. Sources with higher phase noise require a wider Peak Tuning Range.
Reference Graphs and Tables Phase Lock Loop Bandwidth vs. Peak Tuning Range Phase Lock Loop Bandwidth vs. Peak Tuning Range The graph shown above illustrates the closed Phase Lock Loop Bandwidth (PLL BW) chosen by the test system as a function of the Peak Tuning Range of the source. Knowing the approximate closed PLL BW allows you to verify that there is sufficient bandwidth on the tuning port and that sufficient source isolation is present to prevent injection locking.
Reference Graphs and Tables Noise Floor Limits Due to Peak Tuning Range Noise Floor Limits Due to Peak Tuning Range The graph shown above illustrates the equivalent phase noise at the Peak Tuning Range entered for the source due to the inherent noise at the test set Tune Voltage Output port. (A Tune Range of VCO +/-10 V and phase Detector Constant of 0.2V/Rad is assumed.
Reference Graphs and Tables Tuning Characteristics of Various VCO Source Options Tuning Characteristics of Various VCO Source Options Carrier Freq.
Reference Graphs and Tables Agilent/HP 8643A Frequency Limits Agilent/HP 8643A Frequency Limits Table 18-1 Agilent/HP 8643A Frequency Limits 1 Note: Special Function 120 must be enabled for DCFM Minimum Recommended PTR (Peak Tune Range) PTR =FM Deviation x VTR Model Numbe r Option Band Minimum (MHz) Band Maximum (MHz) Mode 2 2 Mode 1 3 8643A 002 1030 2060 2000000 20000000 8643A 002 515 1029.99999999 1000000 10000000 8643A Standar d 515 1030 1000000 10000000 8643A Both 257.
Reference Graphs and Tables Agilent/HP 8643A Frequency Limits Table 18-2 Operating Characteristics for Agilent/HP 8643A Modes 1, 2, and 3 Synthisis Mode Charateristic Mode 1 Mode 2 90 ms 200 ms FM Deviation at 1 GHz 10 MHz 1 MHz Phase Noise (20 kHz offset at 1 GHz) -120 dBc -130 dBc RF Frequency Switching Time How to Access Special Functions Press the “Special” key and enter the special function number of your choice. Access the special function key by pressing the “Enter” key.
Reference Graphs and Tables Agilent/HP 8644B Frequency Limits Agilent/HP 8644B Frequency Limits Table 18-3 Agilent/HP 8644B Frequency Limits 1 Note: Special Function 120 must be enabled for DCFM Minimum Recommended PTR (Peak Tune Range) PTR =FM Deviation x VTR Model Numbe r Option Band Minimum (MHz) Band Maximum (MHz) Mode 3 Mode 2 Mode 1 8644B 002 1030 2060 200000 2000000 20000000 8644B 002 515 1029.
Reference Graphs and Tables Agilent/HP 8644B Frequency Limits Table 18-4 Operating Characteristics for Agilent/HP 8644B Modes 1, 2, and 3 Synthisis Mode Charateristic Mode 1 Mode 2 Mode 3 90 ms 200 ms 350 ms FM Deviation at 1 GHz 10 MHz 1 MHz 100 kHz Phase Noise (20 kHz offset at 1 GHz) -120 dBc -130 dBc -136 dBc RF Frequency Switching Time How to Access Special Functions Press the “Special” key and enter the special function number of your choice.
Reference Graphs and Tables Agilent/HP 8664A Frequency Limits Agilent/HP 8664A Frequency Limits Table 18-5 Agilent/HP 8664A Frequency Limits 1 Note: Special Function 120 must be enabled for the DCFM Model Numbe r Minimum Recommended PTR (Peak Tune Range) PTR =FM Deviation x VTR Band Minimum (MHz) Band Maximum (MHz) Mode 3 Mode 2 8664A 2060 3000 400000 10000000 8664A 1500 2059.99999999 200000 10000000 8664A 1030 1499.99999999 200000 5000000 8664A 750 1029.
Reference Graphs and Tables Agilent/HP 8664A Frequency Limits How to Access Special Functions Press the “Special” key and enter the special function number of your choice. Access the special function key by pressing the “Enter” key. Press the [ON] (ENTER) key to terminate data entries that do not require specific units (kHz, mV, rad, for example) Example: [Special], [1], [2], [0], [ON] (Enter).
