Ihr Spezialist für Mess- und Prüfgeräte Agilent Accessories Selection Guide For Impedance Measurements dataTec ▪ Ferdinand-Lassalle-Str. 52 ▪ 72770 Reutlingen ▪ Tel. 07121 / 51 50 50 ▪ Fax 07121 / 51 50 10 ▪ info@datatec.de ▪ www.datatec.
Table of Contents Introduction 1. What are Agilent Accessories? 2. Types of Accessories 3. The Benefits of Agilent Accessories 4. ISO 9000 Quality Management Tips for Selecting Appropriate Accessories 1. Selection by Measurement Application 2. Compatibility with Measurement Instruments 3. Frequency, DC Bias, and Operating Temperature/Humidity 4. DUT (Device Under Test) Dimensions 5. Open & Short Repeatability and Proportional Error 6. Furnished Accessories 7.
Probes: 42941A Impedance Probe Kit DC Bias Accessories: 16065A 200 Vdc External Voltage Bias Fixture 16065C 40 Vdc External Voltage Bias Adapter Material: 16451B Dielectric Test Fixture 16452A Liquid Dielectric Test Fixture Up to 3 GHz (7 mm) Lead Components: 16092A Spring Clip Test Fixture SMD: 16192A Parallel Electrode SMD Test Fixture 16194A High Temperature Component Test Fixture 16196A Parallel Electrode SMD Test Fixture 16196B Parallel Electrode SMD Test Fixture 16196C Parallel Electrode SMD Test Fixt
Other Components (Varying in Size, Shape or Grounded): 16117B Low Noise Test Leads 16117C Low Noise Test Leads Material: 16008B Resistivity Cell Other Accessories 16190B Performance Test Kit 16380A Standard Capacitor Set 16380C Standard Capacitor Set 42030A Four-Terminal Pair Standard Resistor Set 42090A Open Termination 42091A Short Termination Appendix The Concept of a Test Fixture’s Additional Error 1. System Configuration for Impedance Measurement 2. Measurement System Accuracy 3.
Introduction When a device under test (DUT) is measured, a test fixture must be used to connect the instrument to the DUT. A test fixture is an interface specifically designed to connect the instrument and the contact tips of the DUT. 1. What are Agilent Accessories? Agilent offers a variety of accessories suitable for many applications. They are designed to make measurements simple and reliable.
Introduction 3. The Benefits of Agilent Accessories Each accessory is designed to ensure highly accurate measurements without degrading the performance of the measurement instrument. – Minimum residual error preserves the accuracy of the measurement instruments. – Clearly defined error compensation allows easy calculation of error corrections. – Strict measurement specifications, such as test frequencies and signal levels provide safe and accurate measurements.
Tips for Selecting Appropriate Accessories The following topics comprise a helpful guideline for selecting an appropriate accessory for the measurement instrument to be used. 1. Selection by Measurement Application Agilent accessories can be used in a wide variety of measurement applications. These applications range from basic measurements (such as impedance measurements for discrete devices) to advanced measurements (such as measurement of resistivities or dielectric constants.) 2.
Tips for Selecting Appropriate Accessories 3. Frequency, DC Bias, and Operating Temperature/Humidity Each of the Agilent accessories has its own specific operating range. Any measurement performed outside this range can increase residual errors and can cause problems. Be sure that your measurement environment fits the accessory’s specific operating range. In the case of humidity, Agilent’s accessories can operate at a relative humidity of 95% or less at 40°C.
Tips for Selecting Appropriate Accessories 7. Terminal Adapters Terminal Adapters convert the instruments terminal configuration into a 7 mm terminal configuration. This means that instruments that do not have a 7 mm terminal connector can use test fixtures with a 7 mm terminal connector. The 42942A converts a 4-Terminal Pair configuration into a 7 mm terminal connector, which can only be used with the 4294A.
