User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities
10-10 Agilent B1500 User’s Guide, Edition 7
Application Library and Utilities
Application Test Definitions
Reliability EM Istress[2] B1500A SMU 2
EM Istress2[2] B1500A SMU 2
EM Istress[6] B1500A SMU 6
EM Istress2[6] B1500A SMU 6
EM Vstress B1500A SMU 4
EM Vstress2 B1500A SMU 4
EM Vstress[2] B1500A SMU 2
EM Vstress2[2] B1500A SMU 2
EM Vstress[6] B1500A SMU 6
EM Vstress2[6] B1500A SMU 6
HCI 3devices B1500A SMU 8
HCI B1500A SMU 4
HCI2 B1500A SMU 4
J-Ramp B1500A SMU 2
TDDB Istress 3devices B1500A SMU 4
TDDB Istress2 3devices B1500A SMU 4
TDDB Istress B1500A SMU 2
TDDB Istress2 B1500A SMU 2
TDDB Vstress 3devices B1500A SMU 4
TDDB Vstress2 3devices B1500A SMU 4
TDDB Vstress B1500A SMU 2
TDDB Vstress2 B1500A SMU 2
Timing On-the-fly NBTI B1500A SMU 4
TZDB B1500A SMU 2
V-Ramp B1500A SMU 2
Structure BVgb ThinOx B1500A,4155B/C,4156B/C SMU 2
BVgb B1500A,4155B/C,4156B/C SMU 2
Cgb-Freq[2] Log B1500A MFCMU 1
Cgb-Vg 2Freq B1500A MFCMU 1
Cgb-Vg[2] B1500A MFCMU 1
Cj-Freq Log B1500A MFCMU 1
Cj-V B1500A MFCMU 1
Category Test definition name Supported analyzer Required equipment and quantity