User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities
10-6 Agilent B1500 User’s Guide, Edition 7
Application Library and Utilities
Application Test Definitions
CMOS Id-Vg[3] B1500A,4155B/C,4156B/C SMU 3
IonIoffSlope B1500A,4155B/C,4156B/C SMU 4
Isub-Vg B1500A,4155B/C,4156B/C SMU 4
QSCV[4] B1500A SMU 5
QSCV C Offset Meas B1500A SMU 2
Simple Cgb B1500A MFCMU 1
Simple Vth B1500A,4155B/C,4156B/C SMU 4
Vth Const Id B1500A,4155B/C,4156B/C SMU 4
Vth gmMax B1500A,4155B/C,4156B/C SMU 4
VthAndCgg-Vg ASU B1500A MFCMU 1, SMU 1, HRSMU/ASU 2
VthAndCgg-Vg SCUU B1500A MFCMU 1, SMU 3, SCUU 1, GSWU 1
Vth-Lg B1500A SMU 4, B2200A/B2201A 1
Vth-Wg B1500A SMU 4, B2200A/B2201A 1
Discrete BJT GummelPlot B1500A,4155B/C,4156B/C SMU 3
BJT Ic-Vc Ib B1500A,4155B/C,4156B/C SMU 3
Diode IV Fwd B1500A,4155B/C,4156B/C SMU 2
Diode IV Rev B1500A,4155B/C,4156B/C SMU 2
FET Id-Vd B1500A,4155B/C,4156B/C SMU 3
FET Id-Vg B1500A,4155B/C,4156B/C SMU 3
GenericTest Generic C-f B1500A MFCMU 1
Generic C-t B1500A MFCMU 1
Memory Flash Ccf-V B1500A MFCMU 1
Flash Cfb-V B1500A MFCMU 1
Flash Cgg-Vcg B1500A MFCMU 1
NandFlash2 Endurance 3devices B1500A SMU 3, B2200A/B2201A 1, 81110A (2
outputs) 1
NandFlash2 Endurance B1500A HRSMU/ASU 3, 81110A (2 outputs) 1
NandFlash2 IV-Erase-IV B1500A SMU 1, HRSMU/ASU 2, 81110A (2
outputs) 1
NandFlash2 IV-Write-IV B1500A SMU 2, HRSMU/ASU 1, 81110A (2
outputs) 1
NandFlash2
Retention(ErasedCell)
B1500A SMU 1, HRSMU/ASU 2, 81110A (2
outputs) 1
Category Test definition name Supported analyzer Required equipment and quantity