Accessories Catalogue Applicable Frequency Ranges 16047A 16047E 16060A 16034E 16034G/H 16044A 16334A 16089A/B/C/D 16048A/D 16048E 16048G/H 42941A 16065A 16065C 16451B 16452A 16092A 16192A 16194A 16196A/B/C/D 16197A 16200B 16453A 16454A 16339A 16118A 16117B/C 16008B DC 1k 1M Frequency Range 10M 100M 13M 100 k 40M 10M 5 5 100 k 1M 1k 3G [Hz] 110M 15M 110M 110M 2M 20 DC DC DC DC 2G [Hz] 30M 2M 40 50 100 1G [Hz] 110M 30M 30M 500M 2G 2G 1G 1G 1G 1M 1M (For 4339A/B only) (For 4339A/B
Accessories Catalogue Accessories Organization This document is organized by measurement frequency and DUT to enable quick selection of an appropriate test fixture for a particular measurement application.
Up to 110 MHz (4-Terminal Pair) Test Fixtures (4-Terminal Pair) for Impedance Measurements up to 110 MHz Frequency Range DC 1k 1M 10M 16047A 100M 13M 16047E 110M 16060A 100 k 16034E 40M 16034G/H 110M 16044A 10M 16334A 5 16089A/B/C/D 5 15M 100 k 16048A/D 30M 16048E 2M 16048G/H 110M 42941A 40 16065A 50 16065C 100 110M 2M 1M 16451B 30M 16452A 20 30M Applicable Instrument Frequency Range Up to 110 MHz (Terminal Configuration: 4-Terminal Pair) Up to 3 GHz (Terminal Config
Up to 110 MHz (4-Terminal Pair) 16047A Test Fixture Lead Components Description: This test fixture is designed for impedance evaluation of axial/radial lead type devices. The 16047A employs Kelvin contacts which realize a wide impedance measurement range. The contact tip can be changed according to the device shape. Applicable Instruments: 4263B 4268A* 4279A* 4288A* E4980A E4981A 4284A* 4285A 4294A ** * denotes the instrument is obsolete. ** applicable in a limited re uency range.
Up to 110 MHz (4-Terminal Pair) 16047E Test Fixture Lead Components Description: This test fixture is designed for impedance evaluation of lead type devices up to 110 MHz. A guard terminal is available for three terminal devices and a shorting plate comes secured on this fixture. Applicable Instruments: 4263B 4268A* 4279A* 4284A* 4285A 4288A* 4294A E4980A E4981A E5061B-3L5 with pt. E5061B-005 * denotes the instrument is obsolete. Frequency: DC to 110 MHz Maximum Voltage: ±42 V peak max.
Up to 110 MHz (4-Terminal Pair) 16060A Transformer Test Fixture Terminal Connector: 4-Terminal Pair, BNC DUT Connection: Lead Components Description: This test fixture provides a convenient means of measuring a transformer’s self-inductance, mutual inductance, turnsratio, and DC resistance in the frequency range of DC to 100 kHz, as appropriate for each measurement.
Up to 110 MHz (4-Terminal Pair) 16034E Test Fixture SMD Description: This test fixture is designed for impedance evaluations of SMD. The minimum SMD size that this fixture is adapted to evaluate is 1.6(L) x 0.8(W) [mm]. Applicable Instruments: 4263B 4268A* 4279A* 4284A* 4285A 4288A* E4980A E4981A E5061B-3L5 with pt. E5061B-005 4294A ** * denotes the instrument is obsolete. ** applicable in a limited re uency range. Frequency: DC to 40 MHz Maximum Voltage: ±42 V peak max.
Up to 110 MHz (4-Terminal Pair) 16034G Test Fixture SMD Description: This test fixture is designed for impedance evaluations of SMD. The minimum SMD size that this fixture is adapted to evaluate is 0.6(L) x 0.3(W) [mm]. Applicable Instruments: 4263B 4268A* 4279A* 4284A* 4285A 4288A* 4294A, E4980A, E4981A, E50613-3L5 with Opt. E5061B-005 * denotes the instrument is obsolete. Frequency: DC to 110 MHz Maximum Voltage: ±42 V peak max.
Up to 110 MHz (4-Terminal Pair) 16034H Test Fixture SMD Description: This test fixture is designed for impedance evaluations of array-type SMD. The minimum SMD size that this fixture is adapted to evaluate is 1.6(L) x 0.8(W) [mm]. Since the tip of the measurement electrodes are very thin and the device holder is extremely flat, the device can be shifted and the measurement electrodes can contact the each elements of the array-type component.
