User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities
Agilent B1500 User’s Guide, Edition 7 10-7
Application Library and Utilities
Application Test Definitions
Memory NandFlash2
Retention(WrittenCell)
B1500A SMU 2, HRSMU/ASU 1, 81110A (2
outputs) 1
NandFlash2
Vth(ErasingTimeDependence)
B1500A SMU 1, HRSMU/ASU 2, 81110A (2
outputs) 1
NandFlash2
Vth(WritingTimeDependence)
B1500A SMU 2, HRSMU/ASU 1, 81110A (2
outputs) 1
NandFlash2
WordDisturb(ErasedCell)
B1500A HRSMU/ASU 3, 81110A (2 outputs) 1
NandFlash2
WordDisturb(WrittenCell)
B1500A SMU 2, HRSMU/ASU 1, 81110A (2
outputs) 1
NandFlash3 Endurance B1500A [SPGU 1, HRSMU/ASU 3] or
[SPGU 1, SMU 3, 16440A/16445A 2]
NandFlash3 IV-Erase-IV B1500A [SPGU 1, SMU 1, HRSMU/ASU 2] or
[SPGU 1, SMU 3, 16440A/16445A 1]
NandFlash3 IV-Write-IV B1500A [SPGU 1, SMU 2, HRSMU/ASU 1] or
[SPGU 1, SMU 3, 16440A/16445A 1]
NandFlash3
Retention(ErasedCell)
B1500A [SPGU 1, SMU 1, HRSMU/ASU 2] or
[SPGU 1, SMU 3, 16440A/16445A 1]
NandFlash3
Retention(WrittenCell)
B1500A [SPGU 1, SMU 2, HRSMU/ASU 1] or
[SPGU 1, SMU 3, 16440A/16445A 1]
NandFlash3
Vth(ErasingTimeDependence)
B1500A [SPGU 1, SMU 1, HRSMU/ASU 2] or
[SPGU 1, SMU 3, 16440A/16445A 1]
NandFlash3
Vth(WritingTimeDependence)
B1500A [SPGU 1, SMU 2, HRSMU/ASU 1] or
[SPGU 1, SMU 3, 16440A/16445A 1]
NandFlash3
WordDisturb(ErasedCell)
B1500A [SPGU 1, HRSMU/ASU 3] or
[SPGU 1, SMU 3, 16440A/16445A 2]
NandFlash3
WordDisturb(WrittenCell)
B1500A [SPGU 1, SMU 2, HRSMU/ASU 1] or
[SPGU 1, SMU 3, 16440A/16445A 1]
NorFlash Endurance B1500A [SPGU 2, SMU 1, HRSMU/ASU 3] or
[SPGU 2, SMU 4, 16440A/16445A 2]
NorFlash IV-Erase-IV B1500A [SPGU 1, SMU 2, HRSMU/ASU 2] or
[SPGU 1, SMU 4, 16440A/16445A 1]
NorFlash IV-Write-IV B1500A [SPGU 1, SMU 2, HRSMU/ASU 2] or
[SPGU 1, SMU 4, 16440A/16445A 1]
NorFlash Retention(ErasedCell) B1500A [SPGU 1, SMU 2, HRSMU/ASU 2] or
[SPGU 1, SMU 4, 16440A/16445A 1]
NorFlash Retention(WrittenCell) B1500A [SPGU 1, SMU 2, HRSMU/ASU 2] or
[SPGU 1, SMU 4, 16440A/16445A 1]
Category Test definition name Supported analyzer Required equipment and quantity