User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities
Agilent B1500 User’s Guide, Edition 7 10-11
Application Library and Utilities
Application Test Definitions
Structure Diode BVAndCj-V ASU B1500A MFCMU 1, HRSMU/ASU 2
Diode BVAndCj-V SCUU B1500A MFCMU 1, SMU 2, SCUU 1, GSWU 1
Ig-Vg Iforce B1500A,4155B/C,4156B/C SMU 2
Ig-Vg Vforce B1500A,4155B/C,4156B/C SMU 2
Interconnect CouplingCap B1500A MFCMU 1
Interconnect OverlapCap B1500A MFCMU 1
Junction BV B1500A,4155B/C,4156B/C SMU 2
Junction DcParam B1500A,4155B/C,4156B/C SMU 2
Junction IV Fwd B1500A,4155B/C,4156B/C SMU 2
Junction IV Rev B1500A,4155B/C,4156B/C SMU 2
QSCV[2] B1500A SMU 3
QSCV C Offset Meas B1500A SMU 2
Rdiff-I kelvin B1500A SMU 5
Rdiff-I B1500A,4155B/C,4156B/C SMU 3
Rdiff-V kelvin B1500A SMU 5
Rdiff-V B1500A,4155B/C,4156B/C SMU 3
R-I DVM B1500A SMU 2, 3458A 1
R-I kelvin B1500A,4155B/C,4156B/C SMU 4
R-I B1500A,4155B/C,4156B/C SMU 2
R-V DVM B1500A SMU 2, 3458A 1
R-V kelvin B1500A,4155B/C,4156B/C SMU 4
R-V B1500A,4155B/C,4156B/C SMU 2
VanDerPauw Square B1500A,4155B/C,4156B/C SMU 4
TFT TFT Id-Vd B1500A,4155B/C,4156B/C SMU 3
TFT Id-Vg B1500A,4155B/C,4156B/C SMU 3
Utility ForcePG1 B1500A,4155B/C,4156B/C 81110A (2 outputs) 1
ForcePG2 B1500A,4155B/C,4156B/C 81110A (2 outputs) 1
ForcePG2P B1500A,4155B/C,4156B/C 81110A (2 outputs) 1
ForcePG12 B1500A,4155B/C,4156B/C 81110A (2 outputs) 1
ForcePG B1500A,4155B/C,4156B/C 81110A (2 outputs) 1
ForcePGC B1500A,4155B/C,4156B/C 81110A (2 outputs) 1
Category Test definition name Supported analyzer Required equipment and quantity