Up to 110 MHz (4-Terminal Pair) 16044A Test Fixture SMD Description: This test fixture is designed for impedance evaluations of low impedance SMD. The minimum SMD size that this fixture is adapted to evaluate is 1.6(L) x 0.8(W) [mm]. The 16044A has a Kelvin (4-Terminal) contact, which ensures repeatable measurements. It is also equipped with a mechanism for easily performing open and short compensation.
Up to 110 MHz (4-Terminal Pair) SMD Compensation and Measurement: Open and short compensations are recommended before measurement. Short compensation is performed by bringing down the shorting plate (which is already on the fixture) to short all 4 terminals. Open compensation is performed by bringing down both the open plate and the shorting plate to separate the high terminals from the low terminals. After performing open and short compensations, the DUT is inserted into the test fixture.
Up to 110 MHz (4-Terminal Pair) 16334A Tweezers Contact Test Fixture SMD Description: This test fixture is designed for impedance evaluations of SMD. The minimum SMD size that this fixture is adapted to evaluate is 1.6(L) x 0.8(W) [mm]. The tweezers’ contacts on this fixture makes it easy to hold the DUT. Applicable Instruments: 4263B 4268A* 4279A* 4284A* 4288A* E4980A E4981A 4285A 4294A ** * denotes the instrument is obsolete. ** applicable in a limited re uency range.
Up to 110 MHz (4-Terminal Pair) 16089A Large Kelvin Clip Leads Other Components Description: This test fixture makes it possible to measure oddshaped components that cannot be measured with conventional fixtures. It is equipped with two insulated Kelvin clips. Applicable Instruments: 4263B 4268A* 4284A* 4285A 4288A* 4294A E4980A E4981A ** * denotes the instrument is obsolete. ** applicable in a limited re uency range. Terminal Connector: Frequency: 5 Hz to 100 kHz Maximum Voltage: ±42 V peak max.
Up to 110 MHz (4-Terminal Pair) 16089C Kelvin IC Clip Leads Other Components Description: This test fixture makes it possible to measure oddshaped components that cannot be measured with conventional fixtures. It is equipped with two insulated Kelvin clips. Applicable Instruments: 4263B 4268A* 4284A* 4285A 4288A* 4294A E4980A E4981A ** * denotes the instrument is obsolete. ** applicable in a limited re uency range.
Up to 110 MHz (4-Terminal Pair) 16048A Test Leads Port/Cable Extension Description: The test leads extend the measurement port with a 4-Terminal Pair configuration. It is provided with a BNC female connector board to allow the attachment of user-fabricated test fixtures. Applicable Instruments: 4263B 4268A* 4279A* 4284A* 4285A 4288A* E4980A E4981A * denotes the instrument is obsolete. Frequency: DC to 30 MHz Maximum Voltage: ±42 V peak max.
Up to 110 MHz (4-Terminal Pair) 16048E Test Leads Port/Cable Extension Description: The test leads extend the measurement port with a 4-Terminal Pair configuration. It is provided with a BNC female connector board to allow the attachment of user-fabricated test fixtures. Applicable Instruments: 4263B 4284A*1, E4980A * denotes the instrument is obsolete. 1. Requires Option 006. Frequency: DC to 2 MHz Maximum Voltage: ±42 V peak max.
Up to 110 MHz (4-Terminal Pair) 16048G Test Leads Port/Cable Extension Description: The test leads extend the measurement port with a 4-Terminal Pair configuration. It is provided with a BNC male connector board to allow the attachment of user-fabricated test fixtures. Applicable Instrument: 4294A Frequency: DC to 110 MHz Maximum Voltage: ±42 V peak max.
Up to 110 MHz (4-Terminal Pair) 42941A Impedance Probe Kit Terminal Connector: 4-Terminal Pair, BNC Cable Length (approx.): 1.5 m Weight (approx.): 2400 g Basic Measurement Accuracy: ±1% For detailed information, refer to the operation Probes Description: This impedance probe kit is designed for use with the 4294A. It provides the capability to perform in-circuit measurements (printed circuit patterns, the input/output impedance of circuits, etc.
