Service manual

Typical Result

Positive polarity leakage

Direct Channels Tree A Tree B

DIRECT HI to DIRECT LO 0.0021 Vdc 0.0015 Vdc 0.0020 Vdc 0.0018 Vdc

HI to CHASSIS 0.0019 Vdc 0.0020 Vdc 0.0022 Vdc 0.0022 Vdc

LO to CHASSIS 0.0015 Vdc 0.0022 Vdc 0.0019 Vdc 0.0023 Vdc

Negative polarity leakage

Direct Channels Tree A Tree B

DIRECT HI to DIRECT LO 0.0022 Vdc 0.0026 Vdc 0.0025 Vdc 0.0028 Vdc

HI to CHASSIS 0.0028 Vdc 0.0030 Vdc 0.0026 Vdc 0.0026 Vdc

LO to CHASSIS 0.0038 Vdc 0.0033 Vdc 0.0028 Vdc 0.0032 Vdc

Performance

Test Record

Table 2-1, Performance Test Record, is a form you can copy and use to

record performance verification test results for the FET Multiplexer. Table

2-1 shows multiplexer test limits, DMM measurement uncertainty, and test

accuracy ratio values (TAR).

Test Limits Test limits are defined for Closed Channel Resistance and Leakage (input

isolation) using the specifications in Appendix A of the appropriate User’s

Manual. The closed channel resistance and leakage tests are single-ended,

meaning that there is an upper limit OR a lower limit but not both. In Table

2-1, the minimum or maximum column is blank for a single ended test.

Measurement

Uncertainty

For the performance verification tests in this manual, measurement

uncertainties are calculated based on the Agilent 3458A Digital Multimeter.

The measurement uncertainty shown in Table 2-1 is the accuracy of the

Agilent 3458A using 90-day specifications. The calculations follow.

Closed Channel

Resistance Test

Conditions:

• 2-wire Ohms function, 10 kΩ range

• 90 day specifications

• Worst case reading = 3.1 kΩ

MU = (8 ppm of Reading + 0.5 ppm of Range)

= ((8 X 10

-6

* 3100) + (0.5 X 10

-6

* 10

))

= 0.03 Ω

2-22 Verification Tests