Reference Graphs and Tables Agilent/HP 8665A Frequency Limits Agilent/HP 8665A Frequency Limits Table 18-7 Agilent/HP 8665A Frequency Limits 1 Note: Special Function 120 must be enabled for DCFM Model Numbe r Minimum Recommended PTR (Peak Tune Range) PTR =FM Deviation x VTR Band Minimum (MHz) Band Maximum (MHz) Mode 3 Mode 2 8665A 4120 4200 800000 20000000 8665A 3000 4119.99999999 400000 20000000 8665A 2060 2999.99999999 400000 10000000 8665A 1500 2059.
Reference Graphs and Tables Agilent/HP 8665A Frequency Limits How to Access Special Functions Press the “Special” key and enter the special function number of your choice. Access the special function key by pressing the “Enter” key. Press the [ON] (ENTER) key to terminate data entries that do not require specific units (kHz, mV, rad, for example) Example: [Special], [1], [2], [0], [ON] (ENTER).
Reference Graphs and Tables Agilent/HP 8665B Frequency Limits Agilent/HP 8665B Frequency Limits Table 18-9 Agilent/HP 8665B Frequency Limits 1 Note: Special Function 120 must be enabled for DCFM Model Numbe r Minimum Recommended PTR (Peak Tune Range) PTR =FM Deviation x VTR Band Minimum (MHz) Band Maximum (MHz) Mode 3 Mode 2 8665B 4120 6000 800000 20000000 8665B 3000 4119.99999999 400000 20000000 8665B 2060 2999.99999999 400000 10000000 8665B 1500 2059.
Reference Graphs and Tables Agilent/HP 8665B Frequency Limits How to Access Special Functions Press the “Special” key and enter the special function number of your choice. Access the special function key by pressing the “Enter” key.Press the [ON] (ENTER) key to terminate data entries that do not require specific units (kHz, mV, rad, for example) Example: [Special], [1], [2], [0], [ON] (Enter).
19 Connect Diagrams Connect Diagrams You’ll Find in This Chapter • • • • • • • • • • • • • • • • • • • • • • • • • E5501A Standard Connect Diagram, page 19-2 E5501A Opt. 001 Connect Diagram, page 19-3 E5501A Opt. 201, 430, 440 Connect Diagram, page 19-4 E5501A Opt. 201 Connect Diagram, page 19-5 E5502A Standard Connect Diagram, page 19-6 E5502A Opt. 001 Connect Diagram, page 19-7 E5502A Opt. 201 Connect Diagram, page 19-8 E5503A Standard Connect Diagram, page 19-9 E5503A Opt.
Connect Diagrams E5501A Standard Connect Diagram E5501A Standard Connect Diagram 19-2 Agilent Technologies E5500 Phase Noise Measurement System
Connect Diagrams E5501A Opt. 001 Connect Diagram E5501A Opt.
Connect Diagrams E5501A Opt. 201, 430, 440 Connect Diagram E5501A Opt.
Connect Diagrams E5501A Opt. 201 Connect Diagram E5501A Opt.
Connect Diagrams E5502A Standard Connect Diagram E5502A Standard Connect Diagram 19-6 Agilent Technologies E5500 Phase Noise Measurement System
Connect Diagrams E5502A Opt. 001 Connect Diagram E5502A Opt.
Connect Diagrams E5502A Opt. 201 Connect Diagram E5502A Opt.
Connect Diagrams E5503A Standard Connect Diagram E5503A Standard Connect Diagram Agilent Technologies E5500 Phase Noise Measurement System 19-9
Connect Diagrams E5503A Opt. 001 Connect Diagram E5503A Opt.
Connect Diagrams E5503A Opt. 201 Connect Diagram E5503A Opt.
Connect Diagrams E5504A Standard Connect Diagram E5504A Standard Connect Diagram 19-12 Agilent Technologies E5500 Phase Noise Measurement System
Connect Diagrams E5504A Opt. 001 Connect Diagram E5504A Opt.
Connect Diagrams E5504A Opt. 201 Connect Diagram E5504A Opt.
Connect Diagrams E5501B Standard Connect Diagram E5501B Standard Connect Diagram Agilent Technologies E5500 Phase Noise Measurement System 19-15
Connect Diagrams E5501B Opt. 001 Connect Diagram E5501B Opt.
Connect Diagrams E5501B Opt. 201 Connect Diagram E5501B Opt.
Connect Diagrams E5502B Standard Connect Diagram E5502B Standard Connect Diagram 19-18 Agilent Technologies E5500 Phase Noise Measurement System
Connect Diagrams E5502B Opt. 001 Connect Diagram E5502B Opt.
Connect Diagrams E5502B Opt. 201 Connect Diagram E5502B Opt.
Connect Diagrams E5503B Standard Connect Diagram E5503B Standard Connect Diagram Agilent Technologies E5500 Phase Noise Measurement System 19-21
Connect Diagrams E5503B Opt. 001 Connect Diagram E5503B Opt.