Up to 110 MHz (4-Terminal Pair) 16065A 200Vdc External Voltage Bias Fixture DC Bias Accessories Description: This test fixture makes it possible to measure a DUT with up to ±200 V DC bias. The same modules of 16047A can be used to allow measurements of axial/radial lead components. Applicable Instruments: 4263B 4268A* 4279A* 4288A* E4981A 4284A* 4285A 4294A E4980A ** * denotes the instrument is obsolete. ** applicable in a limited re uency range.
Up to 110 MHz (4-Terminal Pair) 16451B Dielectric Test Fixture Material Description: The 16451B is used to evaluate the dielectric constant of solid dielectric materials accurately, and complies with ASTM D150. The 16451B employs the parallel plate method, which sandwiches the material between two electrodes to form a capacitor. LCR meter or an Impedance Analyzer is then used to measure the capacitance created from the fixture.
Up to 110 MHz (4-Terminal Pair) Material Applicable Instruments: 4263B 4268A* 4279A* 4284A* 4285A 4288A* E4980A E4981A 4294A ** * denotes the instrument is obsolete. ** applicable in a limited re uency range. Frequency: DC to 30 MHz Maximum Voltage: ±42 V peak max.
Up to 110 MHz (4-Terminal Pair) Material Furnished Accessories: Description P/N Test Fixture including Electrode-A, unguarded electrode and cover Qty.
Up to 110 MHz (4-Terminal Pair) Material Compensation and Measurement: There are three measurement methods for the 16451B. They are the Contacting Electrode Method (used with 16451B's rigid metal electrode, without any electrodes on the material under test), the Contacting Electrode Method (used with thin film electrodes made on the material under test), and the Non-Contacting Electrode (Air Gap method).
Up to 110 MHz (4-Terminal Pair) 16452A Liquid Dielectric Test Fixture Material Description: This test fixture provides accurate dielectric constant and impedance measurements of liquid materials. The 16452A employs the parallel plate method, which sandwiches the liquid material between two electrodes to form a capacitor. A LCR meter or an impedance analyzer is then used to measure the capacitance created from the fixture.
Up to 110 MHz (4-Terminal Pair) Material Compensation and Measurement: Short compensation is recommended in combination with the cable length compensation before measurement. First, set the instrument's cable length compensation function to 1 m. Then, short compensation is performed by using the furnished shorting plate.
Up to 3 GHz (7 mm) DC 16092A 16192A 16193A 16194A 16196A/B/C/D 16197A 16200B 16453A 16454A 1k 1M Frequency Range 10M 100M 1G [Hz] 2G [Hz] 2G 2G 2G 1G 1G 1G 1M 1M 1k 500M 3G [Hz] 3G 3G : When 42942A is used. Applicable Instrument Frequency Range Up to 110 MHz (Terminal Configuration: 4-Terminal Pair) Up to 3 GHz (Terminal Configuration: 7 mm) Measurement Instruments 4263B, 4268A, 4279A, 4284A, 4285A, 4288A, 4294A, E4980A, E4981A 4291B, 4294A + 42942A, E5061B-3L5 w/Opt.
Up to 3 GHz (7 mm) 16092A Spring Clip Fixture Lead Components Description: This test fixture is designed for impedance evaluation of both lead and SMD. It is furnished with two modules that can be readily screwed onto the plate to measure either lead or SMD. Applicable Instrument: 4294A 42942A 4291B* 4287A* E4982A E5051B-3L5 with pt. E5061B-005 16201A E4991A ** hen used with 16085B* 4263B 4268A* 4279A* 4284A* 4285A 4288A* E4980A E4981A * denotes the instrument is obsolete.
Up to 3 GHz (7 mm) 16192A Parallel Electrode SMD Test Fixture SMD Description: This test fixture is designed for impedance evaluations of parallel electrode SMD. The minimum SMD size that this fixture is adapted to evaluate is 1 (L) [mm]. Applicable Instrument: 4291B* 4294A 42942A 4287A* E4982A E5061B-3L5 with pt. E50616B-005 16201A E4991A ** hen used with 16085B* 4263B 4268A* 4279A* 4284A* 4285A 4288A* E4980A E4981A * denotes the instrument is obsolete. ** applicable in a limited re uency range.
Up to 3 GHz (7 mm) Test fixture overview SMD Options: 16192A-010: Add EIA/EIAJ industrial standard sized shorting bar set 16192A-701: Add general sized shorting bar set 16192A-710: Add the magnifying lens and tweezers Compensation and Measurement: Open and short compensations are recommended in combination with the electrical length compensation before measurement. The fixture’s electrical length must be entered into the electrical length compensation function of the measurement instrument first.
