User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities

Agilent B1500 User’s Guide, Edition 7 10-23
Application Library and Utilities
QSCV Measurement Supplemental Data
Table 10-5 Conditions for Calculating Measurement Accuracy
Calculation example data shown in Figure 10-6 through Figure 10-30 is applied to
the measurement data when the QSCV integration time is set to the same value as
the LEAK integration time.
Conditions
Measurement
unit:
HRSMU/ASU
Measurement
range
QSCV
operating mode
Output
range
Equivalent
parallel
resistance of
DUT
Guard
capacitance of
measurement
path
10 pA Normal 20 V 10 T ohm 200 pF Figure 10-6
100 pA Normal 20 V 10 T ohm 200 pF Figure 10-7
Normal 20 V 10 T ohm 1 nF Figure 10-8
Normal 20 V 100 G ohm 200 pF Figure 10-9
1 nA Normal 20 V 10 T ohm 200 pF Figure 10-10
Normal 20 V 10 T ohm 1 nF Figure 10-11
Normal 20 V 10 G ohm 200 pF Figure 10-12
Normal 20 V 1 G ohm 200 pF Figure 10-13
10 nA Normal 20 V 10 T ohm 200 pF Figure 10-14
Normal 20 V 10 G ohm 200 pF Figure 10-15
Normal 20 V 1 G ohm 200 pF Figure 10-16
100 nA Normal 20 V 10 T ohm 200 pF Figure 10-17
Normal 20 V 1 G ohm 200 pF Figure 10-18
Normal 20 V 100 M ohm 200 pF Figure 10-19
Normal 20 V 10 M ohm 200 pF Figure 10-20
1 μA Normal 20 V 10 T ohm 200 pF Figure 10-21
Normal 20 V 1 G ohm 200 pF Figure 10-22
Normal 20 V 100 M ohm 200 pF Figure 10-23
Normal 20 V 10 M ohm 200 pF Figure 10-24
10 pA 4155C/4156C
compatible
20 V 10 T ohm 200 pF Figure 10-25
100 pA 20 V 10 T ohm 200 pF Figure 10-26
1 nA 20 V 10 T ohm 200 pF Figure 10-27
10 nA 20 V 10 T ohm 200 pF Figure 10-28
100 nA 20 V 10 T ohm 200 pF Figure 10-29
1 μA 20 V 10 T ohm 200 pF Figure 10-30