Connect Diagrams E5503B Opt. 201 Connect Diagram E5503B Opt.
Connect Diagrams E5504B Standard Connect Diagram E5504B Standard Connect Diagram 19-24 Agilent Technologies E5500 Phase Noise Measurement System
Connect Diagrams E5504B Opt. 001 Connect Diagram E5504B Opt.
Connect Diagrams E5504B Opt. 201 Connect Diagram E5504B Opt.
20 System Specifications What You’ll Find in This Chapter… • Specifications, page 20-2 Agilent Technologies E5500 Phase Noise Measurement System 20-1
System Specifications Specifications Specifications Reliable Accuracy Table 20-1 The Agilent E5500 phase noise system minimizes measurement uncertainty by assuring you of accurate and repeatable measurement results. RF Phase Detector Accuracy RF Phase Detector Accuracy Frequency Range Table 20-2 Offset from Carrier .01 Hz to 1 MHz ± 2 dB 1 MHz to 100 MHz ± 4 dB AM Detector Accuracy AM Detector Accuracy Frequency Range Measurement Qualifications Offset from Carrier .
21 Phase Noise Customer Support What You’ll Find in This Chapter • • • Software and Documentation Updates, page 21-2 Contacting Customer Support, page 21-3 Phase Noise Customer Support Fax Form, page 21-5 Agilent Technologies E5500 Phase Noise Measurement System 21-1
Phase Noise Customer Support Software and Documentation Updates Software and Documentation Updates NOTE To receive SOFTWARE and DOCUMENTATION UPDATES, please send us your: • • • • Name Address Phone number Agilent/HP 70420A Test Set serial number ❍ To find the test set’s serial number, open the door on the lower-front of the HP 70001A Mainframe.
Phase Noise Customer Support Contacting Customer Support Contacting Customer Support Feel free to contact us using one of the methods described under “Software and Documentation Updates” on page 21-2 if you have any questions regarding the SOFTWARE UPDATE program. If you have an application question, or are experiencing difficulties with your system, you may also contact us for assistance. NOTE Please provide as much information as possible when contacting the HP Phase Noise Customer Support department.
Phase Noise Customer Support Contacting Customer Support Phase Noise Customer Support Fax Form Date: To: Phase Noise Customer Support From: FAX Number: (707) 577-4446 Phone: # pages following: FAX Number: Please call (707) 577-5858 if you have trouble with the transmission.
A Connector Care and Preventive Maintenance What You’ll Find in This Appendix… • • • Using, Inspecting, and Cleaning RF Connectors, page A-2 ❍ Repeatability, page A-2 ❍ Proper Connector Torque, page A-3 ❍ Cleaning Procedure, page A-4 Removing and Reinstalling Instruments, page A-6 ❍ General Procedures and Techniques, page A-6 ❍ MMS Module Removal and Reinstallation, page A-11 Touch-Up Paint, page A-12 Agilent Technologies E5500 Phase Noise Measurement System A-1
Connector Care and Preventive Maintenance Using, Inspecting, and Cleaning RF Connectors Using, Inspecting, and Cleaning RF Connectors Taking proper care of cables and connectors will protect your system’s ability to make accurate measurements. One of the main sources of measurement inaccuracy can be caused by improperly made connections or by dirty or damaged connectors. The condition of system connectors affects measurement accuracy and repeatability.
Connector Care and Preventive Maintenance Using, Inspecting, and Cleaning RF Connectors RF Cable and Connector Care Connectors are the most critical link in a precision measurement system. These devices are manufactured to extremely precise tolerances and must be used and maintained with care to protect the measurement accuracy and repeatability of your system. To extend the life of your cables or connectors: • Avoid repeated bending of cables—a single sharp bend can ruin a cable instantly.
Connector Care and Preventive Maintenance Using, Inspecting, and Cleaning RF Connectors CAUTION Never exceed the recommended torque when attaching cables. Table A-1 Connector Wear and Damage Proper Connector Torque Connect or Torque cm-kg Torque N-cm Torque in-lbs Wrench Part Number Type-N 52 508 45 8710-1935 2.4 mm 9.2 90 8 8720-1765 3.5 mm 9.2 90 8 8720-1765 SMA 5.
Connector Care and Preventive Maintenance Using, Inspecting, and Cleaning RF Connectors Table A-2 CAUTION Cleaning Supplies Available from Agilent Technologies Product Part Number Lint-Free cloths: 9310-4242 Small foam swabs: 9300-1270 Large foam swabs 9300-0468 Do not allow excessive alcohol to run into the connector. Excessive alcohol entering the connector collects in pockets in the connector’s internal parts. The liquid will cause random changes in the connector’s electrical performance.