Up to 3 GHz (7 mm) SMD 16194A High Temperature Component Test Fixture Description: This test fixture is designed for measuring both axial/ radial leaded devices and SMD within the temperature range from –55 to +200 °C (when used with the E4991A-007 Temperature Characteristic Test Kit, –55 to +150 °C). Applicable Instrument: 4294A 42942A 4287A* E4982A E5061B3L5 with pt.
Up to 3 GHz (7 mm) SMD Options: 16194A-010: Add EIA/EIAJ industrial standard sizedshorting bar set 16194A-701: Add general sized shorting bar set Compensation and Measurement: Before beginning the measurement, the appropriate device holder (for a SMD or lead component) must be prepared with the text fixture. The following figure shows how the device holder is exchanged to match the device type. The next step is to perform open and short compensations in combination with the electrical length compensation.
Up to 3 GHz (7 mm) 16196A Parallel Electrode SMD Test Fixture SMD Description: This test fixture is designed for impedance evaluations of parallel electrode SMDs. It achieves stable frequency characteristics up to 3 GHz and provides highly repeatable measurements. The applicable SMD size code is 0603 (inch)/1608 (mm). Applicable Instrument: 4287A* E4982A 4294A 42942A E5061B-3L5 with Opt.
Up to 3 GHz (7 mm) SMD Options: 16196A-710 : Add the magnifying lens and tweezers To maintain adequate measurement performance, keep the electrodes and the short plate in good condition. Contaminants and abrasion on these parts considerably affect measurement results, especially for low value measurements. Periodic fixture cleaning and part replacement is recommended to avoid deterioration of measurement performance.
Up to 3 GHz (7 mm) SMD Compensation and Measurement Open Compensation Short Compensation DUT Measurement Removing a DUT 39 39 dataTec ▪ Ferdinand-Lassalle-Str. 52 ▪ 72770 Reutlingen ▪ Tel. 07121 / 51 50 50 ▪ Fax 07121 / 51 50 10 ▪ info@datatec.de ▪ www.datatec.
Up to 3 GHz (7 mm) SMD 16196B Parallel Electrode SMD Test Fixture Description: This test fixture is designed for impedance evaluations of parallel electrode SMDs. It achieves stable frequency characteristics up to 3 GHz and provides highly repeatable measurements. The applicable SMD size code is 0402 (inch)/1005 (mm). Applicable Instrument: 4287A* E4982A 4294A 42942A E5061B-3L5 with Opt.
Up to 3 GHz (7 mm) SMD Options: 16196B-710: Add the magnifying lens and tweezers To maintain adequate measurement performance, keep the electrodes and the short plate in good condition. Contaminants and abrasion on these parts considerably affect measurement results, especially for low value measurements. Periodic fixture cleaning and part replacement is recommended to avoid deterioration of measurement performance.
Up to 3 GHz (7 mm) 16196C Parallel Electrode SMD Test Fixture SMD Description: This test fixture is designed for impedance evaluations of parallel electrode SMDs. It achieves stable frequency characteristics up to 3 GHz and provides highly repeatable measurements. The applicable SMD size code is 0201 (inch)/0603 (mm). Applicable Instrument: 4287A* E4982A 4294A 42942A E5061B-3L5 with Opt.
Up to 3 GHz (7 mm) SMD 16196U Maintenance Kit Opt. 16196U-010: Upper electrode, 5 piece set (common to 16196A/B/C models) Opt. 16196U-300: Short plate for 0201 (inch)/0603 (mm) size, 5 piece set (for 16196C) Opt. 16196U-310: Lower electrode, 5 piece set (for 16196C) Compensation and Measurement: Open and short compensations are recommended in combination with the electrical length compensation before measurement.
Up to 3 GHz (7 mm) 16196D Parallel Electrode SMD Test Fixture SMD Description: This test fixture is designed for impedance evaluations of parallel electrode SMDs. It achieves stable frequency characteristics up to 3 GHz and provides highly repeatable measurements. The applicable SMD size code is 01005 (inch)/0402 (mm). Applicable Instrument: 4287A* E4982A 4294A 42942A E5061B-3L5 with Opt. E5061B-005 + 16201A, E4981A * denotes the instrument is obsolete.
