User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities

Agilent B1500 User’s Guide, Edition 7 10-61
Application Library and Utilities
Utility Programs
Filter File Modification Example
This section explains the modification example of a filter file. In this example, a
filter file of group 5 is used.
The group 5 filter files will export the data that contains the test setup information.
To obtain the data without the setup information, modify the filter file as shown
below, also see Figure 10-31, and export data by using the filter file after
modification.
The data will not contain the TestParameter, DutParameter, MetaData, and
AnalysisSetup of the Application test result record, and the TestParameter,
MetaData, and AnalysisSetup of the Classic test result record.
1. Modify the following template elements for sta:TestParameterList to
sta:TerminalList as shown below.
<xsl:template match="sta:TestParameterList">
</xsl:template>
<xsl:template match="sta:DutParameterList">
</xsl:template>
<xsl:template match="sta:AnalysisParameterList">
</xsl:template>
<xsl:template match="sta:MetaData/sta:ParameterList">
</xsl:template>
<xsl:template match="sta:TerminalList">
<xsl:apply-templates />
</xsl:template>
2. Comment out the whole of the following template element.
<!--
<xsl:template match="sta:Parameter">
: : : : : : : : :
</xsl:template>
-->
Exported data examples of Classic test result record are shown in Table 10-12 and
Table 10-13.
Table 10-14 explains the reference name used in the filter file and shows the relation
to the parameter name used in the data file exported by using the filter file.