User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities
Agilent B1500 User’s Guide, Edition 7 10-9
Application Library and Utilities
Application Test Definitions
NanoTech CNT Id-Vd B1500A,4155B/C,4156B/C SMU 4
CNT Id-Vg B1500A,4155B/C,4156B/C SMU 4
CNT Id-Vg-Time B1500A,4156B/C SMU 4
CNT IV Sweep B1500A,4155B/C,4156B/C SMU 2
CNT R-I Kelvin 2SMU B1500A,4155B/C,4156B/C SMU 2
CNT R-V Kelvin 2SMU B1500A,4155B/C,4156B/C SMU 2
CNT Vth gmMax B1500A,4155B/C,4156B/C SMU 4
PwrDevice BVdss[3] PwrDevice B1500A SMU 3
BVgso[3] PwrDevice B1500A SMU 2
Id-Vd pulse[3] PwrDevice B1500A SMU 3
Id-Vd[3] PwrDevice B1500A SMU 3
Id-Vg pulse[3] PwrDevice B1500A SMU 3
Id-Vg[3] PwrDevice B1500A SMU 3
Vth Const Id[3] PwrDevice B1500A SMU 3
Vth gmMax[3] PwrDevice B1500A SMU 3
Reliability BJT EB RevStress 3devices B1500A SMU 6, B2200A/B2201A 1
BJT EB RevStress 3devices[3] B1500A SMU 5, B2200A/B2201A 1
BJT EB RevStress B1500A SMU 4
BJT EB RevStress2 B1500A SMU 4
BJT EB RevStress[3] B1500A SMU 3
BJT EB RevStress2[3] B1500A SMU 3
BTI 3devices B1500A SMU 5, B2200A/B2201A 1
BTI 3devices[3] B1500A SMU 5, B2200A/B2201A 1
BTI B1500A SMU 4
BTI2 B1500A SMU 4
BTI[3] B1500A SMU 3
BTI2[3] B1500A SMU 3
Charge Pumping B1500A SMU 2, 81110A (2 outputs) 1
Charge Pumping2 B1500A SMU 2, SPGU 1
EM Istress B1500A SMU 4
EM Istress2 B1500A SMU 4
Category Test definition name Supported analyzer Required equipment and quantity