Up to 3 GHz (7 mm) SMD Options: 16196D-710: Add the magnifying lens and tweezers To maintain adequate measurement performance, keep the electrodes and the short plate in good condition. Contaminants and abrasion on these parts considerably affect measurement results, especially for low value measurements. Periodic fixture cleaning and part replacement is recommended to avoid deterioration of measurement performance.
Up to 3 GHz (7 mm) 16197A Bottom Electrode SMD Test Fixture SMD Description: This test fixture is designed for impedance evaluations of bottom electrode SMDs. It achieves stable frequency characteristics up to 3 GHz and provides highly repeatable measurements. This test fixture supports various SMD sizes, as small as 1005 (mm)/0402 (inch) and as large as 3225 (mm)/1210 (inch). Accommodation of the 0603 (mm)/0201 (inch) size is available with option 001.
Up to 3 GHz (7 mm) SMD EIA/EIAJ Size Shorting Bar Set (Furnished) P/N Qty. 1 x 0.5 x 0.5 (mm) Size 16191-29005 1 1.6 x 0.8 x 0.8 (mm) 16191-29006 1 2.0 x 1.2 x 0.8 (mm) 16191-29007 1 3.2 x 1.6 x 0.8 (mm) 16191-29008 1 Device Guide 16197-25007 1 Electrode Plate 16197-00604 1 P/N Qty. 16197-29001 4 16197A-001 Shorting Bar Size 0.6 x 0.3 x 0.3 (mm) Options: 16197A-001: Add 0603 (mm)/0201 (inch) Device Guide Set The 16197A’s electrode spaces are 0.5 mm, 1 mm, 1.
Up to 3 GHz (7 mm) SMD compensation function of the measurement instrument first. Next, open compensation is performed by not placing anything in the device insertion hole. Short compensation is performed by placing the furnished shorting device in the device insertion hole. After performing open and short compensations in combination with the electrical length compensation, the DUT is inserted into the device insertion hole. Once the measurement of the DUT is complete, remove the DUT from the fixture.
Up to 3 GHz (7 mm) 16200B External DC Bias Adapter DC Bias Accessories Description: This test fixture is designed to measure a DUT with DC bias. By connecting an external DC current source to the 16200B, it can supply a bias current across the DUT of up to ±5 Adc through a 7 mm port. Applicable Instruments: 4291B* 4294A 42942A 4287A* E4982A E5061B-3L5 with pt. E5061B-005 16201A E4991A ** hen used with 16085B* 4279A* 4284A* 4285A 4288A* E4980A E4981A) * denotes the instrument is obsolete.
Up to 3 GHz (7 mm) 16453A Dielectric Material Test Fixture Material Description: The 16453A is designed for accurate dielectric constant and loss tangent measurements on the E4991A. It employs the parallel plate method, which sandwiches the material between two electrodes to form a capacitor. E4991A measures the capacitance created from the fixture, and option E4991A-002 firmware calculates the relative complex permittivity. Adjustment to insure parallel electrodes is required when using the 16451B.
Up to 3 GHz (7 mm) 16454A Magnetic Material Test Fixture Material Description: The 16454A is designed for accurate permeability measurements of toroidal-shaped magnetic materials. Since the construction of this fixture creates one turn around the toroid (with no magnetic flux leakage), the need of winding a wire around the toroid is unnecessary. The following figure shows the one-turn mechanism and how complex permeability is calculated from it. Terminal Connector: 7 mm Dimensions (approx.
Up to 3 GHz (7 mm) Material Furnished Accessories: Description P/N Qty.
DC (High resistance) Test Fixtures for DC (High Resistance) Measurements Test Fixture 16339A 16118A 16117B/C 16008B Frequency Applicable Instrument DC DC DC DC 4339B 4339B 4349B 4339B Applicable Instrument Frequency Range Up to 110 MHz (Terminal Configuration: 4-Terminal Pair) Up to 3 GHz (Terminal Configuration: 7 mm) Measurement Instruments 4263B, 4268A, 4279A, 4284A, 4285A, 4288A, 4294A, E4980A, E4981A 4291B, 4294A + 42942A, E5061B-3L5 w/Opt.
