Technical data

Agilent 41000 Administration Guide, Edition 3 6- 3
Probe Card Interface
Product Overview
Product Overview
Agilent B2220A probe card interface is designed for testing semiconductor devices on the
wafer placed on a semi-auto prober or a full-auto prober. The Agilent B2220A functions as
the interface between a probe card and semiconductor parametric measurement
instruments such as the Agilent 4155C/4156C Semiconductor Parameter Analyzer, Agilent
B2200 Switching Matrix, and so on.
Product image and option configuration are shown in Figure 6-1 and Table 6-1. The
Agilent B2220A provides 24 or 48 input/output paths.
Table 6-1 Product Configurations
Figure 6-1 Product Image
Option Item Description
B2220A-024 24 inputs/outputs configuration
Inputs: 24 triaxial connectors.
Outputs: 24 pairs of contact pins.
Input/output labels: Even numbers from 2 to 48.
B2220A-048 48 inputs/outputs configuration
Inputs: 48 triaxial connectors.
Outputs: 48 pairs of contact pins.
Input/output labels: Integer numbers from 1 to 48.
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