User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities
10-12 Agilent B1500 User’s Guide, Edition 7
Application Library and Utilities
Application Test Definitions
NOTE If you delete a test definition
Application library should be recovered. Import the test definition by using the
Import Test Definition... function of the Library button. The original test definitions
are stored in the following folder.
C:\Program Files\Agilent\B1500\EasyEXPERT\Application Tests
Utility Measure Diff-V B1500A,4155B/C,4156B/C 3458A 1
QSCV C Offset Meas B1500A SMU 2
ResetPG B1500A,4155B/C,4156B/C 81110A (2 outputs) 1
Subsite move B1500A,4155B/C,4156B/C Wafer prober 1
CVSweep4284_a B1500A,4155B/C,4156B/C 4284A 1 or E4980A 1
WGFMU
(needs test
definitions of
WGFMU
Utility)
Fast BTI(ACstress Id-Sampling) B1500A WGFMU 1, RSU 2
Fast BTI(DCstress Id-Sampling) B1500A WGFMU 1, RSU 2
Fast BTI(ACstress Id-Vg) B1500A WGFMU 1, RSU 2
Fast BTI(DCstress Id-Vg) B1500A WGFMU 1, RSU 2
TRANSIV DC IdVd B1500A SMU 2, WGFMU 1, RSU 2
TRANSIV DC IdVg B1500A SMU 2, WGFMU 1, RSU 2
WGFMU Pattern Editor B1500A WGFMU 1, RSU 2
WGFMU
Utility
(cannot be
executed
directly)
Fast BTI Id-Sampling child B1500A WGFMU 1, RSU 2
Fast BTI Id-Sampling child2 B1500A WGFMU 1, RSU 2
Fast BTI Id-Vg child B1500A WGFMU 1, RSU 2
Fast BTI Id-Vg child2 B1500A WGFMU 1, RSU 2
Fast BTI Pattern Editor Child
DataDisplay
B1500A WGFMU 1, RSU 2
Category Test definition name Supported analyzer Required equipment and quantity