DC (High resistance) 16339A Component Test Fixture SMD & Lead Components Description: The 16339A is designed to operate specifically with 4339B. It is provided with three component modules, which are used to hold SMD, lead and various type of devices. Electrical noise effects are reduced by the employment of a shielded case. A built-in interlocking circuit enables safe high-voltage measurements. Applicable Instruments: 4339B* * denotes the instrument is obsolete.
DC (High resistance) 16118A Tweezers Test Fixture SMD Description: The 16118A is designed to operate specifically with 4339B. The tweezer’s contacts, makes it easy to hold SMD. Electrical noise effects are reduced by the employment of shieldedcables. A built-in interlocking circuit enables safe high-voltage measurements. Applicable Instruments: 4339B* * denotes the instrument is obsolete.
DC (High resistance) Other Components 16117B Low Noise Test Leads Description: The 16117B is designed to operate specifically with 4339B. With 16117B-003 wide jaw clips, it is capable of holding DUTs with large terminals. The clips can be replaced with probes (16117B-001) for measurements of small DUTs such as PC boards or IC sockets. 16117B-002 enables the construction of simple custommade test leads. Electrical noise effects are reduced by the employment of shielded-cables.
DC (High resistance) Other Components 16117C Low Noise Test Leads Description: The 16117C is designed to operate specifically with 4339B. It comes with a separate triaxial (special screw-type) female connector and a high-voltage BNC (special type) female connector, so that the terminal configuration of the 4339B can be converted to any other configuration. Therefore, custom-made test fixtures can easily be constructed. Applicable Instruments: 4339B* * denotes the instrument is obsolete.
DC (High resistance) Material 16008B Resistivity Cell Description: The 16008B is designed to operate specifically with 4339B. It is used to measure surface or volume resistance/resistivity of insulation materials. The following figures show the block diagrams of resistivity measurements.
DC (High resistance) Material Furnished Accessories: P/N Qty. Acrylic Plate Description 16008-1033 1 Operation and Service Manual 16008-90011 1 Options: 16008B-001: Add 26 & 76 mm diameter electrodes 16008B-002: Add 26 mm diameter electrode Compensation and Measurement: Using the selector switch on the 16008B, select either the volume resistivity or surface resistivity measurement configuration. Open compensation is recommended before measurement and when the measurement configuration is switched.
Other Accessories 16190B Performance Test Kit Description: The 16190B is a performance test kit designed to verify the impedance measurement accuracy of LCR meters or impedance analyzers that have a 7 mm measurement terminal. Refer to the instrument’s operation/service manual for the method of using these standards. Applicable Instrument: E4991A E4982A 4287A* 4291B* 4294A 42942A * denotes the instrument is obsolete. Furnished Accessories: Description P/N Qty.
Other Accessories 16380A Standard Capacitor Set Description: The 16380A is a standard capacitor set consisting of four precision capacitors -1 pF (16381A), 10 pF (16382A) 100 pF (16383A), 1000 pF (16384A). These capacitors are primarily used for performance tests of Agilent’s 4-Terminal Pair LCR meters and impedance analyzers. Refer to the instrument’s operation/service manual for the method of using these standards.
Other Accessories 16380C Standard Capacitor Set Description: The 16380C is a standard capacitor set consisting of three precision capacitors -0.01 µF (16385A), 0.1 µF (16386A), and 1 µF (16387A). These capacitors are primarily used for performance tests of Agilent’s 4-Terminal Pair LCR meters and impedance analyzers. Refer to the instrument’s operation/service manual for the method of using these standards.
Other Accessories 42030A Four-Terminal Pair Standard Resistor Set Description: The 42030A is a standard resistor set consisting of nine precision resistor standards which range from 1 mΩ to 100 kΩ. These resistors are primarily used for performance tests of Agilent’s 4-Terminal Pair LCR meters and impedance analyzers. Refer to the instrument’s operation/service manual for the method of using these standards.
Other Accessories 42090A Open Termination Description: The 42090A is an open termination and is primarily used for performance tests of Agilent’s 4-Terminal Pair LCR meters and impedance analyzers. Refer to the instrument’s operation/service manual for the method of using this standard. Applicable Instrument: 4263B 4268A* 4279A* 4284A* 4285A 4288A* 4294A E4980A E4981A * denotes the instrument is obsolete. Terminal Connector: 4-Terminal Pair, BNC Dimensions (approx.
