User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities
Agilent B1500 User’s Guide, Edition 7 10-13
Application Library and Utilities
QSCV Measurement Supplemental Data
QSCV Measurement Supplemental Data
This section provides the following supplemental data of the QSCV measurement.
You can perform the QSCV measurement by using the QSCV[2] application test.
• “Maximum Measurement Value”
• “Considering Measurement Accuracy”
NOTE To obtain stable QSCV measurement results, use two source monitor units (SMU).
Assign the current meter and the voltage sweep source to the individual SMU.
Maximum Measurement Value
NOTE The maximum measurement value is not the specifications but the reference data.
Even if the capacitance is within this range, measurement may not be completed due
to influences on the measurement path such as extension cables, etc. The maximum
measurement value will be smaller depending on the leakage current.
The maximum measurement value depends on the settings of the current
measurement range, the QSCV measurement voltage, and the integration time. See
Figure 10-1 to Figure 10-5. Each figure shows the characteristics of the capacitance
value vs. the QSCV measurement voltage by the integration time setting. Each line
in the graph specifies the maximum measurement value for each integration time
setting.
The graph data is applied to the measurement when the QSCV integration time is set
to the same value as the LEAK integration time.