User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities

Agilent B1500 User’s Guide, Edition 7 2- 43
Introduction
Specifications
Table 2-21 Voltage range, resolution, and accuracy (high speed ADC)
Table 2-22 Current range, resolution, and accuracy
(high speed ADC)
Range
Force
resolution
Measurement
resolution
Force accuracy
±(%+m
V)
a
a. ±(% of output/measured value + offset value in mV)
Measurement accuracy
±(%+mV)
a
Maximum
current
±2 V 100 μV 2 μV ±(
0.018 + 0.4) ±(0.0
1 + 0.7) 1 A
±20 V 1 mV 20 μV ±(0.018 + 3) ±(0.01 + 4) 1 A
±40 V 2 mV 40 μV ±(0.018 + 6) ±(0.015 + 8) 500 mA
±100 V 5 mV 100 μV ±(0.018 + 15) ±(0.02 + 20) 125 mA
±200 V 10 mV 200 μV ±(0.018 + 30) ±(0.035 + 40) 50 mA
Range
Force
resolut
ion
Measurement
resolution
Force accuracy ±(%+A+A)
a
a. ±(% of output/measured value + fixed offset in A + proportional offset in A), Vo is the output
voltage in V.
Measurement accuracy
±(%+A+A)
a
Maximum
voltage
±1 nA 50 fA 10 fA
±(0.1+3E
-13
+Vo×1E
-15
) ±(0.25+3E
-13
+Vo×1E
-15
)
200 V
±10 nA 500 fA 10 fA
±(0.1+3E
-12
+Vo×1E
-14
) ±(0.25+2E
-12
+Vo×1E
-14
)
200 V
±100 nA 5 pA 100 fA
±(0.05+3E
-11
+Vo×1E
-13
) ±(0.1+2E
-11
+Vo×1E
-13
)
200 V
±1 μA 50 pA 1 pA
±(0.05+3E
-10
+Vo×1E
-12
) ±(0.1+2E
-10
+Vo×1E
-12
)
200 V
±10 μA 500 pA 10 pA
±(0.05+3E
-9
+Vo×1E
-11
) ±(0.05+2E
-9
+Vo×1E
-11
)
200 V
±100 μA 5 nA 100 pA
±(0.035+15E
-9
+Vo×1E
-10
) ±(0.05+2E
-8
+Vo×1E
-10
)
200 V
±1 mA 50 nA 1 nA
±(0.04+15E
-8
+Vo×1E
-9
) ±(0.04+2E
-7
+Vo×1E
-9
)
200 V
±10 mA 500 nA 10 nA
±(0.04+15E
-7
+Vo×1E
-8
) ±(0.04+2E
-6
+Vo×1E
-8
)
200 V
±100 mA 5 μA 100 nA
±(0.045+15E
-6
+Vo×1E
-7
) ±(0.1+2E
-5
+Vo×1E
-7
)
b
b. 200 V (Io ≤ 50 mA), 100 V (50 mA < Io ≤ 125 mA), 40 V (125 mA < Io ≤ 500 mA),
20 V (500 mA < Io ≤ 1 A), Io is the output current.
±1 A 50 μA 1 μA
±(0.4+3E
-4
+Vo×1E
-6
) ±(0.5+3E
-4
+Vo×1E
-6
)