User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities
10-8 Agilent B1500 User’s Guide, Edition 7
Application Library and Utilities
Application Test Definitions
Memory NorFlash
Vth(ErasingTimeDependence)
B1500A [SPGU 1, SMU 2, HRSMU/ASU 2] or
[SPGU 1, SMU 4, 16440A/16445A 1]
NorFlash
Vth(WritingTimeDependence)
B1500A [SPGU 1, SMU 2, HRSMU/ASU 2] or
[SPGU 1, SMU 4, 16440A/16445A 1]
NorFlash
WordDisturb(ErasedCell)
B1500A [SPGU 1, SMU 2, HRSMU/ASU 2] or
[SPGU 1, SMU 4, 16440A/16445A 1]
NorFlash
WordDisturb(WrittenCell)
B1500A [SPGU 1, SMU 2, HRSMU/ASU 2] or
[SPGU 1, SMU 4, 16440A/16445A 1]
NorFlash
DataDisturb(ErasedCell)
B1500A [SPGU 2, SMU 1, HRSMU/ASU 3] or
[SPGU 2, SMU 4, 16440A/16445A 2]
NorFlash
DataDisturb(WrittenCell)
B1500A [SPGU 1, SMU 2, HRSMU/ASU 2] or
[SPGU 1, SMU 4, 16440A/16445A 1]
MixedSignal BJT Varactor CV Mismatch B1500A MFCMU 1
Diff-R Mismatch B1500A SMU 8
Diode IV Fwd Mismatch B1500A SMU 3
Diode IV Rev Mismatch B1500A SMU 3
G-Plot ConstVce Mismatch B1500A SMU 6
G-Plot ConstVce Mismatch[3] B1500A SMU 5
G-Plot Vbc=0V Mismatch B1500A SMU 6
G-Plot Vbc=0V Mismatch[3] B1500A SMU 5
Ic-Vc Ib Mismatch B1500A SMU 6
Ic-Vc Ib Mismatch[3] B1500A SMU 5
Ic-Vc Vb Mismatch B1500A SMU 6
Ic-Vc Vb Mismatch[3] B1500A SMU 5
Id-Vd Mismatch B1500A SMU 5
Id-Vd Mismatch[3] B1500A SMU 4
Id-Vg Mismatch B1500A SMU 5
Id-Vd Mismatch[3] B1500A SMU 4
MIM CV Mismatch B1500A MFCMU 1
MOS Varactor CV Mismatch B1500A MFCMU 1
Poly-R Mismatch B1500A SMU 7
NanoTech CNT Differential R[AC] B1500A MFCMU 1
CNT Gate Leak B1500A,4155B/C,4156B/C SMU 2
CNT Id-Time B1500A,4156B/C SMU 4
Category Test definition name Supported analyzer Required equipment and quantity