Appendix Additional Error The Concept of a Test Fixture’s Additional Error 1. System Configuration for Impedance Measurement Frequently the system configured for impedance measurements uses the following components. 1. Impedance measurement instrument 2. Cables and adapter interfaces 3. Test fixture System configuration for impedance measurement The impedance measurement instrument’s accuracy is defined at the measurement port of the instrument.
Appendix Additional Error The equation for the test fixture’s additional error is shown below: e A s/ o• De = Ze/100 (D ≤ 0.
Appendix Additional Error 2.3 Open Offset Error: The term, Yo Zx 100 is called open offset error. If Zx is multiplied to this term, then ∆Y = Yo. This term affects the absolute admittance error, by adding an offset. Open repeatability, Yo, is determined from the variations in multiple admittance measurements of the test fixture in open condition. After performing open compensation, the measured values of the open condition will distribute around 0 S in the complex admittance plane.
Appendix Additional Error 3.2 DUT Connection Configuration: In order to make short repeatability small, there are test fixtures that use the 4T connection configuration (for example, Agilent 16044A). By employing this technique, the effect of contact resistance is reduced and short repeatability is significantly improved. As a result, the range of accurate low impedance measurements is expanded down to a low milliohm region.
3.3 Test Fixture’s Adaptability for a Particular Measurement: In order to make use of what has been discussed previously, the test fixture’s adaptability for a particular measurement will be discussed. To see whether a test fixture is adaptable, it is important to think about the test fixture’s additional error (proportional error, short repeatability, and open repeatability), measurement impedance, and the test frequency range.
Appendix Additional Error Measurement Settings Measurement Instrument Measurement Frequency Measurement Parameter Compensation Bandwidth Measurement Method Display Method : : : : : : 4294A 40 Hz-10 MHz ZPerformed short Compensation 3 Inserted the shorting plate, measured the short condition, and then removed the shorting plate. Repeated this for 50 times.
Appendix Compensation Error Compensation Agilent measurement instruments incorporate one of the following four types of error compensation functions to eliminate residual impedance effects in test fixtures: 1. Open/short Compensation For a simple measurement system, represented by the equivalent circuit model shown below, residual impedance values Rs and Ls and admittance values Co and Go can be corrected by: (i) Measuring open condition for the test fixture’s admittance.
Appendix Compensation 3. Electrical Length Compensation In a single-port (Two-Terminal) impedance measurement at higher frequencies (RF region or higher), the wavelengths of the electrical signal are so short that the length of the signal transmission line including the test fixture and cables can cause an undesirable phase shift error. The phase shift error is corrected by the electrical length compensation, which should be performed in combination with the open/short compensation.
Appendix Compensation 4. Cable Length Compensation When the test sample is measured with an instrument having a Four-Terminal Pair configuration, the additional length of the test-lead extension between the instrument and the test sample, in conjunction with the measurement frequency, influences the amplitude and phase of the signal being measured.
Index Model Number Name Applicable Measurement Instrument (s) Page (s) 16008B Resistivity Cell 4339B 58-59 16034E SMD/Chip Test Fixture 4263B, 4268A, 4279A, 4284A, 4285A, 4288A, 4294A, E4980A, E4981A E5061B-3L5 (w/Option 005) 12 16034G SMD/Chip Test Fixture, Small refer to 16034E 13 16034H SMD/Chip Test Fixture, General refer to 16034E 14 16044A SMD/Chip Test Fixture, Four-Terminal, 10 MHz 4263B, 4268A, 4279A, 4284A, 4285A, 4288A, 4294A, E4980A, E4981A 15-16 16047A Axial and Radial
Index Test Fixture Selection By SMD Size 75 75 dataTec ▪ Ferdinand-Lassalle-Str. 52 ▪ 72770 Reutlingen ▪ Tel. 07121 / 51 50 50 ▪ Fax 07121 / 51 50 10 ▪ info@datatec.de ▪ www.datatec.
Ihr Spezialist für Mess- und Prüfgeräte Index Accessories vs.
