User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities

10-66 Agilent B1500 User’s Guide, Edition 7
Application Library and Utilities
Utility Programs
Table 10-16 Export Data Components for Application Test Result
Label Description Example (csv output)
SetupTitle Title of this test setup Trng_Id_Vd
ApplicationTest Setup name of this application test Trng_Id_Vd, Public
TestParameter Two rows. The upside is for the test parameter
names. The downside is for the test parameter
values. Order sensitive. For example, Vd=0.1 in
Example.
Name, VdStart, VdStop,
VdStep, VgStart, VgStop,
VgStep, Vs
Value, 0, 3, 0.06, 1, 2, 0.5, 0
DutParameter Two rows. The upside is for the device parameter
names. The downside is for the device parameter
values. Order sensitive. For example, Temp=25 in
Example.
Name, Polarity, Lg, Wg, Temp,
IdMax
Value, 1, 1.00E-07, 1.00E-05,
25, 0.005
MetaData Data for system use. Test record entry point,
record time, test target, iteration index,
preservation, flag, remarks, and link key.
TestRecord.EntryPoint, true
AnalysisSetup Parameter name and setup value of the data
display and analysis setup.
Data file contains a lot of rows for
AnalysisParameter. One setup item per row.
Analysis.Setup.Vector.Graph.E
nabled, true
Dimension1 Size of data variable. For dimension 1. Order
sensitive. 51 for all data variables in Example.
51, 51, 51, 51, 51
Dimension2 Size of data variable. For dimension 2. Order
sensitive. 1 for all data variables in Example.
3, 3, 3, 3, 3
DataName Measurement parameter names or data variable
names. Order sensitive. For example, Vgate=-0.5
in Example.
Vd, Vg, Index, Time, Id
DataValue Measurement result data. Order sensitive. For
example, Vgate=-0.5 in Example.
Data file contains a lot of rows for DataValue.
One data set per row.
0, 1, 1, 0.00251, 0