Technical data

Agilent 41000 Administration Guide, Edition 3 1- 3
Introduction
Product Overview
Product Overview
Agilent 41000 series Integrated Parametric Analysis and Characterization Environment
(Agilent iPACE) is developed to realize the full 1 femtoamp measurement potential of the
semiconductor parameter analyzer through a switching matrix, probe card interface, and
probe card without any loss in measurement performance. The Agilent 41000 solutions
work with the 4155C, 4156C, or E5270B, and are available in both positioner and probe
card-based versions. See
Table 1-1. These solutions include configurations for a variety of
measurement needs along with flexibility for future expansion.
For the expanded measurement requirements, you may add the other instruments, such as
digital voltmeters, pulse generators, and network analyzer. Also, you may use your own
test shell instead of the Agilent I/CV software that is the standard software used to control
the standard hardware (instruments) of the Agilent 41000.
Figure 1-1 Agilent 41000 Product Image
In Figure 1-1, the Agilent 41000 contains the system cabinet, the instruments in the
cabinet, and the probe card interface that is placed on the auto prober. The auto prober is
not included in the Agilent 41000.