Connector Care and Preventive Maintenance Removing and Reinstalling Instruments Removing and Reinstalling Instruments General Procedures and Techniques This section introduces you to the various cable and connector types used in the system. Read this section before attempting to remove an instrument! EA connector type may have unique considerations. For example, some connectors are loosened by turning them clockwise, others by turning counter clockwise.
Connector Care and Preventive Maintenance Removing and Reinstalling Instruments Figure A-1 GPIB and 2.
Connector Care and Preventive Maintenance Removing and Reinstalling Instruments GPIB Connectors These are removed by two captured screw, one on each end of the connector; these usually can be turned by hand. Use a flathead screwdriver if necessary. GPIB connectors often are stacked two or three deep. When you are removing multiple GPIB connectors, disconnect each connector one at a time.
Connector Care and Preventive Maintenance Removing and Reinstalling Instruments • Turn the silver nut clockwise by hand until it is snug, then tighten with an 8 inch-lb torque wrench (part number 8720-1765). This wrench may be ordered from Agilent Technologies. Bent Semirigid Cables Semirigid cables are not intended to be bent outside of the factory. An accidental bend that is slight or gradual may be straightened carefully by hand.
Connector Care and Preventive Maintenance Removing and Reinstalling Instruments Figure A-2 Type-N, Power Sensor, and BNC Connectors A-10 Agilent Technologies E5500 Phase Noise Measurement System
Connector Care and Preventive Maintenance Removing and Reinstalling Instruments MMS Module Removal and Reinstallation To Remove an MMS Module 1. Set the mainframe line switch to OFF. 2. Remove all rear panel cables going to the module 3. On the bottom of the mainframe front panel is a dark-colored, horizontal access panel. Pry outward at the top of this panel to open it. 4. With an 8 mm hex-ball driver, loosen the module hex nut latch. 5.
Connector Care and Preventive Maintenance Touch-Up Paint Touch-Up Paint Touch-up paint is shipped in spray cans. Spray a cotton swab with paint and apply it to the damaged area.
A absolute measurement fundamentals, 6-1 absolute measurements, 7-1 accuracy reliable, 20-2 AM Calibration, 18-7 AM noise Agilent/HP 11729C, 13-2 Agilent/HP 8662/3A, 13-2 amplifier measurement example, 9-2, 11-3 Amplifiers inserted, 6-18 amplifiers, 8-2 Approximate, 18-2 Approximate Sensitivity of Delay Line Discriminator, 18-6 Approximate System Phase Noise Floor vs.
guided tour E5500, 3-3 guidelines training, 1-3 H hardcopy, 15-7 Agilent/HP 11729C AM noise, 13-2 option 130, 13-2 Agilent/HP 11848A aux monitor, 8-14, 9-12 Agilent/HP 8662/3A AM noise, 13-2 GPIB connectors, removing, A-8 I Increase in Measured Noise as Ref Source Approaches UUT Noise, 18-5 Injection locking, 6-16 injection locking bandwidth, 6-17 L L input port amplitude, 6-6 List of Spurs, 15-16 Low Noise Amplifier (LNA) Agilent/HP 11848A, 7-81, 7-104, 14-3, 14-7 M maintenance, preventive, A-1 making
phase noise curve 70420A confidence test, 3-9 Phase Noise Customer Support, 21-1 Phase Noise Floor and Region of Validity, 18-3 Phase Noise Level of Various Agilent/HP Sources, 18-4 Phase Noise Measurement without Phase-Lock Loop, 8-6 PLL bandwidth, 6-16 PLL suppression, 5-27, 5-50 measuring, 5-27, 5-50 Plotter Pens, 5-57, 5-60, 15-10 power sensor connectors, A-10 preventive maintenance, A-1 printer using, 15-7 printing screens, 15-7 Problem Solving, 15-13 PTR, 6-14 R R input port amplitude, 6-6 level, 8-1
Tuning Qualifications, 6-14 tuning requirements, 6-9 signal generator, 6-9 tuning sensitivity, 6-11 two-port device, 8-2 two-port devices calibration, 8-6 type-N connectors, A-10 U updates software, 21-2 User Entry of Phase Detector Constant, 8-9, 11-13, 11-28 user interface graphical, 2-2 using a printer, 15-7 using a signal generator, 6-9 using a similar device, 6-8 using this guide, 6-2 V VCO selecting, 6-5 VCO source tuning parameters, 6-5 vco source Signal Generators, 6-15 Tuning Qualifications, 6-14
