Technical data

Agilent 41000 Administration Guide, Edition 3 3- 3
Using Agilent iPACE Verification Tool
NOTE Agilent 41000 Measurement Record of Integrity Verification
Keep the Agilent 41000 Measurement Record of Integrity Verification report. The report
shows the following data measured at the factory. The values shown below are just sample.
• Noise/Offset Record
#Source, Input, Slot, Output, IOffset[A], Noise[Sigma]
SMU1, 1, 1, 1, -2.115E-13, 8.01234E-15
• IOffset[A]: Averaging value of the all data of the offset current measurement result.
• Noise[Sigma]: Standard deviation value of the all data of the offset current
measurement result.
• Settling/Leakage Record
#Source, Input, Slot, Output, ILeak[A], Vstep[V], ISettl(1s)[A],
ISettl(10s)[A]
SMU1, 1, 1, 1, -1.538E-13, 10, -2.55E-13, -2.20E-13
• ILeak[A]: Averaging value of the last 10 data of the leakage current measurement
result.
• ISettl(1s)[A]: Current measurement value of the first data measured after 1 second
passed from the measurement start.
• ISettl(10s)[A]: Current measurement value of the first data measured after 10
second passed from the measurement start.
The report does not guarantee the measurement ability of the Agilent 41000. The data is
not the specifications.