User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities

2- 28 Agilent B1500 User’s Guide, Edition 7
Introduction
Measurement Units
B1520A Multi Frequency CMU
This section describes typical specification of the multi frequency capacitance
measurement unit (CMU) for Agilent B1500A. The CMU performs the impedance
measurement and returns the specified measurement data such as Cp-G. Only one
module can be installed in one mainframe.
• Measurement parameters: See Table 2-13.
All measurement parameters are supported by Agilent B1500A in the GPIB
remote mode. H
owever, Agilent EasyEXPERT software supports the Cp-G,
Cp-D, Cs-Rs, and Z-θ measurements only.
• AC signal, output frequency:
1 kHz to 5 MHz
Setting resolution: 1 mHz (1 kHz to), 10 mHz (10 kHz to), 0.1 Hz (100 kHz to),
or 1 Hz
(1 MHz to 5 MHz)
• AC signal, output level:
10 mVrms to 250 mVrms, 1 mV resolution
•DC bias:
0 to ± 100 V
Setting resolution: 1 mV (0 to ± 25 V) or 5 mV (to ± 100 V)
DC bias > ± 25 V is available when using the SMU CMU unify unit (SCUU).
• Measurement range:
For the fixed ranging mode, measurement ran
ge (imp
edance range) must be
specified to perform measurement. Table 2-14 shows the available measurement
ranges and the corresponding impedance value. And Figure 2-6 shows the
calculation example of the imped
ance vs frequ
ency characteristics of a
capacitive load. Use these information to decide the measurement range.
Impedance Z is calcul
ated by the following formula.
Z = 1 / (2π f C)
where f is frequency (Hz) an
d C is capacitance (F).