User`s guide

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Agilent 5500 SPM
User’s Guide
Agilent Technologies
1
Introduction to the Agilent 5500
Overview of Agilent SPM System 17
SPM Basics 18
SPM Techniques 20
Scanning Tunneling Microscopy (STM) 20
Atomic Force Microscopy (AFM) 21
Intermittent Contact AFM 24
Acoustic AC (AAC) AFM 25
Magnetic AC (MAC) Mode 26
Top MAC Mode 27
Current Sensing Mode (CSAFM) 27
Force Modulation Microscopy (FMM) 28
Lateral Force Microscopy (LFM) 29
Dynamic Lateral Force Microscopy (DLFM) 29
Magnetic Force Microscopy (MFM) 29
Electrostatic Force Microscopy (EFM) 30
Kelvin Force Microscopy (KFM) 30
The Agilent 5500 SPM is the ideal multiple-user research system for
Scanning Probe Microscopy (SPM). As the high-performance Atomic
Force Microscope (AFM) flagship of Agilent’s product line, the 5500
SPM provides a wealth of unique technological features, including
precision temperature control and industry-leading environmental
control.
The Agilent 5500 SPM offers features and software for research in
materials science, polymers, nanolithography and general surface
characterization. With excellent ease of use, the 5500 SPM also affords
educators an unprecedented opportunity to introduce students to AFM
technology.