User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities
Agilent B1500 User’s Guide, Edition 7 10-5
Application Library and Utilities
Application Test Definitions
BJT Ic-Vc Pulse Ib[3] B1500A,4155B/C,4156B/C SMU 3
Ic-Vc Pulse Vb B1500A,4155B/C,4156B/C SMU 4
Ic-Vc Pulse Vb[3] B1500A,4155B/C,4156B/C SMU 3
Ic-Vc Vb B1500A,4155B/C,4156B/C SMU 4
Ic-Vc Vb[3] B1500A,4155B/C,4156B/C SMU 3
Rb B1500A,4155B/C,4156B/C SMU 4
Re+Rc B1500A,4155B/C,4156B/C SMU 4
Re B1500A,4155B/C,4156B/C SMU 4
Simple Gummel Plot B1500A,4155B/C,4156B/C SMU 3
Vbe-Le B1500A SMU 4, B2200A/B2201A 1
Vbe-We B1500A SMU 4, B2200A/B2201A 1
CMOS BVdss B1500A,4155B/C,4156B/C SMU 4
BVgso B1500A,4155B/C,4156B/C SMU 3
Cgb-AC Level B1500A MFCMU 1, SMU 1
Cgb-Freq Log B1500A MFCMU 1, SMU 1
Cgb-Vg HighVoltage B1500A MFCMU 1, SMU 3, SCUU 1, GSWU 1
Cgb-Vg B1500A MFCMU 1, SMU 1
Cgc-Freq Log B1500A MFCMU 1, SMU 1
Cgc-Vg B1500A MFCMU 1, SMU 1
Cgg-Freq Linear B1500A MFCMU 1
Cgg-Freq Log B1500A MFCMU 1
Cgg-Vg 2Freq B1500A MFCMU 1
Cgg-Vg B1500A MFCMU 1
IdRdsGds B1500A,4155B/C,4156B/C SMU 4
Id-Vd pulse B1500A,4155B/C,4156B/C SMU 4
Id-Vd pulse[3] B1500A,4155B/C,4156B/C SMU 3
Id-Vd B1500A,4155B/C,4156B/C SMU 4
Id-Vd[3] B1500A,4155B/C,4156B/C SMU 3
Id-Vg pulse B1500A,4155B/C,4156B/C SMU 4
Id-Vg Vpulse[3] B1500A,4155B/C,4156B/C SMU 3
Id-Vg B1500A,4155B/C,4156B/C SMU 4
Category Test definition name Supported analyzer Required equipment and quantity