Technical data

Module 13
SPGU Control and Applications
13-5
Pulse Switch
High Voltage SPGU
Erase
OPEN
Gate
Drain
SMU
Source
SMU
Substrate
CLOSE
Write
Gate
Drain
SMU
Source
SMU
Substrate
CLOSE
CLOSE
OPEN
Pulse period
Write
Erase
The pulse switch is the built-in high speed analog switch to open/close the SPGU output for each
channel. This switch is used in the write/erase cycle of the NOR type flash memory cell test. This
dramatically improves throughput of the endurance test (write/erase lifetime reliability test). The
SPGU channel can output the drain pulse for the write operation and make the open status for the
erase operation in one pulse period.