User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities

10-58 Agilent B1500 User’s Guide, Edition 7
Application Library and Utilities
Utility Programs
Table 10-7 XSLT Filter Files
Group File name Description
1 • meas-csv.xsl
• meas-tab-sv.xsl
• meas-xmlss.xsl
Filter files for exporting the measurement data only
Classic test record export example is shown in Table 10-8.
2 • meas-index-csv.xsl
• meas-index-tab-sv.xsl
• meas-index-xmlss.xsl
Filter files for exporting the measurement data with the index
Classic test record export example is shown in Table 10-9.
3 • meas-meta-csv.xsl
• meas-meta-tab-sv.xsl
• meas-meta-xmlss.xsl
Filter Files for exporting the measurement data with the meta
data
The meta data contains the test name, the setup name, the
record time of the test results, the device ID, the counter
number, the flag of the test results, and the remarks on the test
results.
Classic test record export example is shown in Table 10-10.
4 • meas-index-meta-csv.xsl
• meas-index-meta-tab-sv.xsl
• meas-index-meta-xmlss.xsl
Filter files for exporting the measurement data with the index
and the meta data
The meta data contains the test name, the setup name, the
record time of the test results, the device ID, the counter
number, the flag of the test results, and the remarks on the test
results.
Classic test record export example is shown in Table 10-11.
5•csv.xsl
(used by the Export As
CSV... (p. 4-16)
function)
•tab-sv.xsl
•xmlss.xsl
(used by the Export As
XML Spread Sheet... (p.
4-16) function)
Filter files for exporting all data including the test setup
Application test record export example is shown in Table
10-12. Data in the first cell is the label for the data components
in that row. The following cells are the data corresponding to
the label. Table 10-15 and Table 10-16 list the components
available for the exported data file.